• Title/Summary/Keyword: isotropic conductive adhesive

Search Result 5, Processing Time 0.016 seconds

Characterization of a Hybrid Cu Paste as an Isotropic Conductive Adhesive

  • Eom, Yong-Sung;Choi, Kwang-Seong;Moon, Seok-Hwan;Park, Jun-Hee;Lee, Jong-Hyun;Moon, Jong-Tae
    • ETRI Journal
    • /
    • v.33 no.6
    • /
    • pp.864-870
    • /
    • 2011
  • As an isotropic conductive adhesive, that is, a hybrid Cu paste composed of Cu powder, solder powder, and a fluxing resin system, has been quantitatively characterized. The mechanism of an electrical connection based on a novel concept of electrical conduction is experimentally characterized using an analysis of a differential scanning calorimeter and scanning electron microscope energy-dispersive X-ray spectroscopy. The oxide on the metal surface is sufficiently removed with an increase in temperature, and intermetallic compounds between the Cu and melted solder are simultaneously generated, leading to an electrical connection. The reliability of the hybrid Cu paste is experimentally identified and compared with existing Ag paste. As an example of a practical application, the hybrid Cu paste is used for LED packaging, and its electrical and thermal performances are compared with the commercialized Ag paste. In the present research, it is proved that, except the optical function, the electrical and thermal performances are similar to pre-existing Ag paste. The hybrid Cu paste could be used as an isotropic conductive adhesive due to its low production cost.

Electrical Characteristics of Isotropic Conductive Adhesives (ICAs) for the Fabrication of RFID Inlays (RFID Inlay 제작용 등방성 도전 접착제의 전기적 특성 평가)

  • Lee, Jun-Sik;Kim, Jun-Ki;Kim, Mok-Soon;Lee, Jong-Hyun
    • Korean Journal of Metals and Materials
    • /
    • v.47 no.7
    • /
    • pp.447-453
    • /
    • 2009
  • Isotropic conductive adhesives (ICAs) have been used or considered as an interconnect material for radio frequency identification (RFID) inlays or other flip chip assemblies due to the advantages of having a low temperature and high-speed bonding. In this work, the curing properties of commercial ICAs for the RFID tag application and the signal transmission in conductive lines that contained the ICA joints were evaluated as a function of the degree of cure at 900 MHz frequency range. The ICAs showed adequate signal transmission only after the curing process passed over the critical time. It was also found that the insertion loss of signal was more dependent on the contact states of Ag fillers in the bondline in preference to the electrical resistance of the ICA itself.

Development of Copper Electro-Plating Technology on a Screen-Printed Conductive Pattern with Copper Paste

  • Eom, Yong-Sung;Son, Ji-Hye;Lee, Hak-Sun;Choi, Kwang-Seong;Bae, Hyun-Cheol;Choi, Jeong-Yeol;Oh, Tae-Sung;Moon, Jong-Tae
    • Journal of the Microelectronics and Packaging Society
    • /
    • v.22 no.1
    • /
    • pp.51-54
    • /
    • 2015
  • An electro-plating technology on a cured isotropic conductive pattern with a hybrid Cu paste composed of resin matrix, copper, and solder powders has been developed. In a conventional technology, Ag paste was used to perform a conductive pattern on a PCB or silicon substrate. From previous research, the electrical conductive mechanism and principle of the hybrid Cu paste were concisely investigated. The isotropic conductive pattern on the PCB substrate was performed using screen-printing technology. The optimum electro-plating condition was experimentally determined by processing parameters such as the metal content of the hybrid Cu paste, applied current density, and time for the electroplating in the plating bath. The surfaces and cross-sections were observed using optical and SEM photographs. In conclusion, the optimized processing conditions for Cu electro-plating technology on the conductive pattern were a current density of $40mA/cm^2$ and a plating time of 20min on the hybrid Cu paste with a metal content of 44 vol.%. More details of the mechanical properties and processing conditions will be investigated in further research.

Reliability of COF Flip-chip Package using NCP (NCP 적용 COF 플립칩 패키지의 신뢰성)

  • Min, Kyung-Eun;Lee, Jun-Sik;Jeon, Je-Seog;Kim, Mok-Soon;Kim, Jun-Ki
    • Proceedings of the KWS Conference
    • /
    • 2010.05a
    • /
    • pp.74-74
    • /
    • 2010
  • 모바일 정보통신기기를 중심으로 전자패키지의 초소형화, 고집적화를 위해 플립칩 공법의 적용이 증가되고 있는 추세이다. 플립칩 패키징 접합소재로는 솔더, ICA(Isotropic Conductive Adhesive), ACA(Anisotropic Conductive Adhesive), NCA(Non Conductive Adhesive) 등과 같은 다양한 접합소재가 사용되고 있다. 최근에는 언더필을 사용하는 플립칩 공법보다 미세피치 대응성을 위해 NCP를 이용한 플립칩 공법에 대한 요구가 증가되고 있는데, NCP의 상용화를 위해서는 공정성과 함께 신뢰성 확보가 필요하다. 본 연구에서는 LDI(LCD drive IC) 모듈을 위한 COF(Chip-on-Film) 플립칩 패키징용 NCP 포뮬레이션을 개발하고 이를 적용한 COF 패키지의 신뢰성을 조사하였다. 테스트베드는 면적 $1.2{\times}0.9mm$, 두께 $470{\mu}m$, 접속피치 $25{\mu}m$의 Au범프가 형성된 플리칩 실리콘다이와 접속패드가 Sn으로 finish된 폴리이미드 재질의 flexible 기판을 사용하였다. NCP는 에폭시 레진과 산무수물계 경화제, 이미다졸계 촉매제를 사용하여 다양하게 포뮬레이션을 하였다. DSC(Differential Scanning Calorimeter), TGA(Thermogravimetric Analysis), DEA(Dielectric Analysis) 등의 열분석장비를 이용하여 NCP의 물성과 경화거동을 확인하였으며, 본딩 후에는 보이드를 평가하고 Peel 강도를 측정하였다. 최적의 공정으로 제작된 COF 패키지에 대한 HTS (High Temperature Stress), TC (Thermal Cycling), PCT (Pressure Cooker Test)등의 신뢰성 시험을 수행한 결과 양산 적용 가능 수준의 신뢰성을 갖는 것을 확인할 수 있었다.

  • PDF

Effect of Cl Content on Interface Characteristics of Isotropic Conductive Adhesives/Sn Plating Interface (도전성접착제/Sn도금의 계면특성에 미치는 Cl의 영향)

  • Kim, Keun-Soo;Lee, Ki-Ju;Suganuma, Katsuaki;Huh, Seok-Hwan
    • Journal of the Microelectronics and Packaging Society
    • /
    • v.18 no.3
    • /
    • pp.33-37
    • /
    • 2011
  • In this study, the degradation mechanism of mounted chip resistors with Ag-epoxy isotropic conductive adhesives (ICAs) under the humidity exposure ($85^{\circ}C$/85%RH) was examined by electrical resistance change and microstructural study. The effect of the chloride content in Ag-epoxy ICA on joint stability was also examined. The increasing range of the electrical resistance in the typical ICA joint was greater than that in the low Cl content ICA joint. In the case of the typical ICA joint, Sn oxides such as SnO, $SnO_2$, and Sn-Cl-O were formed inhomogeneously on the surface of the Sn plating during the $85^{\circ}C$/85%RH test. In contrast, no Sn-Cl-O was found in the low Cl content ICA joint during the $85^{\circ}C$/85%RH. It is suggested that Cl in Ag-epoxy ICA accelerate the electrical degradation of Sn plated chip components joined with Ag-epoxy ICA.