• Korean Journal of Optics and Photonics
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• v.25 no.1
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• pp.29-37
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• 2014

We have studied and demonstrated general, systematic error-correction methods for a dual rotating quarter-wave plate ellipsometer. To estimate and correct 5 systematic error sources (three offset angles and two unexpected retarder phase delays), we used 11 of the 25 Fourier components of the ellipsometry signal obtained in the absence of an optical sample. Using these 11 Fourier components, we can determine the errors from the 5 sources with nonlinear optimization methods. We found systematic errors ${\epsilon}_3$, ${\epsilon}_4$, ${\epsilon}_5$) are more sensitive to the inverted Mueller matrix than retarder phase delay errors (${\epsilon}_1$, ${\epsilon}_2$) because of their small condition numbers. To correct these systematic errors we have found that error of any variety must be less than 0.05 rad. Finally, we can use the magnitudes of these errors to correct the Mueller matrix of optical components. From our experimental ellipsometry signals, we can measure phase delay and the rotational angular position of its fast axis for a half-wave plate.

• Journal of the Korean Society for Precision Engineering
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• v.26 no.5
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• pp.72-78
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• 2009

We propose the separation algorithm to simultaneously measure two-dimensional refractive index distribution and thickness profile of transparent samples using three wavelengths. The optical system was based on the Mach-zehnder interferometer with LD (Laser Diode)-based multi-wavelength sources. A LCR (Liquid Crystal Retarder) was used to obtain interference images at four phase states and then the optical phase of the object is calculated by four-bucket algorithm. Experimental results with a glass rod are provided at the different wavelengths of 635nm, 660nm and 675nm. The refractive indices of the sample are distributed with accuracy of less than 0.0005 and the thickness profile of sample was cylindrical type. This result demonstrates that it is possible to separate refractive index distribution and thickness profile of samples in two dimensions using the proposed algorithm.

• Journal of Astronomy and Space Sciences
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• v.29 no.1
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• pp.69-77
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• 2012

This report describes the inception, development and extensive use over 30 years of elliptical polarimeters at the University of Pennsylvania. The initial Mark I polarimeter design utilized oriented retarder plates and a calcite Foster-Clarke prism as the analyzer. The Mark I polarimeter was used on the Kitt Peak 0.9 m in 1969-70 to accomplish a survey of approximately 70 objects before the device was relocated to the 0.72 m reflector at the Flower and Cook Observatory. Successive generations of automation and improvements included the early-80's optical redesign to utilize a photoelastic modulated wave plate and an Ithaco lock-in amplifier-the photoelastic modulating polarimeter. The final design in 2000 concluded with a fully remote operable device. The legacy of the polarimetric programs includes studies of close binaries, pulsating hot stars, and luminous late-type variables.

• Journal of the Microelectronics and Packaging Society
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• v.30 no.3
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• pp.78-82
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• 2023

A fabrication of smart windows with controllable visible light transmittance in three steps by using λ/2 retardation films based on a reactive mesogen (RM) material and polarizing films is demonstrated. The phase retardation films with a Δn·d value of λ/2 (λ: wavelength) convert the direction of a traveling light to the optical axis of the film symmetrically. In this work, the retardation characteristics according to the RM thickness were evaluated and henceλ/2 phase retardation film can be fabricated. The phase retardation film with Δn·d of 276.1 nm, which is close to λ/2 (=275 nm @550 nm), was fabricated. The light transmittance of a smart window with the structure of (polarizing film)/(glass)/(alignment layer)/(λ/2 retardation film) was measured in the transmission mode, half mode and blocking mode. The evaluation results show that the transmittance of the smart window can be controlled in three steps with 35.8%, 27.8%, and 18.2% at each mode, respectively. In addition, by fabricating a smart window with a size of 15×200 mm², the feasibility of use in various fields such as buildings and automobiles was verified.