• Atmosphere
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• v.25 no.3
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• pp.521-528
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• 2015

In this study star photometry was applied to retrieve aerosol optical thickness (AOT) at night. The star photometry system consisted of small refractor, optical filters, CCD camera, and driving mount and was located in Suwon. The calibration constants were retrieved from the astronomical Langley method but standard deviations of these were more than 10% of the mean values. After the calibration the nighttime AOT was retrieved and cloud-screened in clear six days from 25 Nov. 2014 to 17 Jan. 2015. To estimate the quality of the measurements the nighttime AOT was combined with daytime AOT retrieved from sky-radiometer that was located in Seoul and 17 km away from the star photometry system. In spite of the uncertainty of the calibration constants and the spatial difference of two observation systems, the temporal changes of the nighttime AOT coincided with the daytime. The nighttime ${\AA}ngstr{\ddot{o}}m$ exponent was about 20% lower and more variable than the daytime because of the uncertainty of the calibration constants. If the calibration process is more precise, the combination of star and sun or sky photometry system can monitor the air pollution day and night constantly.

• Proceedings of the Optical Society of Korea Conference
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• 2004.07a
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• pp.250-251
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• 2004

• Proceedings of the Optical Society of Korea Conference
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• 1991.06a
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• pp.90-93
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• 1991

일곤 레이저의 두 파장(488 nm, 514.5 nm)을 사용하여 은 박막과 은 박막 위에 덧증착한 ZnS 박막의 유일한 광학 상수와 두께를 Kretschmann 구조의 표면 플라즈몬 공명을 이용하여 결정하였다.

• Journal of the Korean institute of surface engineering
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• v.30 no.1
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• pp.63-68
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• 1997

The effects of the post-deposition annealing on the structural optical properties of sputtered $TiO_2$ thin films were studied; annealing was carried out in air up to $1000^{\circ}C$ for different duration. The results of the X-ray diffraction and the raman spectroscopy showed the annealing-condition dependent structural transformation of $TiO_2$ films from the as-deposited amorphous phase to the anatase and rutil phases. The spectroscopic elliposometry was used to investigate the deposition-condition dependence of the as-deposted films optical constants and also the evolution of the optical constants correlated with the annealing-induced structural transformation.

• Journal of the Korean Vacuum Society
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• v.9 no.1
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• pp.60-68
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• 2000

The optical constants ($E_g^d$, n, K) of the polycrystalline CdSe thin films deposited on the glass substrate by the electron-beam evaporation technique are determined over 400~2,500 nm photon wavelengths. In order to explain the variation of the optical contents with film thickness and substrate temperatures, the surface microstructural parameter are investigated by AFM (atomic forced microscope( images for the films deposited by different growth conditions. It is shown that the variations of optical constants are close related to changes of the surface morphology of the CdSe thin films. The decrease in the band gap with film thickness is connected with quantum size effects due to increase of the grain size. The refractive index of CdSe films decrease with increasing the grain size of the films, and the dispersion of the refractive index followed a single oscillator model according to the Sellmeier formulation.

• Journal of Korean Ophthalmic Optics Society
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• v.10 no.4
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• pp.267-272
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• 2005

We deposited thin films of organic light-emitting-material $Alq_3$(alumina quinoline) on silicon and slide-glass substrates using thermal evaporation method, and measured spectra of ellipsometry angles ${\Delta}$ and ${\Psi}$ in the photon-energy range of 1.5~5.0 eV using a variable angle spectroscopic ellipsometer. The optical constants, refractive index and extinction coefficient, of $Alq_3$ were determined via the dispersion parameters extracted from the curve-fitting process based on Jellison-Modine dispersion function. The reliability of determined optical constants were verified through the comparison of measured and simulated transmittance curves and the good agreement between simulated absorption-coefficient curves and absorbance spectra measured using a spectrophotometer.

• Journal of Korean Ophthalmic Optics Society
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• v.12 no.3
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• pp.77-81
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• 2007

We sputtered $TiN_x$ (titanium nitride) thin films on silicon substrates using ultra high vacuum RF magnetron sputtering method, and measured spectra of ellipsometry angles ${\Delta}$ and ${\Psi}$ in the photon-energy range of 1.5-5.0 eV using a variable angle spectroscopic ellipsometer. The optical constants, refractive index and extinction coefficient of the $TiN_x$ films were determined via the dispersion parameters extracted from the curve-fitting process based on Drude+Lorentz oscillator dispersion function. The reliability of determined optical constants were verified through the comparison of between simulated reflectance and reflectance spectra measured using a spectrophotometer.

• Journal of Korean Ophthalmic Optics Society
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• v.12 no.1
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• pp.85-90
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• 2007

We deposited thin films of ZnS(Zinc Sulphide), in which was used antireflection coating material of glasses-lens on silicon and slide-glass substrates using spin coating method, and measured spectra of ellipsometry angles ${\Delta}$ and ${\Psi}$ in the photon-energy range of 1.5~5.0 eV using a variable angle spectroscopic ellipsometer. The optical constants, refractive index and extinction coefficient, of ZnS were determined via the dispersion parameters extracted from the curve-fitting process based on Jellison-Modine dispersion function.

• Proceedings of the Optical Society of Korea Conference
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• 2004.07a
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• pp.196-197
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• 2004

• Proceedings of the Optical Society of Korea Conference
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• 2007.07a
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• pp.217-218
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• 2007