• Journal of the Korean Magnetics Society
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• v.9 no.1
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• pp.7-16
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• 1999

Stoichiometric and nonstoichiometric $Y_{3-x}Fe_{5+x}O_{12})$ polycrystalline samples (x=0.00, 0.05, 0.10, 0.30, -0.05, -0.10, -0.30) were prepared by solid state reaction method. The magnetic properties of the sample were investigated by FMR (ferromagnetic resonance) technique at microwave frequency 5.11 GHz (G-band) and 23.39 GHz (K-band) respectively. The spectroscopic splitting factor g were estimated to be 2.04~2.35 from the derivative absorption lines. As the samples became yttrium $(Y^{3+})$ excess and iron $(Fe^{3+})$ excess, Magnetizations were decreased. But resonance linewidth were increased. To investigate the anisotropy, the angular dependence of resonance magnetic fields were measured. Angular dependence of effective magnetizations were measured by FMR from 77 K to 300 K at K-band microwave frequency (23.39 GHz) and the saturation magnetizations were measured by VSM. The Bloch coefficients B and C were determined by fitting. $M_{eff}(0)$ was obtained by the extrapolation from 80 K. From this result, the spin wave stiffness constant D $(about\; 162~206 \;eV{\AA}^2)$and average square range of exchange interaction $$$(about \;5.84~12.13\;{\AA}^2)$ were determined.

• Journal of the Korean Magnetics Society
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• v.4 no.2
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• pp.100-105
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• 1994

Ni-Fe thin films are deposited on the corning glass substrate by means of RF magnetron sputtering system In order to investigate the dependence of the prorerties of Ni-Fe thin films on the film thickness, ferromagnetic reson¬ance spectrum has been examined. The effective magnetization $M_{eff}$ is constant for all samples, while the exchange stiffness constant A increases with the film thickness. A tendency that spectroscopic splitting factor g increases with the sample thickness, we expect that the increase of the contribution of the orbital motion to the magnetic moment as a reason for it.

• Journal of the Korean Magnetics Society
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• v.5 no.5
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• pp.496-499
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• 1995

Amorphous $Co_{80+x}TM_{12}B_{8-x}$ (TM = Ti, Zr, Hf, Nb and x = 0, 2, 4 at%) alloys were prepared by single roll melt spinning technique. Saturation magnetization of the amorphous ribbons was measured by SQUID and vibrating sample magnetometer from 5 to 800 K under applied fields up to 10 kOe. Typical thermo-magnetization curves were observed and the average values of the spectroscopic splitting g factor were estimated from the ferromagnetic resonance curve. For all the amorphous alloys studied here the saturation magnetization in the temperature range 5 K up to about $0.3T_{c}$ can be described by the Bloch relation: $M_{s}(T)\;=\;M_{s}(0)(1-BT^{3/2}-CT^{5/2})$. From the values of $M_{s}(0)$, B and spectroscopic splitting g factor the spin wave stiffness constants were calculated.

• Journal of the Korean Magnetics Society
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• v.7 no.3
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• pp.129-133
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• 1997

To investigate the influence of the Hf concentration and the annealing effect in $Co_{1-x}Hf_x$(X=0.16, 0.24 at.%) systems, ferromagnetic resonance experiments have been carried out. Spin wave resonance spectra for all samples consist of several volume modes and one (or two) surface mode. It is suggested that both surfaces of the film have a perpendicular hard axis to the film plane (negative surface anisotropy). The surface anisotropy $K_{s2}$ at substrate-film interface is varied slowly from -0.07 to -0.32 erg/$\textrm{cm}^2$ and the surface anisotropy $K_{s1}$ at film-air interface is varied from 0.18 to -0.47 erg/ $\textrm{cm}^2$ with increasing annealing temperature in the amorphous $Co_{84}Hf_{16}$ thin films. Also, the surface anisotropy $K_{s2}$ is varied slowly from -0.31 to -0.41 erg/$\textrm{cm}^2$ and the surface anisotropy $K_{s1}$is varied from -0.19 to -0.60 erg/$\textrm{cm}^2$ with increasing annealing temperature in the amporphous $Co_{84}Hf_{16}$ thin films. We conjecture that the variation of surface anisotropy $K_{s1}$ is due to the increase of Co concentration resulted from Hf oxidation for low temperature annealing(150~175 $^{\circ}C$) and the diffusion of Co atoms near the film surfaces for high temperature annealing (200~225 $^{\circ}C$).

• Journal of the Korean Magnetics Society
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• v.7 no.1
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• pp.38-43
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• 1997

For amorphous $Co_{1-x}Ti_x$(X=0.13, 0.16, 0.21 at.%) thin films deposited by DC magnetron sputtering method ferromagnetic resonance experiments have been used to investigate the dependence of surface magnetic properties according to annealing temperature (150~225 $^{\circ}C$). Spin wave resonance spectra for all annealing temperatures consist of several volume modes and one(or two) surface mode. It is suggested that both surfaces of the film have a perpendicular hard axis to the film plane(negative surface anisotropy). Also, the surface anisotropy $K_{s2}$ at substrate film interface is varied slowly from -0.11 to -0.25 erg/ $\textrm{cm}^2$ and the surface anisotropy $K_{s1}$ at film-air interface is varied from 0.16 to -0.53 erg/ $\textrm{cm}^2$ with increasing annealing temperature. We conjecture that the variation of surface anisotropy $K_{s1}$ is due to the increase of Co concentration resulted from Ti oxidation for low temperature annealing(150~200 $^{\circ}C$) and the diffusion of Co atoms near the film surfaces for high temperature annealing(225~250 $^{\circ}C$).