• 반도체디스플레이기술학회지
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• 제15권1호
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• pp.33-35
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• 2016

This paper proposes a method utilizing image compression and transmission method for image segmentation in order to reduce the time required in the process of analyzing the image information that has in the image compression process. Many studies of existing with respect to the image segmentation are being studied as a way to split a lot of a particular part in the image. We divide full image into the N equal parts. And it is compressed using the field coding. This will reduce the time-consuming than using the conventional method.

• 반도체디스플레이기술학회지
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• 제21권3호
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• pp.87-91
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• 2022

Bokeh effect is a stylistic technique that can produce blurring the background of photos. This paper implements to produce a bokeh effect with a single image by post processing. Generating depth map is a key process of bokeh effect, and depth map is an image that contains information relating to the distance of the surfaces of scene objects from a viewpoint. First, this work presents algorithms to determine the depth map from a single input image. Then, we obtain a sparse defocus map with gradient ratio from input image and blurred image. Defocus map is obtained by propagating threshold values from edges using matting Laplacian. Finally, we obtain the blurred image on foreground and background segmentation with bokeh effect achieved. With the experimental results, an efficient image processing method with bokeh effect applied using a single image is presented.

• 대한산업공학회지
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• 제41권3호
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• pp.267-274
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• 2015

In the semiconductor manufacturing post-FAB process, predicting a package test result accurately in the wafer testing phase is a key element to ensure the competitiveness of companies. The prediction of package test can reduce unnecessary inspection time and expense. However, an analysing method is not sufficient to analyze data collected at wafer testing phase. Therefore, many companies have been using a summary information such as a mean, weighted sum and variance, and the summarized data reduces a prediction accuracy. In the paper, we propose an analysis method for Wafer Map Image collected at wafer testing process and conduct an experiment using real data.

• 반도체디스플레이기술학회지
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• 제20권2호
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• pp.126-130
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• 2021

The ball grid array is one of the packaging methods that used in high density printed circuit board. Solder void defects caused by voids in the solder ball during the BGA process do not directly affect the reliability of the product, but it may accelerate the aging of the device on the PCB layer or interface surface depending on its size or location. Void inspection is important because it is related in yields with products. The most important process in the optical inspection of solder void is the segmentation process of solder and void. However, there are several segmentation algorithms for the vision inspection, it is impossible to inspect all of images ideally. When X-Ray images with poor contrast and high level of noise become difficult to perform image processing for vision inspection in terms of software programming. This paper suggests the solution to deal with the suggested problem by means of using Mask R-CNN instead of digital image processing algorithm. Mask R-CNN model can be trained with images pre-processed to increase contrast or alleviate noises. With this process, it provides more efficient system about complex object segmentation than conventional system.

• 반도체디스플레이기술학회지
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• 제22권4호
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• pp.59-65
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• 2023

Edge detection in image processing and computer vision is one of the most fundamental operations. Canny edge detection algorithm has excellent performance and is currently widely used. However, it is difficult to process the algorithm in real-time because the algorithm is complex. In this study, the equations required in the algorithm were simplified to facilitate hardware implementation, and the calculation speed was increased by using a parallel structure. In particular, the size and management of local buffers were selected in consideration of parallel processing and filter size so that data could be processed without bottlenecks. It was designed in verilog and implemented in FPGA to verify operation and performance.

• 반도체디스플레이기술학회지
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• 제12권4호
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• pp.33-38
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• 2013

Image retrieval is one of the most exciting and fastest growing research fields in the area of multimedia technology. As the amount of digital contents continues to grow users are experiencing increasing difficulty in finding specific images in their image libraries. This paper proposes an efficient image descriptor which uses a local color and texture in the non-overlapped block images. To evaluate the performance of the proposed method, we assessed the retrieval efficiency in terms of ANMRR with common image dataset. The experimental trials revealed that the proposed algorithm exhibited a significant improvement in ANMRR, compared to Dominant Color Descriptor and Edge Histogram Descriptor.

• 반도체디스플레이기술학회지
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• 제18권4호
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• pp.154-159
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• 2019

Undesirable negative image is occurred in photographs taken across partial reflections such as glass window and electronic display. Efficient removing reflections given a single image are in the spotlight in recent researches. This paper discusses and evaluates two published image reflection removal algorithms, and compares the performance of time and quality of those methods with a common dataset. As benchmarking test cases are presented, we propose to modify one of the methods to reduce the run-time with small effects on the similar image quality.

• 반도체디스플레이기술학회지
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• 제18권2호
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• pp.63-66
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• 2019

Due to the development of medical imaging technology, different imaging technologies provide a large amount of effective information. However, different imaging method caused the limitations of information integrity by using single type of image. Combining different image together so that doctor can obtain the information from medical image comprehensively. Image registration algorithm based on mutual information has become one of the hotspots in the field of image registration with its high registration accuracy and wide applicability. Because the information theory-based registration technology is not dependent on the gray value difference of the image, and it is very suitable for multimodal medical image registration. However, the method based on mutual information has a robustness problem. The essential reason is that the mutual information itself is not have enough information between the pixel pairs, so that the mutual information is unstable during the registration process. A large number of local extreme values are generated, which finally cause mismatch. In order to overcome the shortages of mutual information registration method, this paper proposes a registration method combined with image spatial structure information and mutual information.

• 반도체디스플레이기술학회지
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• 제20권3호
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• pp.93-96
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• 2021

The desire for a technology that can mechanically acquire 2D images starting with the manual method of drawing has been making possible a wide range of modern image-based technologies and applications over a period. Moreover, this trend of the utilization of image-related technology as well as image-based information is likely to continue. Naturally, as like other technology areas, the function that humans produce and utilize by using images needs to be automated by using computing-based technologies. Surprisingly, technology using images in the future will be able to discover knowledge that humans have never known before through the information-related process that enables new perception, far beyond the scope of use that human has used before. Regarding this trend, the manipulation and configuration of massively distributed image database system is strongly demanded. In this paper, we discuss image identifier production methods based on the utilization of the image hashing technique which especially puts emphasis over an entropy operator.

• 대한전자공학회논문지
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• 제26권9호
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• pp.1369-1374
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• 1989

Electrical characteristics at the p-GaP semiconductor/CsNO3 electrolyte interfaces were investigated. It is found that such interfacial phenomena are well analyzed by semiconductor-semiconductor pn junction diode models and image charge effects of semiconductor-vacuum interfaces. The formation processes of electrical double layers and their potential variations are verified using cyclic voltammetric methods. The interfacial current are influenced by Cs+ ion coverage onto the semiconductor electrode surface and structure of electrical double layer.