• The Journal of the Korea institute of electronic communication sciences
• /
• v.13 no.4
• /
• pp.721-728
• /
• 2018

This paper introduces various linear block error correction code and compares performances of the correction circuits. As the risk of errors due to power noise has increased, ECC(: Error Correction Code) has been introduced to prevent the bit error. There are two representatives of ECC structures which are SEC-DED(: Single Error Correction Double Error Detection) and SEC-DED-DAEC(: Double Adjacent Error Correction). According to simulation results, the SEC-DED circuit has advantages of small area and short delay time compared to SEC-DED-DAEC circuits. In case of SED-DED-DAEC, there is no big difference between Dutta's and Pedro's from performance point of view. Therefore, Pedro's code is more efficient than Dutta' code since the correction rate of Pedro's code is higher than that of Dutta's code.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.12 no.4
• /
• pp.418-425
• /
• 2012

In this paper, efficient implementation of error correction code (ECC) processing circuits based on single error correction and double error detection (SEC-DED) code with check bit pre-computation is proposed for memories. During the write operation of memory, check bit pre-computation eliminates the overall bits computation required to detect a double error, thereby reducing the complexity of the ECC processing circuits. In order to implement the ECC processing circuits using the check bit pre-computation more efficiently, the proper SEC-DED codes are proposed. The H-matrix of the proposed SEC-DED code is the same as that of the odd-weight-column code during the write operation and is designed by replacing 0's with 1's at the last row of the H-matrix of the odd-weight-column code during the read operation. When compared with a conventional implementation utilizing the odd-weight- column code, the implementation based on the proposed SEC-DED code with check bit pre-computation achieves reductions in the number of gates, latency, and power consumption of the ECC processing circuits by up to 9.3%, 18.4%, and 14.1% for 64 data bits in a word.

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.26 no.10
• /
• pp.1559-1562
• /
• 2022

As electronic devices technology scales down into the deep-submicron to achieve high-density, low power and high performance integrated circuits, multiple bit upsets by soft errors have become a major threat to on-chip memory systems. To address the soft error problem, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not troubleshoot mis-correction problem. We propose the SEC-DED_DAEC code with without mis-correction. The decoder for proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the decoder can be employed on-chip memory system.

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.26 no.11
• /
• pp.1747-1750
• /
• 2022

As shrinking the semiconductor process into the deep sub-micron to achieve high-density, low power and high performance integrated circuits, MBU (multiple bit upset) by soft errors is one of the major challenge of on-chip memory systems. To address the MBU, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not resolve mis-correction. We propose the SEC-DED-DAEC-TAED(triple adjacent error detection) code without mis-corrections. The generated H-matrix by the proposed heuristic algorithm to accomplish the proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the 2-stage pipelined decoder can be employed on-chip memory system.

• ETRI Journal
• /
• v.30 no.6
• /
• pp.799-806
• /
• 2008

In this paper, a new design for an error correcting code (ECC) is proposed. The design is aimed to build an ECC circuitry with minimal power consumption. The genetic algorithm equipped with the symbiotic mechanism is used to design a power-efficient ECC which provides single-error correction and double-error detection (SEC-DED). We formulate the selection of the parity check matrix into a collection of individual and specialized optimization problems and propose a symbiotic evolution method to search for an ECC with minimal power consumption. Finally, we conduct simulations to demonstrate the effectiveness of the proposed method.

• Journal of IKEEE
• /
• v.28 no.1
• /
• pp.116-122
• /
• 2024

AMBA AHB-Lite bus is widely used in on-chip bus protocol for low-power and cost-effective SoC. However, it lacks built-in error detection and correction for end-to-end data integrity. This can lead to data corruption and system instability, particularly in harsh environments like automotive applications. To mitigate this problem, this paper proposes the application of SEC-DED (Single Error Correction-Double Error Detection) to AMBA AHB-Lite bus. It aims not only to detect errors in real-time but also to correct them, thereby enhancing end-to-end data integrity. Simulation results demonstrate real-time error detection and correction when errors occur, which bolsters end-to-end data integrity of automotive on-chip bus.

• Journal of Institute of Control, Robotics and Systems
• /
• v.6 no.2
• /
• pp.228-233
• /
• 2000

It is common to apply the technology of FPGA (Fie이 Programmable Gate Array) which is one of the design methods for ASIC(Application Specific IC)to the active components used in the data processing at the digital system of satellite aircraft missile etc for compact lightness and integration of Printed Circuit Board (PCB) In carrying out the digital data processing the FPGAs are designed for the various functions of the Process Control Interrupt Control Clock Generation Error Detection and Correction (EDAC) as the individual module. In this paper an FPGA chip for Single Error Correction and Double Error Detection (SEC-DED) for EDAC is designed and simulated by using a VLSI design software LODECAP.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.12 no.3
• /
• pp.331-340
• /
• 2012

In the deep sub-micron ICs, growing amounts of on-die memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. Spare columns are often included in memories to repair defective cells or bit lines during production test. In many cases, the repair process will not use all spare columns. Schemes have been proposed to exploit these unused spare columns to store additional check bits which can be used to reduce the miscorrection probability for triple errors in single error correction-double error detection (SEC-DED). These additional check bits increase the dimensions of the parity check matrix (H-matrix) requiring extra area overhead. A method is proposed in this paper to efficiently fill the extra rows of the H-matrix on the basis of similarity of logic between the other rows. Optimization of the whole H-matrix is accomplished through logic sharing within a feasible operating time resulting in reduced area overhead. A detailed implementation using fuse technology is also proposed in this paper.