• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.430-430
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• 2007

In general, polyimides (PIs) are used in liquid crystal displays (LCDs) as alignment layer of liquid crystals (LCs). Up to date, the rubbing alignment technique has been widely used to align liquid crystals on the PI surface, which is suitable for mass-production of LCDs because of its simple process and high productivity. However, this method has some disadvantages. Rubbed PI surfaces include the debris left by the cloth and the generation of electrostatic charges during rubbing process. Therefore, rubbing-free techniques for LC alignment are strongly required in LCD technology. In this experiment, PI was uniformly coated on indium-tin-oxide electrode substrates to form LC alignment layers using a spin-coating method and the PI layers were subsequently imidized at 433 K for 1 h. The thickness of the PI layer was set at 50 nm. The LC alignment layer surfaces were exposed to an $Ar^+$ ion-beam under various ion-beam energies. The antiparallel cells and twisted-nematic (TN) cells for the measurement of pretile angle and electro-optical characteristics were fabricated with the cell gap of 60 and $5\;{\mu}m$, respectively. The LC cells were filled with nematic LC (NLC, MJ001929, Merck) and were assembled. The NLC alignment capability on ion-beam-treated PI was observed using photomicroscope and the pretilt angle of the NLC was measured by the crystal-rotation method at room temperature. Voltage-transmittance (V-T) and response time characteristics of the ion-beam irradiated TN cell were measured by a LCD evaluation system.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.77-77
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• 2000

Titanium oxide (TiO2) thin films have valuable properties such as a high refractive index, excellent transmittance in the visible and near-IR frequency, and high chemical stability. Therefore it is extensively used in anti-reflection coating, sensor, and photocatalysis as electrical and optical applications. Specially, TiO2 have a high dielectric constant of 180 along the c axis and 90 along the a axis, so it is highlighted in fabricating dielectric capacitors in micro electronic devices. A variety of methods have been used to produce patterned self-assembled monolayers (SAMs), including microcontact printing ($\mu$CP), UV-photolithotgraphy, e-beam lithography, scanned-probe based micro-machining, and atom-lithography. Above all, thin film fabrication on $\mu$CP modified surface is a potentially low-cost, high-throughput method, because it does not require expensive photolithographic equipment, and it produce micrometer scale patterns in thin film materials. The patterned SAMs were used as thin resists, to transfer patterns onto thin films either by chemical etching or by selective deposition. In this study, we deposited TiO2 thin films on Si (1000 substrateds using titanium (IV) isopropoxide ([Ti(O(C3H7)4)] ; TIP as a single molecular precursor at deposition temperature in the range of 300-$700^{\circ}C$ without any carrier and bubbler gas. Crack-free, highly oriented TiO2 polycrystalline thin films with anatase phase and stoichimetric ratio of Ti and O were successfully deposited on Si(100) at temperature as low as 50$0^{\circ}C$. XRD and TED data showed that below 50$0^{\circ}C$, the TiO2 thin films were dominantly grown on Si(100) surfaces in the [211] direction, whereas with increasing the deposition temperature to $700^{\circ}C$, the main films growth direction was changed to be [200]. Two distinct growth behaviors were observed from the Arhenius plots. In addition to deposition of THe TiO2 thin films on Si(100) substrates, patterning of TiO2 thin films was also performed at grown temperature in the range of 300-50$0^{\circ}C$ by MOCVD onto the Si(100) substrates of which surface was modified by organic thin film template. The organic thin film of SAm is obtained by the $\mu$CP method. Alpha-step profile and optical microscope images showed that the boundaries between SAMs areas and selectively deposited TiO2 thin film areas are very definite and sharp. Capacitance - Voltage measurements made on TiO2 films gave a dielectric constant of 29, suggesting a possibility of electronic material applications.

• Journal of Korean Ophthalmic Optics Society
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• v.13 no.3
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• pp.45-50
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• 2008

Purpose: A soft contact lens was manufactured by adding naringin known as natural anti-bacterial material to resin solution. With solution eluted from manufactured contact lens, we examined its optical properties, physical and chemical states of naringin in the polymer, and elution properties. Methods: The soft contact lens with naringin was synthesized by bulk polymerization method. IR spectrum and HPLC were used to define the bonding type of naringin itself in the soft contact lens contained naringin, elution process of naringin to the saline solution, and the amount of naringin solution eluted from the lens with elapsed time. Results: Naringin was continuously eluted with constant concentration from the soft contact lens for about a month and the structure ofnaringin which is eluted was as same as before it was added to resin solution. Any change in optical properties such as transmittance couldn't be found. Bonding state and the structure of naringin in contact lens were explained with IR spectrum and HPLC results. Conclusions: In the contact lens with naringin, naringin remained in the contact lens bonding with weak hydrogen bonding and/or van der Waals force between naringin and polymer. Naringin was continuously eluted from the contact lens contained naringin during about 1 month. Even after 1 month, it showed that the concentration of the naringin eluted was approximately 10 ppm in a day. From the results, adding naringin to the soft contact lens resin is very effective method for manufacturing the soft contact lens which has anti-bacterial function for a period of time.

• The Journal of the Korea institute of electronic communication sciences
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• v.14 no.5
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• pp.887-892
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• 2019

In this study, after 20nm-thick $SiO_2$ thin film was deposited by PECVD method on the PES substrate, which is known to have the highest heat resistance among plastic substrates, as a buffer layer, ITZO thin films were deposited by RF magnetron sputtering method to investigate the electrical and optical properties according to the working pressure. The ITZO thin film deposited at the working pressure of 3mTorr showed the best electrical properties with a resistivity of $8.02{\times}10^{-4}{\Omega}-cm$ and a sheet resistance of $50.13{\Omega}/sq.$. The average transmittance in the visible region (400-800nm) of all ITZO films was over 80% regardless of working pressure. The Figure of merit showed the largest value of $23.90{\times}10^{-4}{\Omega}^{-1}$ in the ITZO thin film deposited at 3mTorr. This study found that ITZO thin films are very promising materials to replace ITO thin films in next-generation flexible display devices.

• Applied Chemistry for Engineering
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• v.30 no.3
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• pp.358-364
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• 2019

To improve the optical characteristics and antifouling of anti-reflective coating (AR) films, various AR coating films were prepared by varying the mixing ratio of tetraethylorthosilicate (TEOS)/base and methyltrimethoxysilane (MTMS)/acid hybrid solution. Prepared AR coating films were characterized by UV-Vis spectroscopy, contact angle analyzer, atomic force microscope (AFM), FT-IR and pencil scratch hardness test. In an AR coating film that prepared from the hybrid solution with a 10 wt% MTMS/acid solution, the glass substrate showed an excellent optical property (97.2% transmittance), good antifouling ($121^{\circ}$ water contact angle and $90^{\circ}\;CH_2I_2$ contact angle) and moderate mechanical strength (pencil hardness of 4 H). In particular, it is considered that the good antifouling was due to the well dispersion of the methyl group ($-CH_3$), derived from a small amount of MTMS/acid solution in the hybrid solution, on the substrate surface. From results of the pencil hardness test, the mechanical strength of AR coating film was improved as the content of MTMS/acid solution increased.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.33 no.6
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• pp.250-254
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• 2023

In this study, Li₂O-BaO-Ga₂O₃-TeO₂-TiO₂-GeO₂ glasses with high transmittance in mid-infrared region and high refractive indices were successfully synthesized. The relationship between glass properties and glass composition was analyzed. In Li₂O-BaO-Ga₂O₃-TeO₂-TiO₂-GeO₂ glass system, as increasing TeO₂ concentration, the refractive index increases and the glass transition temperature decreases. In addition, as increasing BaO concentration, the refractive index increases without decrease of Abbe number. The IR-cut off wavelength shifted to the longer wavelength with increasing TeO₂ and BaO contents due to their large molecular weight. The glass transition temperature significantly decreases when BaO was replaced with Li₂O.

• Journal of the Korean Association of Geographic Information Studies
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• v.5 no.2
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• pp.1-15
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• 2002

Atmospheric aerosols interact with sunlight and affect the global radiation balance that can cause climate change through direct and indirect radiative forcing. Because of the spatial and temporal uncertainty of aerosols in atmosphere, aerosol characteristics are not considered through GCMs (General Circulation Model). Therefor it is important physical and optical characteristics should be evaluated to assess climate change and radiative effect by atmospheric aerosols. In this study GMS-5 satellite data and surface measurement data were analyzed using a radiative transfer model for the Yellow Sand event of April 7~8, 2000 in order to investigate the atmospheric radiative effects of Yellow Sand aerosols, MODTRAN3 simulation results enable to inform the relation between satellite channel albedo and aerosol optical thickness(AOT). From this relation AOT was retreived from GMS-5 visible channel. The variance observations of satellite images enable remote sensing of the Yellow Sand particles. Back trajectory analysis was performed to track the air mass from the Gobi desert passing through Korean peninsular with high AOT value measured by ground based measurement. The comparison GMS-5 AOT to ground measured RSR aerosol optical depth(AOD) show that for Yellow Sand aerosols, the albedo measured over ocean surfaces can be used to obtain the aerosol optical thickness using appropriate aerosol model within an error of about 10%. In addition, LIDAR network measurements and backward trajectory model showed characteristics and appearance of Yellow Sand during Yellow Sand events. These data will be good supporting for monitoring of Yellow Sand aerosols.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.29 no.5
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• pp.208-214
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• 2019

The glass of $BaO-GeO_2-La_2O_3-ZnO$ system with a transmittance of more than 75 % at mid-wave infrared (MWIR) region in the range of $3{\mu}m$ to $5{\mu}m$ is manufactured and its property is evaluated. After selecting construction that can melt glass through flow button test, $BaO-GeO_2-La_2O_3$ system where 10 mol%, 20 mol% of ZnO were added respectively were melted at $1350^{\circ}C$ for 1 hour and $BaO-GeO_2-La_2O_3$ system of glass was manufactured. Among them, with 20 mol% of ZnO, 16 mol% BaO-56 mol% $GeO_2-8mol%$ $La_2O_3-16mol%$ ZnO system of glass was found to has less than $660^{\circ}C$ of glass transition temperature, more than 1.70 of refractive index, and more than 530 of knoop hardness. Therefore, it is concluded that glass of $BaO-GeO_2-La_2O_3-ZnO$ system of glass with 20 mol% ZnO has good melting conditions at low temperatures and excellent optical properties, thus, can be utilized for special optical materials field.

• Korean Journal of Optics and Photonics
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• v.13 no.3
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• pp.197-203
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• 2002

The TiO$_2$ coating solutions were synthesized with different concentrations (T1-0.7N, T2-2.0N) of hydrochloric acid used as catalyst. and TiO$_2$ thin films were prepared by sol-gel dip coating. Their structural and optical properties were examined as a function of calcination temperature. XRD results showed that T1 thin films calcined at 400~80$0^{\circ}C$ had the anatase phase, while those calcined at 100$0^{\circ}C$ had the rutile phase. T2 thin films calcined at 40$0^{\circ}C$ and $600^{\circ}C$ had the anatase phase, with the rutile phase for calcination at 80$0^{\circ}C$. Crystallinity of T2 thin films was superior to that of T1 thin films. The crystallite size of TiO$_2$ thin films increased with increasing calcination temperature, and the crystallite size of anatase phase in T2 thin films was larger than that in T1 thin films, but the crystallite size of rutile phase in T2 thin films was smaller. The surface morphology of the films showed that the films were formed more densely in the rutile phase than in the anatase phase, this phenomenon appeared conspicuously in T2 thin films. The transmittance of the samples with thin films on quartz glass calcined at 100$0^{\circ}C$ was significantly reduced at wavelength range about 300-700 nm due to the increased absorption originating from the change of crystallite phase and composition of the films and the scattering effect originating from increasing crystallite size. The refractive index of TiO$_2$ thin films increased, and hence the film thickness as well as the porosity of TiO$_2$ thin films decreased with increasing calcination temperature. Furthermore, the refractive index of T2 thin films was higher than T1 thin films, and porosity of T2 films was lower.

• Journal of the Korean Vacuum Society
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• v.21 no.6
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• pp.333-341
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• 2012

Indium Tin Oxide (ITO) thin films were prepared by RF magnetron sputtering with different flow rates of $O_2$ gas from 0 to 12 sccm. Electrical and optical properties of these films were characterized and analyzed. ITO deposited on soda lime glass and RF power was 2 kW, frequency was 13.56 MHz, and working pressure was $1.0{\times}10^{-3}$ Torr, Ar gas was fixed at 1,000 sccm. The transmittance was measured at 300~1,100 nm ranges by using Photovoltaic analysis system. Electrical properties were measured by Hall measurement system. ITO thin films surface were measured by Scanning electron microscope. Atomic force microscope surface roughness scan for ITO thin films. ITO thin films secondary electron emission coefficient(${\gamma}$) was measured by ${\gamma}$-Focused ion beam. The resistivity is about $2.4{\times}10^{-4}{\Omega}{\cdot}cm$ and the weighted average transmittance is about 84.93% at 3 sccm oxygen flow rate. Also, we investigated Work-function of ITO thin films by using Auger neutralization mechanism according to secondary electron emission coefficient(${\gamma}$) values. We confirmed secondary electron emission peak at 3 sccm oxygen flow rate.