• 한국전자통신학회논문지
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• 제13권4호
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• pp.721-728
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• 2018

본 논문은 다양한 구조의 선형 블록 오류정정코드를 소개하고, 이를 회로로 구현하여 비교 분석한 결과를 보여주고 있다. 메모리 시스템에서는 잡음 전력으로 인한 비트 오류를 방지하기 위해 ECC(: Error Correction Code)가 사용되어 왔다. ECC의 종류에는 SEC-DED(: Single Error Correction Double Error Detection)와 SEC-DED-DAEC(: Double Adjacent Error Correction)가 있다. SEC-DED인 Hsiao 코드와 SEC-DED-DAEC인 Dutta, Pedro 코드를 각각 Verilog HDL을 이용해 설계 후 $0.35{\mu}m$ CMOS 공정을 사용해 회로로 합성하였다. 시뮬레이션에 의하면 SEC-DED회로는 인접한 두 개의 비트 오류를 정정하지 못하지만 적은 회로 사용면적과 빠른 지연 시간의 장점이 있으며, SEC-DED-DAEC 회로의 경우 Pedro 코드와 Dutta 코드 간에는 면적, 지연 시간의 차이가 없으므로 오류 정정률이 개선된 Pedro 코드를 사용하는 것이 더 효율적임을 알 수 있다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제12권4호
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• pp.418-425
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• 2012

In this paper, efficient implementation of error correction code (ECC) processing circuits based on single error correction and double error detection (SEC-DED) code with check bit pre-computation is proposed for memories. During the write operation of memory, check bit pre-computation eliminates the overall bits computation required to detect a double error, thereby reducing the complexity of the ECC processing circuits. In order to implement the ECC processing circuits using the check bit pre-computation more efficiently, the proper SEC-DED codes are proposed. The H-matrix of the proposed SEC-DED code is the same as that of the odd-weight-column code during the write operation and is designed by replacing 0's with 1's at the last row of the H-matrix of the odd-weight-column code during the read operation. When compared with a conventional implementation utilizing the odd-weight- column code, the implementation based on the proposed SEC-DED code with check bit pre-computation achieves reductions in the number of gates, latency, and power consumption of the ECC processing circuits by up to 9.3%, 18.4%, and 14.1% for 64 data bits in a word.

• 한국정보통신학회논문지
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• 제26권10호
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• pp.1559-1562
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• 2022

As electronic devices technology scales down into the deep-submicron to achieve high-density, low power and high performance integrated circuits, multiple bit upsets by soft errors have become a major threat to on-chip memory systems. To address the soft error problem, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not troubleshoot mis-correction problem. We propose the SEC-DED_DAEC code with without mis-correction. The decoder for proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the decoder can be employed on-chip memory system.

• 한국정보통신학회논문지
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• 제26권11호
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• pp.1747-1750
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• 2022

As shrinking the semiconductor process into the deep sub-micron to achieve high-density, low power and high performance integrated circuits, MBU (multiple bit upset) by soft errors is one of the major challenge of on-chip memory systems. To address the MBU, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not resolve mis-correction. We propose the SEC-DED-DAEC-TAED(triple adjacent error detection) code without mis-corrections. The generated H-matrix by the proposed heuristic algorithm to accomplish the proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the 2-stage pipelined decoder can be employed on-chip memory system.

• ETRI Journal
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• 제30권6호
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• pp.799-806
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• 2008

In this paper, a new design for an error correcting code (ECC) is proposed. The design is aimed to build an ECC circuitry with minimal power consumption. The genetic algorithm equipped with the symbiotic mechanism is used to design a power-efficient ECC which provides single-error correction and double-error detection (SEC-DED). We formulate the selection of the parity check matrix into a collection of individual and specialized optimization problems and propose a symbiotic evolution method to search for an ECC with minimal power consumption. Finally, we conduct simulations to demonstrate the effectiveness of the proposed method.

• 전기전자학회논문지
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• 제28권1호
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• pp.116-122
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• 2024

AMBA AHB-Lite 버스는 저전력 및 경제성 측면에서 SoC에 널리 사용되는 온칩 버스 프로토콜이다. 하지만 이 프로토콜은 종단간 데이터 무결성을 위한 에러 검출 및 정정이 불가능하다. 이로 인해 자동차와 같이 열악한 환경에서 동작하는 경우에 데이터 변질과 시스템 불안정을 일으킬 수 있다. 이러한 문제를 해결하기 위해 본 논문에서는 AMBA AHB-Lite 버스에 SEC-DED(Single Error Correction-Double Error Detection)를 적용하는 방법을 제안한다. 이는 전송 중 발생하는 데이터 에러를 실시간으로 감지하고 정정하여 종단간 데이터 무결성을 강화한다. 시뮬레이션 결과, 에러가 일어나도 실시간으로 이를 감지하고 정정하여 차량용 온칩 버스에서 종단간 데이터 무결성을 강화하는 것을 확인하였다.

• 제어로봇시스템학회논문지
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• 제6권2호
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• pp.228-233
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• 2000

It is common to apply the technology of FPGA (Fie이 Programmable Gate Array) which is one of the design methods for ASIC(Application Specific IC)to the active components used in the data processing at the digital system of satellite aircraft missile etc for compact lightness and integration of Printed Circuit Board (PCB) In carrying out the digital data processing the FPGAs are designed for the various functions of the Process Control Interrupt Control Clock Generation Error Detection and Correction (EDAC) as the individual module. In this paper an FPGA chip for Single Error Correction and Double Error Detection (SEC-DED) for EDAC is designed and simulated by using a VLSI design software LODECAP.

• JSTS:Journal of Semiconductor Technology and Science
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• 제12권3호
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• pp.331-340
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• 2012

In the deep sub-micron ICs, growing amounts of on-die memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. Spare columns are often included in memories to repair defective cells or bit lines during production test. In many cases, the repair process will not use all spare columns. Schemes have been proposed to exploit these unused spare columns to store additional check bits which can be used to reduce the miscorrection probability for triple errors in single error correction-double error detection (SEC-DED). These additional check bits increase the dimensions of the parity check matrix (H-matrix) requiring extra area overhead. A method is proposed in this paper to efficiently fill the extra rows of the H-matrix on the basis of similarity of logic between the other rows. Optimization of the whole H-matrix is accomplished through logic sharing within a feasible operating time resulting in reduced area overhead. A detailed implementation using fuse technology is also proposed in this paper.