• 제목/요약/키워드: polycrystalline silicon

검색결과 344건 처리시간 0.031초

Growth of Hexagonal Boron Nitride Thin Films on Silicon Using a Single Source Precursors

  • Boo, Jin-Hyo;Lee, Soon-Bo;Casten Rohr;Wilson Ho
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 1998년도 제14회 학술발표회 논문개요집
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    • pp.120-120
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    • 1998
  • Boron nitride (BN) films have attracted a growing interest for a variety of t technological applications due to their excellent characteristics, namely hardness, c chemical inertness, and dielectrical behavior, etc. There are two crystalline phases 1551; of BN that are analogous to phases of carbon. Hexagonal boron nitride (h-BN) has a a layered s$\sigma$ucture which is spz-bonded structure similar to that of graphite, and is t the stable ordered phase at ambient conditions. Cubic boron nitride (c-BN) has a z zinc blende structure with sp3-bonding like as diamond, 따ld is the metastable phase a at ambient conditions. Among of their prototypes, especially 삼Ie c-BN is an i interesting material because it has almost the same hardness and thermal c conductivity as di없nond. C Conventionally, significant progress has been made in the experimental t techniques for synthesizing BN films using various of the physical vapor deposition 밍ld chemical vapor deposition. But, the major disadvantage of c-BN films is that t they are much more difficult to synthesize than h-BN films due to its narrow s stability phase region, high compression stress, and problem of nitrogen source c control. Recent studies of the metalorganic chemical vapor deposition (MOCVD) of I III - V compound have established that a molecular level understanding of the d deposition process is mandatory in controlling the selectivity parameters. This led t to the concept of using a single source organometallic precursor, having the c constituent elements in stoichiometric ratio, for MOCVD growth of 삼Ie required b binary compound. I In this study, therefore, we have been carried out the growth of h-BN thin f films on silicon substrates using a single source precursors. Polycrystalline h-BN t thin films were deposited on silicon in the temperature range of $\alpha$)() - 900 $^{\circ}$C from t the organometallic precursors of Boron-Triethylamine complex, (CZHs)3N:BRJ, and T Tris(dimethylamino)Borane, [CH3}zNhB, by supersonic molecular jet and remote p plasma assisted MOCVD. Hydrogen was used as carrier gas, and additional nitrogen w was supplied by either aDlIDonia through a nozzle, or nitrogen via a remote plasma. T The as-grown films were characterized by Fourier transform infrared spectroscopy, x x-ray pthotoelectron spectroscopy, Auger electron spectroscopy, x-ray diffraction, t transmission electron diffraction, optical transmission, and atomic force microscopy.roscopy.

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성장각도에 따른 주상구조 ZnO 박막의 광학적 특성 (The optical properties of columnar structure according to the growth angles of ZnO thin fims)

  • 고기한;서재근;김재광;강은규;박문기;주진영;신용덕;최원석
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 추계학술대회 논문집
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    • pp.127-127
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    • 2009
  • The most important part of the fabrication solar cells is the anti-reflection coating when excludes the kinds of silicon substrates (crystalline, polycrystalline, or amorphous), patterns and materials of electrodes. Anti-reflection coatings reduce the reflection of sunlight and at last increase the intensity of radiation to inside of solar cells. So, we can obtain increase of solar cell efficiency about 10% using anti-reflection coating. There are many kinds of anti-reflection film for solar cell, such as SiN, $SiO_2$, a-Si, and so on. And, they have two functions, anti-reflection and passivation. However such materials could not perfectly prevent reflection. So, in this work, we investigated the anti-reflection coating with the columnar structure ZnO thin film. We synthesized columnar structure ZnO film on glass substrates. The ZnO films were synthesized using a RF magnetron sputtering system with a pure (99.95%) ZnO target at room temperature. The anti-reflection coating layer was sputtered by argon and oxygen gases. The angle of target and substrate measures 0, 20, 40, 60 degrees, the working pressure 10 mtorr and the 250 W of RF power during 40 minutes. The confirm the growth mechanism of ZnO on columnar structure, the anti-reflection coating layer was observed by field emission scanning electron microscopy (FE-SEM). The optical trends were observed by UV-vis and Elleso meter.

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3C-SiC 버퍼층이 AlN 박막형 SAW 특성에 미치는 영향 (Effect of a 3C-SiC buffer layer on SAW properties of AlN films)

  • 황시홍;정귀상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.235-235
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    • 2009
  • This paper describes the influence of a polycrystalline (poly) 3C-SiC buffer layer on the surface acoustic wave (SAW) properties of poly aluminum nitride (AlN) thin films by comparing the center frequency, insertion loss, the electromechanical coupling coefficient ($k^2$), andthetemperaturecoefficientoffrequency(TCF) of an IDT/AlN/3C-SiC structure with those of an IDT/AlN/Si structure, The poly-AlN thin films with an (0002)-preferred orientation were deposited on a silicon (Si) substrate using a pulsed reactive magnetron sputtering system. Results show that the insertion loss (21.92 dB) and TCF (-18 ppm/$^{\circ}C$) of the IDT/AlN/3C-SiC structure were improved by a closely matched coefficient of thermal expansion (CTE) and small lattice mismatch (1 %) between the AlN and 3C-SiC. However, a drawback is that the $k^2(0.79%)$ and SAW velocity(5020m/s) of the AlN/3C-SiC SAW device were reduced by appearing in some non-(0002)AlN planes such as the (10 $\bar{1}$ 2) and (10 $\bar{1}$ 3) AlN planes in the AlN/SiC film. Although disadvantages were shown to exist, the use of the AlN/3C-SiC structure for SAW applications at high temperatures is possible. The characteristics of the AlN thin films were also evaluated using FT-IR spectra, XRD, and AFM images.

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p-채널 다결정 실리콘 박막 트랜지스터의 문턱전압 변동을 보상할 수 있는 5-TFT OLED 화소회로 (5-TFT OLED Pixel Circuit Compensating Threshold Voltage Variation of p-channel Poly-Si TFTs)

  • 정훈주
    • 한국전자통신학회논문지
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    • 제9권3호
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    • pp.279-284
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    • 2014
  • 본 논문에서는 p-채널 저온 다결정 실리콘 박막 트랜지스터의 문턱전압 변동을 보상할 수 있는 새로운 OLED 화소회로를 제안하였다. 제안한 5-TFT OLED 화소회로는 4개의 스위칭 박막 트랜지스터, 1개의 OLED 구동 박막 트랜지스터 및 1개의 정전용량으로 구성되어 있다. 제안한 화소회로의 한 프레임은 초기화 구간, 문턱전압 감지 및 데이터 기입 구간, 데이터 유지 구간 및 발광 구간으로 나누어진다. SmartSpice 시뮬레이션 결과, 구동 트랜지스터의 문턱전압이 ${\pm}0.25V$ 변동 시 최대 OLED 전류의 오차율은 -4.06%이였고 구동 트랜지스터의 문턱전압이 ${\pm}0.50V$ 변동 시 최대 OLED 전류의 오차율은 9.74%였다. 따라서 제안한 5T1C 화소회로는 p-채널 다결정 실리콘 박막 트랜지스터의 문턱전압 변동에 둔감하여 균일한 OLED 전류를 공급함을 확인하였다.

SWPV 태양 열-전기 복합생산 모듈 성능평가 연구 (Performance Evaluation Study of Solarwall-Photovoltaic Module to Generate Solar Electric Power)

  • 아메드 나비드;강은철;이의준
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2005년도 춘계학술대회
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    • pp.397-402
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    • 2005
  • Photovoltaic (PV) module can generate electricity using sunlight without causing any environmental degradation. Due to higher fossil fuel prices and environmental awareness, PV applications are becoming more popular as clean source of electricity generation. PV output is sensitive to the operating temperature and can be drastically affected in Building Integrated PV (BIPV) systems. PV Solarwall (SWPV) combination and PV systems have been evaluated in this study for improvement in electrical output and system costs. PV modules under forced ventilation. A 75W polycrystalline silicon PV module was fixed on SW in front of the ventilation fan as it was indicated to be the coolest position on the SW in phoenix simulations. The effectiveness of cooling by means of the forced ventilating air stream has been studied experimentally. The results indicate that there appears to be significant difference in temperature as well as electricity output comparing the SWPV and BIPV options. Electrical output power recovered is about $4\%$ during the typical day of the month of February. RETScreen(R) analysis of a 3kW PV system hypothetically located at Taegu has shown that with typical temperature reduction of $15^{{\circ}C$, it is possible to reduce the simple payback periods by one year. The work described in this paper may be viewed as an appraisal of a SWPV system based on its improved electrical and financial performances due to its ability to operate at relatively lower temperatures.

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우주비행체용 세라믹 복합재료 해외기술 동향 (Current Status of Ceramic Composites Technology for Space Vehicle)

  • 이호성
    • 항공우주산업기술동향
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    • 제7권2호
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    • pp.76-84
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    • 2009
  • 본 논문에서는 우주비행체에 사용하는 세라믹 복합재료의 기술개발에 대한 외국의 현황을 검토하였다. 우주선진국에서는 세라믹 복합재료의 경량 및 우수한 고온 특성을 이용하기 위해 최첨단 엔진구조물에 적용하여 우주비행체의 성능을 향상시키기 위하여 많이 사용해왔다. 특히 내열성, 내산화성 그리고 고온에서의 높은 강도가 요구되는 우주비행체에 적합하여, 로켓엔진챔버, 노즐, 태양판, 레이더안테나, 우주반사경 구조물, 초음속비행체 선단부, 재진입비행체의 노즈팁, 그리고 우주비행체의 방열판등에 사용하고 있다. 이러한 부품을 제작하기 위한 공정기술과 현재의 응용사례를 제시되어 향후 국내의 우주개발사업에 적용될 수 있도록 하였다.

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스퍼터링법으로 제작한 WO$_3$ 박막을 이용한 NO$_2$ 마이크로 가스센서에 관한 연구 (A Study on Micro Gas Sensor Utilizing WO$_3$ Thin Films Fabricated by Sputtering Method)

  • 김창교;이영환;노일호;유홍진;유광수;기창진
    • 한국산학기술학회논문지
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    • 제4권3호
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    • pp.139-144
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    • 2003
  • 평면형 마이크로가스센서를 MEMS 기술을 이용하여 제작하였다. NO₂ 가스의 감지를 위한 감지물질로서 이용되는 WO₃ 박막은 텅스텐 타겟을 스퍼터링한 후에 1시간 동안 여러 온도에서 열산화법에 의해 형성하였다. NO₂ 감도(Rgas/Rair)는 열처리 온도에 따른 WO₃ 박막에 대해 조사하였다. 동작온도가 200℃일 때 600℃에서 열처리한 시편의 NO₂가스감도가 가장 높았다. XRD의 결과는 열처리한 시편은 triclinic구조와 orthorhombic구조가 혼합된 다결정상을 보여주었다 또한 시편은 triclinic구조가 적을수록 더 높은 가스 감도를 보여주었다 600℃에서 열처리한 시편의 20℃의 동작온도일 때 5 ppm NO₂ 가스감도는 약 90이었다.

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Investigation of Effective Contact Resistance of ZTO-Based Thin Film Transistors

  • 강유진;한동석;박재형;문대용;신소라;박종완
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.543-543
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    • 2013
  • Thin-film transistors (TFTs) based on oxide semiconductors have been regarded as promising alternatives for conventional amorphous and polycrystalline silicon TFTs. Oxide TFTs have several advantages, such as low temperature processing, transparency and high field-effect mobility. Lots of oxide semiconductors for example ZnO, SnO2, In2O3, InZnO, ZnSnO, and InGaZnO etc. have been researched. Particularly, zinc-tin oxide (ZTO) is suitable for channel layer of oxide TFTs having a high mobility that Sn in ZTO can improve the carrier transport by overlapping orbital. However, some issues related to the ZTO TFT electrical performance still remain to be resolved, such as obtaining good electrical contact between source/drain (S/D) electrodes and active channel layer. In this study, the bottom-gate type ZTO TFTs with staggered structure were prepared. Thin films of ZTO (40 nm thick) were deposited by DC magnetron sputtering and performed at room temperature in an Ar atmosphere with an oxygen partial pressure of 10%. After annealing the thin films of ZTO at $400^{\circ}C$ or an hour, Cu, Mo, ITO and Ti electrodes were used for the S/D electrodes. Cu, Mo, ITO and Ti (200 nm thick) were also deposited by DC magnetron sputtering at room temperature. The channel layer and S/D electrodes were defined using a lift-off process which resulted in a fixed width W of 100 ${\mu}m$ and channel length L varied from 10 to 50 ${\mu}m$. The TFT source/drain series resistance, the intrinsic mobility (${\mu}i$), and intrinsic threshold voltage (Vi) were extracted by transmission line method (TLM) using a series of TFTs with different channel lengths. And the performances of ZTO TFTs were measured by using HP 4145B semiconductor analyzer. The results showed that the Cu S/D electrodes had a high intrinsic field effect mobility and a low effective contact resistance compared to other electrodes such as Mo, ITO and Ti.

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P channel poly-Si TFT의 길이와 두께에 관한 특성 (Characterization of channel length and width of p channel poly-Si thin film transistors)

  • 이정인;황성현;정성욱;장경수;이광수;정호균;최병덕;이기용;이준신
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
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    • pp.87-88
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    • 2006
  • Recently, poly-Si TFT-LCD starts to be mass produced using excimer laser annealing (ELA) poly-Si. The main reason for this is the good quality poly-Si and large area uniformity. We report the influence of channel length and width on poly-Si TFTs performance. Transfer characteristics of p-channel poly-Si thin film transistors fabricated on polycrystalline silicon (poly-Si) thin film transistors (TFTs) with various channel lengths and widths of 2-30 ${\mu}m$ has been investigated. In this paper, we analyzed the data of p-type TFTs. We studied threshold voltage ($V_{TH}$), on/off current ratio ($I_{ON}/I_{OFF}$), saturation current ($I_{DSAT}$), and transconductance ($g_m$) of p-channel poly-Si thin film transistors with various channel lengths and widths.

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n-채널 다결정 실리콘 박막 트랜지스터의 문턱전압 변동 보상을 위한 전압 기입 AMOLED 화소회로 (A Voltage Programming AMOLED Pixel Circuit Compensating Threshold Voltage Variation of n-channel Poly-Si TFTs)

  • 정훈주
    • 한국전자통신학회논문지
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    • 제8권2호
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    • pp.207-212
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    • 2013
  • 본 논문에서는 n-채널 저온 다결정 실리콘 박막 트랜지스터의 문턱전압 변동을 보상할 수 있는 전압 기입 AMOLED 화소회로를 제안하였다. 제안한 6T1C 화소회로는 5개의 스위칭 박막 트랜지스터, 1개의 OLED 구동 박막 트랜지스터 및 1개의 정전용량으로 구성되어 있다. SmartSpice 시뮬레이션 결과, 구동 트랜지스터의 문턱전압이 ${\pm}0.33$ V 변동시 최대 OLED 전류의 오차율은 7.05 %이고 Vdata = 5.75 V에서 OLED 양극 전압 오차율은 0.07 %로 제안한 6T1C 화소회로가 구동 트랜지스터의 문턱전압 변동에도 균일한 OLED 전류를 공급함을 확인하였다.