• 전력전자학회논문지
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• 제18권2호
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• pp.199-204
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• 2013

Recently, the demand for fuel efficient electric vehicles (EVs) and hybrid electric vehicles (HEVs) has been growing globally. Due to the increased number of switching devices in the electrified vehicles, the probability of the semiconductor device failure is much higher than in other application areas. A sudden failure in one of the power switches and insufficient power management ability in the systems not only decreases system performance, but also leads to critical safety problems. In this paper, novel switch open circuit fault detection method is proposed, and the proposed approach is verified by experiments.