• 제목/요약/키워드: glass-glass bonding

검색결과 431건 처리시간 0.024초

Spin-on Glass를 이용한 실리콘과 유리의 저온 접합 공정 (Low Temperature Bonding Process of Silicon and Glass using Spin-on Glass)

  • 이재학;유중돈
    • Journal of Welding and Joining
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    • 제23권6호
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    • pp.77-86
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    • 2005
  • Low temperature bonding of the silicon and glass using the Spin-on Glass (SOG) has been conducted experimentally to figure out the effects of the SOG solution composition and process variables on bond strength using the Design of Experiment method. In order to achieve the high quality bond interface without rack, sufficient reaction time of the optimal SOG solution composition is needed along with proper pressure and annealing temperature. The shear strength under the optimal SOG solution composition and process condition was higher than that of conventional anodic bonding and similar to that of wafer direct bonding.

유리-유리 진공-정전 열 접합을 이용한 PDP의 Tubeless 패키징 공정 (PDP Tubeless Packaging Process Using Glass-to-Glass Vacuum-Electrostatic Bonding)

  • 주병권;이덕중
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제50권1호
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    • pp.37-40
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    • 2001
  • New package process for PDP was proposed based on the glass-to-glass vacuum-electrostatic bonding process and tubeless packaging concept derived from the previous study. Hermeticity and operating performance of PDP test panel through the seal-off process application and the possibility for practical use might be high if the process simplicity and productivity-related effort was sequentially carried out.

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Glass Infilteration in Bonding of $BaTiO_3$ and $Al_2O_3$ Layers

  • Shin, Hyo-Soon;Wang, Jong-Hoe;Kim, Jong-Hee
    • 한국분말야금학회:학술대회논문집
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    • 한국분말야금학회 2006년도 Extended Abstracts of 2006 POWDER METALLURGY World Congress Part2
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    • pp.1209-1210
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    • 2006
  • A novel sintering process is proposed for bonding of $BaTiO_3$ and $Al_2O_3$ layers. Common commercial glass was used and infilterated among filler particles. As the kind of commercial glass, the phenomenon of the infilteration is different. Although Sud-1140 glass forms a glass/filler composite, it is not completely infilterated into the filler particles at $900^{\circ}C$. However as the increase of sintering temperature the infilteration of glass was improved. In this study, GA-1 and GA-12 glasses were infilterated the more than Sud-1140 glass. However, they are reacted by $BaTiO_3$ layer. The results of the experiment show that constrained sintering and the co-firing of the different materials were possible for glass infilteration using Sud-1140 glass at $1000^{\circ}C$.

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Tubeless Packaging된 Field Emission Display의 개발 (Development of Tubeless-Packaged Field Emission Display)

  • 주병권;이덕중;이윤희;오명환
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제48권4호
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    • pp.275-280
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    • 1999
  • The glass-to-glass electrostatic bonding process in vacuum environment was developed and the tubeless-packaged FED was fabricated based on the bonding process. The fabricated tubeless-packaged FED showed stable field emission characteristics and potential applicability to the FED tubeless packaging and vacuum in-line sealing.

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접합유리와 반응된 Fe-Hf-N/Cr/SiO2 박막의 연자기 특성 열화 (Degradation of Soft Magnetic Properties of Fe-Hf-N/Cr/SiO2 Thin Films Reacted with Bonding Glass)

  • 제해준;김병국
    • 한국재료학회지
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    • 제14권11호
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    • pp.780-785
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    • 2004
  • The degradation mechanism of soft magnetic properties of $Fe-Hf-N/Cr/SiO_2$ thin films reacted with a bonding glass was investigated. When $Fe-Hf-N/Cr/SiO_2$ films were annealed under $600^{\circ}C$ without the bonding glass, the compositions and the soft magnetic properties of Fe-Hf-N layers were not changed. However, after reaction with the bonding glass at $550^{\circ}C$, the soft magnetic properties of the film were degraded. At $600^{\circ}C$, the saturation magnetization of the reacted film decreased to 13.5 kG, and its coercivity increased to 4 Oe, and its effective permeability decreased to 700. It was founded that O diffused from the glass into the Fe-Hf-N layers during the reaction and generated $HfO_2$ phases. It was considered that the soft magnetic properties of the $Fe-Hf-N/Cr/SiO_2$ films reacted with the bonding glass were primarily degraded by the formation of the Fe-Hf-O-N layer of which the Fe content was below 60 $at\%$, and secondarily degraded by the Fe-Hf-O-N layer above 70 $at\%$.

유리/실리콘 기판 직접 접합에서의 세정과 열처리 효과 (Effects of Wafer Cleaning and Heat Treatment in Glass/Silicon Wafer Direct Bonding)

  • 민홍석;주영창;송오성
    • 한국전기전자재료학회논문지
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    • 제15권6호
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    • pp.479-485
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    • 2002
  • We have investigated the effects of various wafers cleaning on glass/Si bonding using 4 inch Pyrex glass wafers and 4 inch silicon wafers. The various wafer cleaning methods were examined; SPM(sulfuric-peroxide mixture, $H_2SO_4:H_2O_2$ = 4 : 1, $120^{\circ}C$), RCA(company name, $NH_4OH:H_2O_2:H_2O$ = 1 : 1 : 5, $80^{\circ}C$), and combinations of those. The best room temperature bonding result was achieved when wafers were cleaned by SPM followed by RCA cleaning. The minimum increase in surface roughness measured by AFM(atomic force microscope) confirmed such results. During successive heat treatments, the bonding strength was improved with increased annealing temperatures up to $400^{\circ}C$, but debonding was observed at $450^{\circ}C$. The difference in thermal expansion coefficients between glass and Si wafer led debonding. When annealed at fixed temperatures(300 and $400^{\circ}C$), bonding strength was enhanced until 28 hours, but then decreased for further anneal. To find the cause of decrease in bonding strength in excessively long annealing time, the ion distribution at Si surface was investigated using SIMS(secondary ion mass spectrometry). tons such as sodium, which had been existed only in glass before annealing, were found at Si surface for long annealed samples. Decrease in bonding strength can be caused by the diffused sodium ions to pass the glass/si interface. Therefore, maximum bonding strength can be achieved when the cleaning procedure and the ion concentrations at interface are optimized in glass/Si wafer direct bonding.

광중합형 Glass Ionomer Cement의 표면처리 방법에 따른 복합레진과의 결합력에 관한 실험적 연구 (AN EXPERIMENTAL STUDY ON THE SHEAR BOND STRENGTH OF THE COMPOSITE RESIN WITH THE VARIOUS SURFACE TREATMENTS OF LIGHT - CURED GLASS IONOMER CEMENTS)

  • 용승희;이정석
    • Restorative Dentistry and Endodontics
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    • 제17권2호
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    • pp.421-430
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    • 1992
  • The purpose of this study was to evaluate the bond strength between the composite resin and light - cured glass ionomer cement base / liners treated by the several methods. The light - cured glass ionomer cement(Vitrebond / Cavalite) were injected into cavites prepared in acrylic plates. One hundred and twenty specimens were uniformly prepared and devided into 3 groups. For the first group, primer was not applied to glass ionomer cement. For the second group, no application of primer was undertaken and light - curing procedure to uncured glass ionomer cement surface which was covered by bonding agent was undertaken. After bonding composite resin to light - cured glass ionomer surface, the specimens, were stored in $37^{\circ}C$, 100% humidity for 1 hour. The following results were obtained : 1. The omission of application of a primer did not produce a significantly poorer bond strength. 2. Light - curing technique to uncured glass ionomer cement which was covered by bonding agent did not produce a significantly poorer bonding strength. 3. The bond strength of Cavalite to composite resin was significantly higher than that of Vitrebond. 4. There was no significant difference between two different types of composite materials(Silux-Plus / Herculite XR) when it was applied to bond to glass ionomer cement.

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유리-유리 정전접합을 이용한 FED스페이서 기술 개발 (Development of spacer technology using glass to glass anodic bonding for FED)

  • 김민수;박세광;문권진;김관수;우광제;정성재;이남양
    • 한국진공학회지
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    • 제8권4A호
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    • pp.465-469
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    • 1999
  • In this paper, spacer process for FED (Field Emission Display ) was developed with the glass to glass anodic bonding technology using Al film as an interlayer. Characteristics, current density-time curves and force of the anodic boding were measured on various thickness of Al film; 1000$\AA$, 2000$\AA$, 3000$\AA$, 4000$\AA$ and 500$\AA$. Holders for spacer were fabricated with photosensitive glass and (110) Si wafer by bulk micromachining. Spacers was formed on glass substrate by spacer glass to glass anodic bonding and an evacuated panel was fabricated to prove the potential of application for FED.

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유리-유리 기판의 진공-정전 열 접합 특성 (Vacuum-Electrostatic Bonding Properties of Glass-to-Glass Substrates)

  • 주병권;이덕중;이윤희
    • 마이크로전자및패키징학회지
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    • 제7권1호
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    • pp.7-12
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    • 2000
  • 유리 프릿과 유리 튜브를 사용하지 않고 FED, VFD와 PDP를 봉입할 수 있는 기반 기술로서, 진공 내에서 두 장의 sodalite유리 기판들을 정전 열 접합하는 공정을 연구하였으며, 대기 중에서 정전 열 접합한 기판 쌍들과 비교하여 접합 특성을 비교.분석하였다. 진공 분위기 내에서 비정질 실리콘 interlayer를 이용하여 접합된 유리 기판 쌍의 경우, 대기압의 경우와 비교할 때 동일한 접합 온도와 전압에서 접합 강도가 상대적으로 낮은 것으로 측정되었으며, 산소 분위기의 경우 접합 강도가 증가하였음을 확인하였다. XPS와 SIMS를 통한 비정질 실리콘 표면 및 유리기판 표면의 조성 변화 분석으로부터, 진공내에서 산소가 부족함으로써 정전 열 접합 과정에서 부가적으로 수반되는 실리콘 산화막이 불완전하게 형성된 것으로 해석 할 수 있다.

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유리액를 이용한 레이저 선택 접합 (Laser bonding using liquid glass)

  • 김주한;이제훈;김향태
    • 한국레이저가공학회지
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    • 제11권3호
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    • pp.1-4
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    • 2008
  • A selective laser micro bonding process using liquid glass (methylsilsesquioxane) was developed and the results are analysed. The liquid glass can be solidified with Nd:YAG laser irradiation and it can be applied for joining two glass substrates. A bonding thickness of a few micrometers can be achieved. The appropriate laser power density (or this process is around 40-60 $kW/cm^2$ and its bonding force is 1000-1200 $gf/mm^2$. This process can be applied for bonding micro devices such as micro bio-sensors or display products. Its advantages and limitations are presented and discussed.

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