• 제목/요약/키워드: microwave vacuum

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Characteristics of Microwave Air Plasma With a Wide Range of Operating Pressures (운전압력 변화에 따른 마이크로파 공기 플라즈마의 특성연구)

  • 조정현;장봉철;박봉경;김윤환;정용호;김곤호
    • Journal of the Korean Vacuum Society
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    • v.11 no.1
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    • pp.68-75
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    • 2002
  • It is observed the characteristic of the microwave air plasma in the wide range of the operating pressure, 1 mTorr ~ 760 Torr. The microwave air plasma was generated by an AC-type microwave source manufactured with a magnetron taken from a commertial microwave oven and the input power was fixed at 370 W. Characteristics of the plasmas were observed by an injection Langmuir probe and an OES(Optical Emission Spectroscopy). The breakdown electric field is drastically changed at 500 mTorr. For < 500 mTorr, the ratio of the breakdown electric field and the pressure decreased inversely to the pressure, $5.7\times10^4$V/m-Torr.However, the ratio increased linearly as 43 V/m-Torr for the operating pressure, > 500 mTorr. The minimum breakdown electric field was observed about 12. kV/m at 500 mTorr. It corresponds that the input frequency equals to the collision frequency. The effective collision cross section of the air at this pressure was calculated as $9.23\times10^{-l6}\textrm{cm}^2$.The results of the OES measurement revealed that the main ions were composed of the oxygen, argon, and nitrogen for > 500 mTorr. In contrast, only oxygen and argon ions were dominated for < 500 mTorr. ion temperature of oxygen (O(II)) in the air was decreased from about 1.2 eV to 0.5 eV as the pressure increased. Langmuir probe data shows that the plasma density for < 500 mTorr was higher that for > 500 mTorr.

Oxide Semiconductor Thin Film Transistor based Solution Charged Cellulose Paper Gate Dielectric using Microwave Irradiation

  • Lee, Seong-Yeong;Jo, Gwang-Won;Jo, Won-Ju
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.207.1-207.1
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    • 2015
  • 차세대 디스플레이 소자로서 TAOS TFT (transparent amorphous oxide semiconductor Thin Film Transistor)가 주목 받고 있다. 또한, 최근에는 값 비싼 전자 제품을 저렴하고 간단히 처분 할 수 있는 시스템으로 대신 하는 연구가 진행되고 있다. 그중, cellulose-fiber에 전기적 시스템을 포함시키는 e-paper에 대한 관심이 활발하다. cellulose fiber는 가볍고 깨지지 않으며 휘는 성질을 가지고 있다. 가격도 저렴하고 가공이 용이하여 차세대 기판의 재료로서 주목받고 있다. 하지만, cellulose-fiber 위에는 고온의 열처리공정과 고품질 박막 성장이 어려워서 TFT 제작에 어려움을 겪고 있다. 이러한 문제를 해결하기 위해서 산화물 반도체를 이용하여 TFT를 제작한 사례가 보고되고 있다. 또한, 채널 물질 뿐만 아니라 cellulose fiber에도 다른 물질을 첨가하거나 증착하여 전기적 화학적 특성을 개선시킨 사례도 많이 보고되고 있다. 본 연구에서는 가장 저품질의 용지로 알려진 신문지와 A4용지를 gate dielectric을 이용하여서 a-IGZO TFT를 제작하였다. 하지만, cellulose fiber로 만들어진 TFT의 경우에는 고온의 열처리가 불가능 하다. 따라서 저온에서 높을 효율은 보이는 microwave energy를 이용하여 열처리를 진행하였다. 추가적으로 저품질의 종이의 특성을 개선시키기 위해서 high-k metal-oxide solution precursor를 첨가 하여 TFT의 특성을 개선시켰다. 결과적으로 cellulose fiber에 metal-oxide solution precursor을 첨가하는 공정과 micro wave를 조사하는 방법을 사용하여 100도 이하에서 cellulose fiber를 저렴하고 우수한 성능의 TFT를 제작에 성공하였다.

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Development of High-performance Oxide Semiconductor Thin-Film Transistor with ITO buried layer by Annealed Microwave

  • Pyo, Ju-Yeong;Im, Cheol-Min;Jo, Won-Ju
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.204.2-204.2
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    • 2015
  • 산화물 반도체는 비정질임에도 불구하고 높은 이동도를 나타내며, 적은 누설 전류, 낮은 소비전력, 저온 공정 가능, 가시광선 영역에서 투명한 성질을 가지고 있다. 이와 같은 다양한 장점들로 인해 산화물 반도체를 이용한 트랜지스터는 차세대 플랫 패널 디스플레이 적용에 있어서 핵심 기술로 각광받고 있다. 한편, 소자의 크기가 점점 더 작아짐에 따라 고집적화에 따른 scaling down은 항상 언급되는 이슈이다. 이와 관련하여 소자의 높은 on current는 트랜지스터를 더 작게 구현할 수 있다는 가능성을 보여준다. 따라서 현재 소자의 on current를 높이기 위해서 소자의 구조를 변형하는 연구가 활발히 진행되고 있다. 본 연구에서는 소자의 on current를 높이기 위한 방법으로 ITO buried layer를 이용한 산화물 반도체 pseudo 트랜지스터를 제작하였다. 먼저 채널을 형성하기 전에 ITO buried layer를 형성시켜준 후, 채널 영역으로서 InGaZnO (2:1:1)를 용액 공정을 이용하여 형성시켰다. 이어서 소자의 전기적 특성 향상을 위해 마이크로웨이브 열처리를 1800 W에서 2분간 실시하였다. 또한 대조군으로 ITO buried layer를 갖지 않는 소자를 같은 방법으로 제작하여 평가하였다. 그 결과 ITO buried later를 갖는 소자에서 대조군과 비교하여 높은 on current를 나타냄을 확인하였다. 이와 같은 결과는 낮은 저항의 ITO buried layer가 current path를 제공함과 동시에 더 두꺼운 채널 층을 형성시켜 높은 on current에 기여하기 때문이다. 결과적으로 ITO buried layer를 갖는 소자 구조를 이용함으로써 고성능 트랜지스터를 제작하여 소자를 집적화 함에 있어서 유망한 소자가 될 것으로 예상된다.

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Controllable electromagnetically-induced transparency-like response in a bilayer metamaterial

  • Hwang, J.S.;Yoo, Y.J.;Kim, Y.J.;Kim, K.W.;Rhee, J.Y.;Park, S.Y.;Lee, Y.P.
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.234.2-234.2
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    • 2015
  • Recently, the electromagnetically-induced transparency (EIT)-like effect in metamaterials has attracted enormous interest. Metamaterial analogs of EIT enable promising applications in slow-light devices, low-loss metamaterial, quantum optics, and novel sensors. In this work, we experimentally and numerically studied a bilayer metamaterial for controllable EIT-like spectral response at microwave frequencies. Bilayer metamaterial consists of two snake-shape resonators (SSRs) with one and two bars. The transmission spectra were measured in a frequency range of 4 - 8 GHz in an anechoic chamber at normal incidence. It is found that two SSRs in the metamaterial are activated in bright modes, and the coupling between two bright modes leads to the EIT-like effect, which results in the enhanced transmission at 5.61 GHz. Furthermore, we confirm that the EIT-like feature could be controlled by adjusting the geometric parameters of metamaterial structure. Our work provides a way to tunable EIT-like effect and various potential applications including filters, sensors, and other microwave devices.

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A Study on the Characteristics of Poly-Si Etching Process Parameter Using ECR Plasma (ECR 플라즈마의 식각 공정변수에 관한 연구)

  • 안무선;지철묵;김영진;윤송현;유가선
    • Journal of the Korean Vacuum Society
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    • v.1 no.1
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    • pp.37-42
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    • 1992
  • Abstract-The ECR(E1ectron Cyclotron Resonance) plasma etcher was developed for process of manufacturing 16M164' DRAM and applied to poly-Si etching process. The etching rate and selectivity of poly-Si were investigated by changing the process factor of pressure gas and microwave power. The increasing power of microwave will have the trend of increasing the etching rate and selectivity of Oxide, and have suitable value process pressure at 6 mTorr. The increasing value of process gas SFdSF6+ Clz will cause the decrease of etching rate and selectivity, this is because the best process factor is not found.

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Hydrogen Production by the Photocatalystic Effects in the Microwave Water Plasma

  • Jang, Soo-Ouk;Kim, Dae-Woon;Koo, Min;Yoo, Hyun-Jong;Lee, Bong-Ju;Kwon, Seung-Ku;Jung, Yong-Ho
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.284-284
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    • 2010
  • Currently, hydrogen has been produced by Steam Reforming or partial oxidation reforming processes mainly from oil, coal, and natural gas and results in the production of $CO_2$. However, these are influenced greatly on the green house effect of the earth. so it is important to find the new way to produce hydrogen utilizing water without producing any environmentally harmful by-products. In our research, we use microwave water plasma and photocatalyst to improve dissociation rate of water. At low pressure plasma, electron have high energy but density is low, so temperature of reactor is low. This may cause of recombination in the generated hydrogen and oxygen from splitting water. If it want to high dissociation rate of water, it is necessary to control of recombination of the hydrogen and oxygen using photocatalyst. We utilize the photocatalytic material($TiO_2$, ZnO) coated plasma reactor to use UV in the plasma. The quantity of hydrogen generated was measured by a Residual Gas Analyzer.

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Microwave Annealing in Ag/HfO2/Pt Structured ReRAM Device

  • Kim, Jang-Han;Kim, Hong-Ki;Jang, Ki-Hyun;Bae, Tae-Eon;Cho, Won-Ju;Chung, Hong-Bay
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.373-373
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    • 2014
  • Resistive-change random access memory (ReRAM) device is one of the promising candidates owing to its simple structure, high scalability potential and low power operation. Many resistive switching devices using transition metal oxides materials such as NiO, Al2O3, ZnO, HfO2, $TiO_2$, have attracting increased attention in recent years as the next-generation nonvolatile memory. Among various transition metal oxides materials, HfO2 has been adopted as the gate dielectric in advanced Si devices. For this reason, it is advantageous to develop an HfO2-based ReRAM devices to leverage its compatibility with Si. However, the annealing temperature of these high-k thin films for a suitable resistive memory switching is high, so there are several reports for low temperature process including microwave irradiation. In this paper, we demonstrate the bipolar resistive switching characteristics in the microwave irradiation annealing processed Ag/HfO2/Pt ReRAM device. Compared to the as-deposited Ag/HfO2/Pt device, highly improved uniformity of resistance values and operating voltage were obtained from the micro wave annealing processed HfO2 ReRAM device. In addition, a stable DC endurance (>100 cycles) and a high data retention (>104 sec) were achieved.

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Fabrication of Indium Tin Oxide (ITO) Transparent Thin Films and Their Microwave Shielding Properties (Indium Tin Oxide (ITO) 투광성 박막의 제조 및 전자파 차폐특성)

  • Kim, Yeong-Sik;Jeon, Yong-Su;Kim, Seong-Su
    • Korean Journal of Materials Research
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    • v.9 no.11
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    • pp.1055-1061
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    • 1999
  • Indium Tin Oxide (ITO) films were fabricated by vacuum deposition technique and their microwave shielding properties were investigated for the application to the transparent shield material. The vacuum coating was conducted in a RF co-sputtering machine. The film composition and structure associated with the sputtering conditions (argon and oxygen pressure. substrate temperature. RF input power) were investigated for the attainment of high electrical conductivity and good transparency. The electrical conductivity of IT0 films fabricated under the optimum deposition conditions (substrate temperature : $300^{\circ}C$. Ar flow rate : 20 sccm, Oxygen flow rate : 10 sccm, In/Sn input power : 50/30 W) showed 5.6$\times10^4$mho/m. The optical transparency is also considerably good. The microwave shielding properties including the dominant shielding mechanism are investigated from the electrical conductivity, thickness and skin depth of the ITO films. The total shielding effectiveness is then estimated to be 26 dB, which provides a suggestion that the IT0 films can be effectively used as the transparent shield material.

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Microwave Propagation in the Plasma for 28 GHz Superconducting ECRIS (28 GHz 초전도 ECRIS 플라즈마에서의 마이크로파 전파)

  • Wang, S.J.;Won, M.S.;Lee, B.S.;Kim, S.H.;Kwak, J.G.;Jeong, S.H.;Kim, S.K.;An, C.Y.
    • Journal of the Korean Vacuum Society
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    • v.19 no.6
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    • pp.467-474
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    • 2010
  • Packet propagation and absorption for the 28 GHz superconducting ECRIS under developing by KBSI Pusan center is analyzed with limited parameter range. The microwave power generated by 28 GHz gyrotron is axially injected to the plasma cavity through waveguide system. According to the analytical ray tracing calculation, the wave packet launched quasi-longitudinally at a high magnetic field side changes its direction from outward to inward as it is approaching resonance layer. Therefore, initially diverging wave does not likely hit a conducting surface before absorbing by electron cyclotron resonance. Also, absorption by plasma with moderate electron density is so strong that reflection by an extraction plate may not be expected.