• 제목/요약/키워드: paraelectric

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$(Sr_{0.85}{\cdot}Ca_{0.15})_mTiO_3$ 입계층 세라믹의 하전입자 거동 (Behavior of Charged Particles do $(Sr_{0.85}{\cdot}Ca_{0.15})_mTiO_3$ Grain Boundary Layer Ceramics)

  • 김진사;정동효;김상남;박재세;최운식;이준용
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1995년도 추계학술대회 논문집
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    • pp.209-212
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    • 1995
  • In this paper, the $(Sr_{0.85}{\cdot}Ca_{0.15})TiO_3$ of paraelectric grain boundary layer (GBL) ceramics were fabricated. The characteristics of electrical conduction and the thermally stimulated current(TSC) were measured respectively. The region I below 200[V/cm] shows the ohmic conduction, the region II between 200[V/cm] and 1000[V/cm] can be explained by the Pool-Frenkel emission theory, and the region III above 2000[V/cm] is dominated by the tunneling effect. As a result, The origins of these peaks are that the ${\alpha}$ peak observed at $-20[^{\circ}C]$ looks like to be ascribed to the ionization excitation from donor level in the grain, and the ${\alpha}^{\prime}$ peak observed at $-20[^{\circ}C]$ appears to show up by detrap of the trapped carrier of border between the oxidation layer and the grain, and the ${\beta}$ peak observed at $80[^{\circ}C]$ seems to be resulted from hopping conduction of existing carrier in the trap site of the border between the oxidation and second phase.

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Zr이 첨가된 $({Ba_{1-x}},{Sr_x})TiO_3$ 박막의 미세구조와 전기적 성질 (Microstructures and Electrical Properties of Zr Modified $({Ba_{1-x}},{Sr_x})TiO_3$ Thin Films)

  • 박상식
    • 한국재료학회지
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    • 제10권9호
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    • pp.607-611
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    • 2000
  • 고밀도 DRAM에서 박막 커패시터로의 적용을 위해 Zr이 첨가된 (Ba(sub)1-x, Sr(sub)x)TiO$_3$<원문차조> 박막이 r.f. magnetron sputter-ing 법에 의해 제조되었다. 증착된 박막들은 다결정질 구조를 보였으며 증착압력이 감소함에따라 Zr/Ti의 비가 현저히 증가하였으며 본 연구에서는 얻어진 박막들은 100kHz에서 380∼525의 유전상수값을 나타냈다. 전압에 따른 커패시턴스와 분극량의 변화는 이력특성을 크게 보이지 않아 상유전상으로 형성되었음을 보였다. 누설전류밀도는 증착압력이 감소함에 따라 작아지는 경향을 보였고 10mTorr이상에서 증착된 박막의 경우 200kV/cm의 전계에서 10(sup)-7∼10(sup)-8A/$\textrm{cm}^2$의 차수를 갖는 누설전류밀도를 보여 본 연구에서 제조된 (Ba(sub)1-x, Sr(sub)x)(Ti(sub)1-x, Zr(sub)x)O$_3$<원문참조>박막은 고밀도 DRAm을 위한 커패시터에의 적용가능성을 보였다.

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RF Magnetron Sputtering에 의한 $(Ba_{0.5}, Sr_{0.5})Tio_3$박막의 제조와 전기적 특성에 관한 연구 (Preparation and Electrical Properties of $(Ba_{0.5}, Sr_{0.5})Tio_3$Thin Films by RF Magnetron Sputtering)

  • 박상식;윤손길
    • 한국재료학회지
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    • 제4권4호
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    • pp.453-458
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    • 1994
  • 256Mb DRAM에서 박막 커패시터로의 적용을 위해서$(Ba_{0.5}Sr_{0.5)/TiO_3$(BST)박막이 RF Magnetron Sprttering방법에 의해 제조되었다. BST박막의 결정화도는 기판온도가 높아짐에 따라 증가하였고 증착된 박막의 조성은 $(Ba_{0.48}Sr_{0.48)/TiO_{2.93}$이었다. 이때 Pt/Ti장벽층은 Si의 BST계면으로의 확산을 억제하였다. 100kHz에서의 유전상수 및 유전손실은 각각 320 및 0.022이었다. 인가전계도 (Charge Storage Density)는 40fC/$\mu \textrm{m}^{2}$, 누설전류밀도(Leakage Current Density)는 0.8$\mu A/\textrm{cm}^2$ 로서 RF Matnetron sputtering방법에 의해 제조된 BST 박막이 256Mb DRAM 적용 가능함을 보였다.

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(Bi1⁄2Na1⁄2)1-xCaxTiO3 세라믹스의 압전 특성 및 상전이 거동 (Piezoelectric Properties and Phase Transition behaviors of (Bi1/2Na1/2)1- xCaxTiO3Ceramics)

  • 이용현;조정호;김병익;최덕균
    • 한국세라믹학회지
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    • 제45권5호
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    • pp.263-267
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    • 2008
  • $(Bi_{1/2}Na_{1/2})TiO_3$-based ceramics have been intensively studied as lead-free piezoelectric ceramics. In this study, the piezoelectric properties and phase transition behaviors of BNT based solid solution $(Bi_{0.5}Na_{0.5})_{1-x}Ca_xTiO_3$ ($X=0.01{\sim}0.25$) were investigated. The morphotropic phase boundary(MPB) zone which BNT is transformed from rhombohedral to cubic structure was appeared by adding $CaTiO_3$ with 0.12 mol by the measurement of permittivity and X-ray diffraction. The behavior which ferroelectric BNT with adding $CaTiO_3$ was changed to antiferroelectric and paraelectric state was confirmed by the measurement ofhysterisis loop and depolarization temperature as a function of temperature. As $CaTiO_3$ concentration was increased, the phase transition temperature was decreased. The piezoelectric properties were highest at 0.01 mol of $CaTiO_3$ concentration. The electromechanical coupling factor($K_t$) and mechanical quality factor($Q_m$) were 42% and 254, respectively.

$(1-x)(SrPb)(CaMg)TiO_3-xBi_2O_3{\cdot}3TiO_2$ 세라믹의 하전입자 거동에 관한 연구 (A Study on the Behavior of Charged Particles of $(1-x)(SrPb)(CaMg)TiO_3-Bi_2O_3{\cdot}3TiO_2$ Ceramics)

  • 김충혁;최운식;정일형;정규희;이준응
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1992년도 추계학술대회 논문집
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    • pp.34-37
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    • 1992
  • In this paper, the $(SrPb)(CaMg)TiO_3$-xBi_2O_3{\cdot}3TiO_2$ ceramics with paraelectric properties were fabricated by the mixed oxide method. In order to investigate the behavior of charged particles, the characteristics of electrical conduction and thermally stimulated current were measured respectively. As a result on characteristics of the electrical conduction, the leakage current was increased as measuring temperature was increased. At room temperature, the conduction current was divided into the three steps as a function of DC electric field. The first step was Ohmic region due to ionic conduction, below 15[kV/cm]. The second step was showed a saturation which seems to be related to a depolarizing field occuring in field-enforced ferroelectric phase, between 15[kV/cm] and 40[kV/cm]. The third step was attributed to Child's law related to spare charge which injected from electrode, above 40[kV/cm]. Thermally stimulated currents(TSC) spectra with various biasing fields exhibited three distinguished peaks that were denoted as ${\alpha}$, ${\alpha}'$ and ${\beta}$ peak, each of which appeared at nearby -30, 20 and 95[$^{\circ}C$] respectively. It is confirmed that the a peak was due to trap electron trapped in the grainboundary, and ${\alpha}'$ peak that was observed above only 1.5[kV/mm] was attributed to field-enforced ferroelectric polarization. The origin of ${\beta}$ peak was identified as ion migration which caused the degradation.

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유기 금속 화학 증착법에 의한 $(Ba_{1-x},\;Sr_x)TiO_3$ 박막의 제조 및 전기적 특성 (Preparation and Electrical Properties of $(Ba_{1-x},\;Sr_x)TiO_3$ Thin Film by Metal-Organic Chemical Vapor Deposition)

  • 윤종국;윤순길
    • 한국재료학회지
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    • 제5권7호
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    • pp.816-819
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    • 1995
  • 저압 유기금속 화학 증탁법에 의하여 Pt/Ti/SiO$_2$/Si 기판위에 (Ba$_{1-x}$ , Sr$_{x}$)TiO/$_3$박막이 제조 되었다. 제조된 BST 박막의 결정화도는 증착온도가 증가함에 따라 (100)방향으로 우선 성장하였다. 90$0^{\circ}C$에서 증착한 BST 박막은 100kHz의 주파수에서 유전상수가 365, 유전손실이 0.052를 나타내었다. 인가전계에 따라 축전용량의 변화가 작은 상유전 특성을 보였으며 0.2MV/cm인가 전계에서 축적 전하 밀도(charge storage density)는 60fC/$\mu\textrm{m}$$^2$을, 0.15MV/cm인가 전계 영역에서 누설 전류밀도(leakage current density)는 20nA/$\textrm{cm}^2$을 나타냈다.냈다.

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Crystal Structure of High Temperature Phase in ${Bi_2}{O_2}$-layered Perovskites ${ABi_2}{M_2}{O_9}$(A=Pb, Sr, M=Nb, Ta)

  • Kim, Jeong-Seog;Cheon, Chae-il;Lee, Chang-Hee;Choo, Woong-Gil
    • 한국세라믹학회지
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    • 제38권11호
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    • pp.962-966
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    • 2001
  • Crystal structure of PbBi$_2$Nb$_2$$O_{9}$ and $Sr_{1.2}$$Bi_{1.8}$Ta$_2$$O_{9}$ were determined by Rietveld method using neutron diffraction data in the temperature range of 300 K~1273K. Phase transition temperature were measured from the dielectric permittivitytemperature curve. The PbBi$_2$Nb$_2$$O_{9}$ showed a phase transition at about 810 K. In the Sr-excess compound $Sr_{1.2}$$Bi_{1.8}$Ta$_2$$O_{9}$ the phase transition was suppressed down to room temperature. Several structural models were tested by the Rietiveld refinement. Based on the \`R\` values and the structural parameters, the B2cb model is judged to be the most feasible one for the high temperature phase at above 810 K of the PbBi$_2$Nb$_2$$O_{9}$. The $Sr_{1.2}$$Bi_{1.8}$Ta$_2$$O_{9}$ sample was refined to show the most reliable results by the Am2m model.sults by the Am2m model.

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PLT(28) 박막의 제작과 전기적 특성에 관한 연구 (Preparation and Electrical properties of the PLT(28) Thin Film)

  • 강성준;정양희
    • 한국정보통신학회:학술대회논문집
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    • 한국해양정보통신학회 2002년도 추계종합학술대회
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    • pp.784-787
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    • 2002
  • Sol-gel 법으로 PLT(28) 박막을 제작하여, 박막의 구조적 및 전기적 특성을 조사하였다. XRD와 AFM 관찰결과, $650^{\circ}C$에서 annealing 된 박막은 완전한 perovskite 구조를 가지며 표면거칠기도 22$\AA$ 으로 양호한 값을 나타내었다. Pt/TiO$_{x}$SiO2/Si 기판위에 PLT(28) 박막을 증착시켜 planar 형태의 캐패시터를 제작하여 전기적 특성을 조사하였다. 그 결과, PLT(28) 박막은 상유전상을 가지며,10kHz에서 비유전률과 유전손실은 761 과 0.024 이었다. 또, 5V에서 전하축적 밀도와 누설전류밀도는 각각 134fC/$\mu$m2 과 1.01 $\mu$A/cm2 이었다. 이로부터, PLT(28) 박막이 차세대 DRAM 용 캐패시터 절연막으로 사용될 수 있는 유망한 재료라고 생각된다.다.

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Structural Changes in Isothermal Crystallization Processes of Synthetic Polymers Studied by Time-Resolved Measurements of Synchrotron-Sourced X-Ray Scatterings and Vibrational Spectra

  • Tashiro, Kohji;Hama, Hisakatsu
    • Macromolecular Research
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    • 제12권1호
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    • pp.1-10
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    • 2004
  • The structural changes occurring in the isothermal crystallization processes of polyethylene (PE), poly-oxymethylene (POM), and vinylidene fluoridetrifluoroethylene (VDFTrFE) copolymer have been reviewed on the basis of our recent experimental data collected by the time-resolved measurements of synchrotron-sourced wide-angle (WAXS) and small-angle X-ray scatterings (SAXS) and infrared spectra. The temperature jump from the melt to a crystallization temperature could be measured at a cooling rate of 600-1,000 $^{\circ}C$/min, during which we collected the WAXS, SAXS, and infrared spectral data successfully at time intervals of ca. 10 sec. In the case of PE, the infrared spectral data clarified the generation of chain segments of partially disordered trans conformations immediately after the jump. These segments then became transformed into more-regular all-trans-zigzag forms, followed by the formation of an orthorhombic crystal lattice. At this stage, the generation of a stacked lamella structure having an 800-${\AA}$-long period was detected in the SAXS data. This structure was found to transfer successively to a more densely packed lamella structure having a 400-${\AA}$-long period as a result of the secondary crystallization of the amorphous region in-between the original lamellae. As for POM, the formation process of a stacked lamella structure was essentially the same as that mentioned above for PE, as evidenced from the analysis of SAXS and WAXS data. The observation of morphology-sensitive infrared bands revealed the evolution of fully extended helical chains after the generation of lamella having folded chain structures. We speculate that these extended chains exist as taut tie chains passing continuously through the neighboring lamellae. In the isothermal crystallization of VDFTrFE copolymer from the melt, a paraelectric high-temperature phase was detected at first and then it transferred into the ferroelectric low-temperature phase at a later stage. By analyzing the reflection profile of the WAXS data, the structural ordering in the high-temperature phase and the ferroelectric phase transition to the low-temperature phase of the multi-domain structure were traced successfully.

고전압용 세라믹 커패시터의 전기적 특성 (The Electrical Characteristics of Ceramic Capacitor for High Voltage)

  • 홍경진;김태성
    • 조명전기설비학회논문지
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    • 제13권1호
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    • pp.53-59
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    • 1999
  • $(Ba_{0.85}Ca_(0.15)TiO_3+ZnO$ 세라믹 커패시터는 ZnO를 0.1~0.4몰로 변화시켜 시편을 제조하였다. 본 연구에서는 고전압용 세라믹 커패시터의 구조적 및 전기적 특성에 관하여 연구하였다. 세라믹 커패시터의 상대밀도는 모든시료에서 높았다. 입자의 크기는 $1.0~1.22[\mum]$ 정도의 작은 크기이었으며 ZnO의 첨가량이 0.3몰일 때 가장 크게 성장하였다. 입자의 크기가 클 때 시정수는 증가하였다. 세라믹 커패시터의 온도계수는 0.12~10[kHz]에서 100[ppm]이하로 온도변화에 대해 유전율이 안정하였다. 유전 완화시간은 $[110^{\circ}C]$이상에서 계면분극의 영향으로 감소하였으며 $110[^{\circ}C]$이하에서는 상유전층의 공간전하 분극에 의해서 유전 완화시간이 증가하였다. 유전특성에 영향을 주는 절연층의 두께가 ZnO에 의해서 증가하였으며 유전율의 변화는 0.1[%]로 전압의 변동에 대해 유전율이 안정하였다.

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