• Title/Summary/Keyword: responsivity

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Fabrication of a Schottky Type Ultraviolet Photodetector Using GaN Layer (GaN를 이용한 Schottky diode형 자외선 수광소자의 제작)

  • Seong, Ik-Joong;Lee, Suk-Hun;Lee, Chae-Hyang;Lee, Yong-Hyun;Lee, Jung-Hee;Hahm, Sung-Ho
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.36D no.6
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    • pp.28-34
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    • 1999
  • We fabricated a planar ultra-violet photodetector whose ohmic and schottky contacts were respectively formed with evaporated Al and Pt on the GaN layer. To examine the applicability of the device to the UV sensor, we investigated its electrical and optical characteristics. The GaN layer on the sapphire waver had $7.8{\times}10^{16}cm^{-3}$ of doping concentnation and the $138 cm^2/V{\cdot}s$ of electron mobility and it absorbed the spectrum of the light below 325 nm wavelength. It had the responsivity of 2.8 A/W of at 325 nm, and the signal to noise ratio(SNR) of $4{\times}10^4$, and the noise equivalent power(NEP) of $3.5{\times}10^9$W under 5 V reverse bias. These results confirmed that the GaN schottky diode had a solar blind properly when it was applied to the UV photodetector.

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A Schottky Type Ultraviolet Photo-detector using RUO$_2$/GaN Contact (RUO$_2$/GaN 쇼트키 다이오드 형 자외선 수광소자)

  • Sin, Sang-Hun;Jeong, Byeong-Gwon;Bae, Seong-Beom;Lee, Yong-Hyeon;Lee, Jeong-Hui;Ham, Seong-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.10
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    • pp.671-677
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    • 2001
  • A RuO$_2$ Schottky photo-detector was designed and fabricated with GaN layers on the sapphire substrate. For good absorption of UV light, an epitaxial structure with undoped GaN(0.5 ${\mu}{\textrm}{m}$)/n ̄-GaN(0.1${\mu}{\textrm}{m}$)/n+-GaN(1.5${\mu}{\textrm}{m}$) was grown by MOCVD. The structure had the carrier concentrations of 3.8$\times$10$^{18}$ cm ̄$^3$, the mobility of 283$\textrm{cm}^2$/V.s. After ECR etching process for mesa structure with the diameter of about 500${\mu}{\textrm}{m}$, Al ohmic contact was formed on GaN layer. After proper passivation between the contacts with Si$_3$/N$_4$, was formed on undoped GaN layer. The fabricated Schottky diode had a specific contact resistance of 1.15$\times$10$^{-5}$$\Omega$.$\textrm{cm}^2$]. It has a low leakage current of 305 pA at -5 V, which was attributed by stable characteristics of RuO$_2$ Schottky contact. In optical measurement, it showed the high UV to visible extinction ratio of 10$^{5}$ and very high responsivity of 0.23 A/W at the wavelength of 365nm.

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Characteristics of InGaAs/GaAs/AlGaAs Double Barrier Quantum Well Infrared Photodetectors

  • Park, Min-Su;Kim, Ho-Seong;Yang, Hyeon-Deok;Song, Jin-Dong;Kim, Sang-Hyeok;Yun, Ye-Seul;Choe, Won-Jun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.324-325
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    • 2014
  • Quantum wells infrared photodetectors (QWIPs) have been used to detect infrared radiations through the principle based on the localized stated in quantum wells (QWs) [1]. The mature III-V compound semiconductor technology used to fabricate these devices results in much lower costs, larger array sizes, higher pixel operability, and better uniformity than those achievable with competing technologies such as HgCdTe. Especially, GaAs/AlGaAs QWIPs have been extensively used for large focal plane arrays (FPAs) of infrared imaging system. However, the research efforts for increasing sensitivity and operating temperature of the QWIPs still have pursued. The modification of heterostructures [2] and the various fabrications for preventing polarization selection rule [3] were suggested. In order to enhance optical performances of the QWIPs, double barrier quantum well (DBQW) structures will be introduced as the absorption layers for the suggested QWIPs. The DBWQ structure is an adequate solution for photodetectors working in the mid-wavelength infrared (MWIR) region and broadens the responsivity spectrum [4]. In this study, InGaAs/GaAs/AlGaAs double barrier quantum well infrared photodetectors (DB-QWIPs) are successfully fabricated and characterized. The heterostructures of the InGaAs/GaAs/AlGaAs DB-QWIPs are grown by molecular beam epitaxy (MBE) system. Photoluminescence (PL) spectroscopy is used to examine the heterostructures of the InGaAs/GaAs/AlGaAs DB-QWIP. The mesa-type DB-QWIPs (Area : $2mm{\times}2mm$) are fabricated by conventional optical lithography and wet etching process and Ni/Ge/Au ohmic contacts were evaporated onto the top and bottom layers. The dark current are measured at different temperatures and the temperature and applied bias dependence of the intersubband photocurrents are studied by using Fourier transform infrared spectrometer (FTIR) system equipped with cryostat. The photovoltaic behavior of the DB-QWIPs can be observed up to 120 K due to the generated built-in electric field caused from the asymmetric heterostructures of the DB-QWIPs. The fabricated DB-QWIPs exhibit spectral photoresponses at wavelengths range from 3 to $7{\mu}m$. Grating structure formed on the window surface of the DB-QWIP will induce the enhancement of optical responses.

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Pt/AlGaN Schottky-Type UV Photodetector with 310nm Cutoff Wavelength

  • Kim, Bo-Kyun;Kim, Jung-Kyu;Park, Sung-Jong;Lee, Heon-Bok;Cho, Hyun-Ick;Lee, Young-Hyun;Hahn, Yoon-Bong;Lee, Jung-Hee;Hahm, Sung-Ho
    • Journal of Sensor Science and Technology
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    • v.12 no.2
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    • pp.66-71
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    • 2003
  • Pt/AlGaN Schottky-type UV photodetectors were designed and fabricated. A low-temperature AlGaN interlayer buffer was grown between the AlGaN and GaN film in the diode structure epitaxy to obtain crack-free AlGaN active layers. A comparison was then made of the structural, electrical, and optical characteristics of two different diodes: one with an AlGaN($0.5\;{\mu}m$)/n+-GaN(2 nm) structure (type 1) and the other with an AlGaN($0.5\;{\mu}m$)/AlGaN interlayer($150\;{\AA}$)/n+-GaN($3\;{\mu}m$) structure(type 2). A crack-free AlGaN film was obtained by the insertion of a low-temperature AlGaN interlayer with an aluminum mole fraction of 26% into the $Al_xGa_{1-x}N$ layer. The fabricated Pt/$Al_{0.33}Ga_{0.67}N$ photodetector had a leakage current of 1 nA for the type 1 diode and $0.1\;{\mu}A$ for the type 2 diode at a reverse bias of -5 V. For the photoresponse measurement, the type 2 diode exhibited a cut-off wavelength of 300 nm, prominent responsivity of 0.15 A/W at 280 nm, and UV-visible extinction ratio of $1.5{\times}10^4$. Accordingly, the Pt/$Al_{0.33}Ga_{0.67}N$ Schottky-type ultraviolet photodetector with an AlGaN interlayer exhibited superior electrical and optical characteristics and improved UV detecting properties.

$1{times}8$ Array of GaAs/AlGaAs quantum well infrared photodetector with 7.8$\mu\textrm{m}$ peak response ($1{times}8$ 배열, 7.8 $\mu\textrm{m}$ 최대반응 GaAs/AlGaAs 양자우물 적외선 검출기)

  • 박은영;최정우;노삼규;최우석;박승한;조태희;홍성철;오병성;이승주
    • Korean Journal of Optics and Photonics
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    • v.9 no.6
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    • pp.428-432
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    • 1998
  • We fabricated 1$\times$8 array of GaAs/AlGaAs quantum well infrared photodetectors for the long wavelength infrared detection which is based on the bound-continuum intersubband transition, and characterized its electrical and optical properties. The device was grown on SI-GaAs(100) by the molecular beam epitaxy and consisted of 25 period of 40 ${\AA} $ GaAs well and 500 ${\AA} $ $Al_{0.28} Ga_{0.72}$ As barrier. To reduce the possibility of interface states only the center 20 ${\AA} $ of the well was doped with Si ($N_D=2{\times}10^{18} cm^{-3}$). We etched the sample to make square mesas of 200$\times$200 $\mu\textrm{m}^2$ and made an ohmic contact on each pixel with Au/Ge. Current-voltage characteristics and photoresponse spectrum of each detector reveal that the array was highly uniform and stable. The spectral responsivity and the detectivity $D^*$ were measured to be 180,260 V/W and $4.9{\times}10^9cm\sqrt{Hz}/W$ respectively at the peak wavelength of $\lambda$ =7.8 $\mu\textrm{m}$ and at T=10 K.

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Design of Color Matching Filters and Error Analysis in Colorimetric Measurement of LCD Flat Panel Display Using the Filters (등색함수 필터의 설계와 이를 이용한 LCD 평판 디스플레이의 색채 측정에 대한 오차 분석)

  • Jeon, Ji-Ho;Jo, Jae-Heung;Park, Seung-Nam;Park, Chul-Woung;Lee, Dong-Hoon;Jung, Ki-Lyong
    • Korean Journal of Optics and Photonics
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    • v.18 no.1
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    • pp.1-7
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    • 2007
  • Filter colorimeters have a set of spectral bands for which spectral responsivity is the same as the color matching function defined by CIE (Commission Internationale de I'Eclairage). We have designed a set of color matching function filters denoted by $\bar{x}-filter,\;\bar{y}-filter,\;and\;\bar{z}-filter$. Because the $\bar{x}-function$ has two transmission bands, two $\bar{x}-filters$ are designed to cover the $\bar{x}-function$. To design the filters, we developed a nonlinear least square fit program which determines the thickness of the color glasses by minimizing its spectral mismatch value ($f{_1}'$) to below 3 %. The design has been validated by fabrication of the $\bar{y}-bar$ filter, of which $f{_1}'$ was measured to be 2.8 %. Considering a LCD flat panel display as a device under test, we have calculated the systematic error of the colorimetric measurement using the designed filters.

마이크로볼로미터 IR 소자의 응답도 특성의 진공도 의존성 연구

  • Han, Myeong-Su;Han, Seok-Man;Sin, Jae-Cheol;Go, Hang-Ju;Kim, Hyo-Jin
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.361-361
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    • 2013
  • 비냉각 적외선 검출소자는 빛이 전혀 없는 환경에서도 사물을 감지하는 열상장비의 핵심소자이다. 마이크로볼로미터 적외선 검출기는 상온에서 동작하며, 온도안정화를 위해 TEC를 장착하여 진공패키지로 조립된다. 패키지는 진공을 유지할 수 있도록 일반적으로 메탈로 제작되며, 단가 감소 및 생산성 증대를 위해 wafer level packaging 방법을 이용한다. 마이크로볼로미터의 특성은 패키지의 진공 변화에 매우 민감하다. 센서의 감도를 증가시키기 위해서는 진공환경을 유지해야 한다. 볼로미터 소자의 특성은 상압에서 열전도는 기판과 멤브레인 사이의 에어갭을 통해 열손실을 야기하므로 센서의 반응도가 현저히 줄어든다. 에어갭이 1 um 정도 되더라도 그 사이에 존재하는 열전도가 가능하므로 진공을 유지하여 열고립 상태를 증대시킬 수 있다. 이에 본 연구에서는 소자의 동작시 압력, 즉 진공도가 볼로미터 소자의 반응도 특성에 미치는 영향을 조사하였다. 마이크로볼로미터 소자는 $2{\times}8$ 어레이 형태로 제작하였으며, metal pad를 각 단위셀에 배치하였으며, 공통전극으로 한 개의 metal pad를 넣어 설계하였다. 흡수체로써 VOx를 사용하였으며, 열 고립구조를 위해 2.5 um 공명 흡수층의 floating 구조로 멤브레인을 형성하였다. 진공패키지는 메탈패키지를 제작하여 볼로미터 칩을 TEC 위에 장착하였으며, 신호의 감지를 위해 가변저항을 매칭시켰다. 반응도는 신호 대 잡음 값을 획득하여 소자에 도달하는 적외선 에너지에 대해 반응하는 값을 계산에 의해 얻어내는 것이다. 픽셀 크기는 $50{\times}50$ um이며, 패키지 조립 공정 후 온도변화에 따른 저항 측정을 통해 TCR 값을 얻었다. 이때 TCR은 약 -2.5%/K으로 나타났다. $2{\times}8$의 4개 단위소자에 대해 측정한 값은 균일하게 TCR 값이 나타났다. 광반응 특성은 볼로미터 단위소자에 대해서 먼저 고진공(5e-6 torr) 하에서 측정하였으며, 반응도는 25,000 V/W의 값을 나타내었고, 탐지도는 약 2e+8 $cmHz_{1/2}$/W로 나타났다. 패키지의 압력 조절을 위해 TMP 및 로터리 펌프를 이용하여 100 torr에서 1e-4 torr의 범위에서 압력조절 밸브를 이용하여 질소가스의 압력으로 진공도를 변화시켰다. 적외선 반응신호는 압력이 증가함에 따라 감소하였으며, 2e-1 torr의 압력에서 신호의 크기가 감소하기 시작하여 5 torr에서 반응도의 1/2 값을 나타냄을 알 수 있었다. 30 torr 이상에서는 신호가 잡음값 과거의 동일하여 신호대 잡음비가 1로 나타남을 알 수 있었다. 또한 진공도 변화에 대해, 흑체온도에 따른 반응도 및 탐지도의 특성을 조사한 결과를 발표한다. 반응도의 증가를 위해 진공도는 진공도는 1e-2 torr 이하의 압력을 유지해야 함을 본 실험을 통해 알 수 있었다.

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Properties of Pt/${Al_0.33}{Ga_0.67}N$ Schottky Type UV Photo-detector (Pt 전극을 이용한 ${Al_0.33}{Ga_0.67}N$ 쇼트키형 자외선 수광소자의 동작특성)

  • 신상훈;정영로;이재훈;이용현;이명복;이정희;이인환;한윤봉;함성호
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.7
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    • pp.486-493
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    • 2003
  • Schottky type A $l_{0.33}$G $a_{0.67}$N ultraviolet photodetectors were fabricated on the MOCVD grown AlGaN/ $n^{+}$-GaN and AlGaN/AlGaN interlayer/ $n^{+}$-GaN structures. The grown layers have the carrier concentrations of -$10^{18}$, and the mobilities were 236 and 269 $\textrm{cm}^2$/V.s, respectively. After mesa etching by ICP etching system, the Si3N4 layer was deposited for passivation between the contacts and Ti/AL/Ni/Au and Pt were deposited for ohmic and Schottky contact, respectively. The fabricated Pt/A $l_{0.33}$G $a_{0.67}$N Schottky diode revealed a leakage current of 1 nA for samples with interlayer and 0.1$\mu\textrm{A}$ for samples without interlayer at a reverse bias of -5 V. In optical measurement, the Pt/A $l_{0.33}$G $a_{0.67}$N diode with interlayer showed a cut-off wavelength of 300 nm, a prominent responsivity of 0.15 A/W at 280 nm and a UV-visible extinction ratio of 1.5x$10^4./TEX>.

3-D Simulation of Pyroelectric IR Sensor and Design of Optimized Peripheral Circuit (초전형 적외선 센서의 3차원 모델링과 최적화된 주변회로 설계)

  • Min, Kyung-Jin;Kang, Seong-Jun;Yoon, Yung-Sup
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.37 no.10
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    • pp.33-41
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    • 2000
  • Pyroelectric characteristics such as voltage responsivity, noise equivalent power and detectivity are modeled 3-dimensionaly considering th interaction of each parameters. Also, the circuit is designed to set up the frequency band width and the signal amplification of the pyroelectric IR sensor. The case of low frequency region shows that the voltage response increases with the independence of the sensor area as the thickness decreases. In the high frequency region, it is found that the voltage response with the load resistor of 20$G{\Omega}$ increases with the independence of the sensor thickness as the sensor area decreases. In the low frequency region, the detectivity becomes excellent at th load resistor of 20$G{\Omega}$, the sensor area larger than $4{\times}10^{-10}m^2$ and the sensor thickness thinner than $1{\times}10^{-5}m$, while, in the high frequency region, it shows high value at the sensor thickness thinner than $1{\times}10^{-5}m$ and the sensor area smaller than $2{\times}10^{-10}m^2$ with the independence of the load resistor. In the circuit design, quasi-boot-strap circuit is employed, in which a single op-amp is connected to the drain of JFFT. Desirable frequency band width, amplification rate and the remarkable drop of noise of about 56% from that of conventional circuits with double op-amps are obtained.

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Dynamic Pyroelectric Properties and Their Frequency Dependences of $LiTaO_3$ Crystal ($LiTaO_3$ crystal의 dynamic 초전특성과 그 주파수의 의존성)

  • Lee, Won-Jae;Kang, Seong-Jun;Joung, Yang-Hee;Yoon, Yung-Sup
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.37 no.8
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    • pp.35-41
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    • 2000
  • The frequency dependence of the pyroelectric characteristics of $LiTaO_3$ have been investigated by using the dynamic method. In the frequency range between 2 and 1000 Hz, they are measured in both the regimes of pyroelectric current ($R_L=1M{\Omega}$) and pyrelectric voltage ($R_L=17.3G{\Omega}$), which can be selected by adjusting the value of the load resistance. Pyroelectric coefficient depending on the voltage response in the regime of pyroelectric current shows the maximum value of $1.56{\times}10^{-8}C/cm^2{\cdot}K$ at 40 Hz. The maximum values of figures of merits for the voltage response and for the detectivity are measured as $10.8{\times}10^{-11}C{\cdot}cm/J$ and $13{\times}10^{-7}C{\cdot}cm/J$, respectively. The voltage responsivity depending on the voltage response in the regime of pyroelectrci voltage shows the maximum value of 488 V/W at 2 Hz. Noise equivalent power and detectivity shows the minimum value of $3.95{\times}10^{-10}W/{\sqrt}Hz$ and maximum value of $5.6{\times}10^8cm{\cdot}{\sqrt}Hz/W$ at 40 Hz, respectively.

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