The Development of Pattern Classification for Inner Defects in Semiconductor packages by Self-Organizing map (자기조직화 지도를 이용한 반도체 패키지 내부결함의 패턴분류 알고리즘 개발)
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- Proceedings of the Korean Society of Machine Tool Engineers Conference
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- 2002.10a
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- pp.80-84
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- 2002