• Proceedings of the KIPE Conference
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• 1998.10a
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• pp.847-850
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• 1998

This paper proposes a new scheme of FLR for improving corner breakdown voltage. The major difference from the conventional FLR is to build extra rings and floating field plates in the corner region. In this structure the additional field plate and ring have reduced th electric field at the junction in the corner region. Thus it improves the breakdown characteristics which are critical for obtaining high breakdown voltage.

• Journal of Satellite, Information and Communications
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• v.12 no.3
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• pp.80-85
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• 2017

In this paper, a mircrowave breakdown of X-band circular waveguide cavity filter, which occurred during ground test, was introduced, and electro-magnetic field simulation results to identify a root cause, and the analysis of possibility of its occurrence on orbit operation were presented. Filter modeling for simulation was conducted with a commercial tool (FEST3D), and electric fields inside the filter were monitored at the input of 1 W continuous wave. In our observation, strong electric field intensities were monitored on the tuning screws especially at the input of band-edge frequencies. The threshold power levels for the breakdown were also estimated and compared with the input power levels actually injected to the filter. From this estimation, we could figure out that the power exceeding the breakdown threshold was injected to the filter so that strong electric fields were generated and temperature increased high, and this became a root cause of the electrical short. Our further analysis showed that this kind of microwave breakdown is not likely to occur on orbit operation, and multipactor is expected not to occur at the input of band-edge frequencies. As a measure to prevent the microwave breakdown, we suggested to avoid the injection of band-edge frequencies and inject lower power levels to the filter.

• Proceedings of the KIEE Conference
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• 1999.11d
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• pp.1099-1101
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• 1999

PJB(Prefabricated Joint Box) is consisted of three major components ; an epoxy unit, a stress relief cone and a spring unit. The insulation structure of PJB is maintained by the interfacial pressure, and the dielectric performance at the interface depends on the interfacial pressure which is regarded as the most important factor for preventing breakdown failure. This experiment was performed to investigate breakdown voltage characteristic and partial discharge patterns under the controlled pressure conditions at the simulated interface. Finally, this paper presents the optimal pressure conditions at the interface by analyasing the PD patterns.

• Journal of Electrical Engineering and Technology
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• v.7 no.4
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• pp.601-605
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• 2012

Insulated Gate Bipolar Transistors(IGBTs) have received wide attention because of their high current conduction and good switching characteristics. To reduce the power loss of IGBT, the onstate voltage drop should be lowered and the switching time should be shortened. However, there is trade-off between the breakdown voltage and the on-state voltage drop. The FLoatingIsland(FLI) structure can lower the on-state voltage drop without reducing breakdown voltage. In this paper, The FLI IGBT shows an on-state voltage drop that is 22.5% lower than the conventional IGBT, even though the breakdown voltages of each IGBT are almost identical.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.86-86
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• 2010

Recently, CV, CNCV, CNCV-W cable are used to transmit and distribute electric power. And a lot of researchers put more effort to realize high performance. The dielectric breakdown strength characteristic is a standard to design insulators. Examination of that is a main factor to determine long term insulation performance, which is used to diagnose Insulation deterioration. In this paper, we prepared XLPE, XLPE/nano-filler, LDPE/nano-filler for comparing each of the dielectric breakdown strength characteristics.

• Journal of Korea Society of Industrial Information Systems
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• v.17 no.3
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• pp.27-34
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• 2012

This paper presents the impact of time dependent dielectric breakdown (TDDB, also called as gate oxide breakdown) failure on nanoscale digital CMOS Circuits. Recently, TDDB for ultra-thin gate oxides has been considered as one of the critical reliability issues which can lead to performance degradation or logic failures in nanoscale CMOS devices. Also, leakage power in the standby mode can be increased significantly. In this paper, TDDB aging effects on large CMOS digital circuits in the 45nm technology are analyzed. Simulation results show that TDDB effect on MOSFET circuits can result in more significant increase of power consumption compared to delay increase.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.28 no.8
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• pp.496-500
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• 2015

This paper was proposed the theoretical research and optimal design 3000V super junction NPT IGBT for using electrical automotive and power conversion. Because super junction IGBT was showed ultra low on resistance, it was structure that can improve the thermal characteristics of conventional NPT IGBT. The electrical characteristics of super junction NPT IGBT were 2.52 V of on state voltage drop, 4.33 V of threshold voltage and 2,846 V breakdown voltage. We did not obtaing 3,000 V breakdown voltage but we will obtain 3,000 V breakdown voltage through improving p pillar layer. If we are carried this research, This device will be used electrical automotive, power conversiton and high speed train.

• Journal of the Korean Statistical Society
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• v.26 no.4
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• pp.507-520
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• 1997

In this paper we propose a robust Wald-type test which is based on an efficient Mallows-type one-step GM-estimator. The proposed estimator based on the weight function of Song, Park and Nam (1996) has a bounded influence function and a high breakdown point. Under some regularity conditions, we compute the finite-sample breakdown point, and drive asymptotic normality of the proposed estimator. The level and power breakdown points, influence function and asymptotic distribution of the proposed test statistic are main points of this paper. To compare the performance of the proposed test with other tests, we perform some Monte Carlo simulations.

• Journal of Power Electronics
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• v.3 no.3
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• pp.159-166
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• 2003

The winding insulation of low-voltage induction motors in adjustable-speed drive system with voltage-fed Inverters is substantially stressed due to the uneven voltage distribution and excessive voltage stress (dv/dt), which result in the premature insulation breakdown In this paper, the detailed insulation test results of 26 low-voltage induction motors are presented. Six different types of insulation techniques are applied to 26 motors. The insulation characteristics are analyzed with partial discharge, discharge inception voltage, AC current, and dissipation factor tests Also, insulation breakdown tests by high voltage pulses are performed, and the corresponding breakdown voltages obtained.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1978-1980
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• 2000

Because the interfaces between two different materials are the weak-link in the underground power transmission systems, they affects the stability of insulation systems. In this paper, Epoxy/EPDM interface is selected and investigated the optimum condition by variation of interfacial conditions such as roughness of surface, spreading of oils, interfacial pressure and temperature. The breakdown times under the constant voltage below the breakdown voltage were also gamed. The breakdown voltage at the after laying time equivalent to is calculated by the V-t characteristic and the inverse power law. When this is done. the characteristic life exponent n is used and the long time breakdown voltage can be evaluated.