• Journal of Sensor Science and Technology
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• v.25 no.4
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• pp.280-284
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• 2016

For an arc-flash protection system, the selection of arc-flash sensor in implementation is largely dependent on the coverage area and the spatial resolution. Typically, a point sensor is used to accurately measure an arc event within a very narrow region; whereas, a loop or a line sensor can cover several electrical compartment at the same time, but with a poor resolution. In this work, a novel scheme for an arc-flash sensor was developed by making use of the transmission loss of plastic optical fibers (POFs) to cover a broad range with a high spatial resolution. By relating the amplitude ratio of the arc-signals at the ends of the POF with the arc-location, arc events could be located with a resolution of ~5 cm within a spatial range of 10 m, which has not been reported yet.

• Journal of Sensor Science and Technology
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• v.19 no.2
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• pp.160-167
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• 2010

In this paper, we fabricated the optoelectronic device based on Cadmium selenide(CdSe) nanocrystal quantum dots (NQDs)/single-walled carbon nanotubes(SWNTs) heterostructure using dieletrophoretic force. The efficient charge transfer phenomena from CdSe to SWNT make CdSe-Pyridine(py)-SWNT unique heterostructures for novel optoelectronic device. The conductivity of CdSe-py-SWNT was increased when it was exposed at ultra violet(UV) lamp, and varied as a function of wavelength of incident light.

• Current Applied Physics
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• v.18 no.11
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• pp.1174-1181
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• 2018

In nanomagnetism, one of the crucial scientific questions is whether magnetic behaviors are deterministic or stochastic on a nanoscale. Apart from the exciting physical issue, this question is also of paramount highest relevance for using magnetic materials in a wealth of technological applications such as magnetic storage and sensor devices. In the past, the research on the stochasticity of a magnetic process has been mainly done by macroscopic measurements, which only offer ensemble-averaged information. To give more accurate answer for the question and to fully understand related underlying physics, the direct observation of statistical behaviors in magnetic structures and magnetic phenomena utilizing advanced characterization techniques is highly required. One of the ideal tools for such study is a full-field soft X-ray microscope since it enables imaging of magnetic structures on the large field of view within a few seconds. Here we review the stochastic behaviors of various magnetic processes including magnetization reversal process in thin films, magnetic domain wall motions in nanowires, and magnetic vortex formations in nanodisks studied by full-field soft X-ray microscopy. The origin triggering the stochastic nature witnessed in each magnetic process and the way to control the intrinsic nature are also discussed.