• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.399-402
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• 2002

This paper is researched that electric characteristic of Digital x-ray radiography technique with changing composition ratio of Iodine. Dopant material, Iodine is evaporated with amorphous selenium. Thorugh the old papers say, doponted Iodine will be down the created trap level because of Arsenic dopant material in amorphous selenium. Arsenic material of Composition ratio in amorphous selenium is fixed with 0.3% and test sample is deposited composition of 30, 100, 300, 500, 700ppm with thermal evaporate system. Experimental measurement is performed by dark current and x-ray sensitivity in amorphous selenium based radition detector sensor. Fabricated test sample thickness is $30{\mu}m$ and injected voltage is $3{\mu}m$，$6{\mu}m$，$9{\mu}m$ to both electrode. Experimental results showed that the net charge of composition rate of 30ppm is 398.88 pc/mR/$cm^2$ very high. And increase of the Iodine composition ratio is tendency to the decrease of net charge. Doping changing composition of Iodine in amorphous selenium detector offered to basical information of amorphous selenium material.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.391-394
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• 2002

There has recently been much interest and research in developing digital x-ray systems based on using amorphous selenium(a-Se) photoconductors as the image receptor. The amorphous selenium layer that is currently being studied for use as an x-ray photoconductor is not pure a-Se but rather amorphous selenium alloyed with arsenic. We fabricated samples using the selenium and arsenic alloy with various concentrations of the arsenic. In this work, x-ray photoconductor using amorphous selenium alloyed with arsenic were fabricated with different concentrations of the arsenic (0.1 wt.%, 0.3wt.%, 0.5wt.%, 1wt.%, 1.5wt.%, 3wt.%, 5wt.%). The seven kind of samples was fabricated with a-Se alloyed with arsenic through vacuum thermal evaporation. We also investigate the arsenic concentration dependence on the device performance in radiation detector. The electric characteristics of radiation detector devices with changing additive ratio of the arsenic is performed by measuring the x-ray induced photocurrent and integrating it over time to find the total charge. The thickness of a-Se is $100{\mu}m$. Bias voltages $3V/{\mu}m$, $6V/{\mu}m$， $9V/{\mu}m$ are applied at the samples. As results, the net charge of a-Se 0.3% As sample is $526.0pC/mR/cm^2$ at $9V/{\mu}m$ bias. The net charge is decreased as with the increasing additive ratio of arsenic.