• Title/Summary/Keyword: focused-ion-beam (FIB)

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Measurement of Secondary Electron Emission Coefficient and Bimolecular Valence Band Energy Structure of Erythrocyte with and Without Bioplasma Treatment

  • Lee, Jin-Young;Baik, Guyon;Choi, Eun-Ha
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.483-483
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    • 2012
  • Recently, nonthermal bioplasma has been attracted by researchers due to their potentials to modulate cellular functions resulting in changes of biomolecular electron band structures as well as cell morphologies. We have investigated the secondary electron emission characteristics from the surface of the erythrocyte, i.e., red blood cell (RBC) with and without the nonthermal bioplasma treatment in morphological and biomolecular aspects. The morphologies have been controlled by osmotic pressure and biomolecular structures were changed by well known reactive oxygen species. Ion-induced secondary electron emission coefficient have been measured by using gamma-focused ion beam (${\gamma}$-FIB) system, based on the quantum mechanical Auger neutralization theory. Our result suggests that the nonthermal bioplasma treatment on biological cells could result in change of the secondary electron emission coefficient characterizing the biomolecular valence band electron energy structures caused by the cell morphologies as well as its surface charge distributions.

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Three-dimensional reconstruction of polycrystals using a series of EBSD maps obtained from Dual-beam experiments

  • Kim, MinJi;Son, Youngkyun;Lee, Myeongjin;Jeon, Youngju;Lee, Sukbin
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.172-172
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    • 2016
  • Dual-beam experiments (Focused ion beam - Orientation mapping microstructure, FIB-OIM) is a widely used experimental tool because this experiments tool available alternates between automated serial sectioning and EBSD with the help of dual beams. We investigated the reconstruction procedure for analysis tool which three-dimensional internal microstructure using Ni superalloy(IN100) and ZrO2. As a results, we observed annealing twin boundary each layer in Ni superalloy(IN100) and fairly isotropic internal microstructure in ZrO2 using marching cubes algorithm. According to these results, this procedure is reconstructed well and we gained ability to arrange the EBSD map and internal microstructure.

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Development of Simulator for the Design of Optimal FIB Lens Structure (최적 FIB렌즈구조 설계를 위한 Simulator 개발)

  • 송현욱;박화식;황호정;박선우;김철주;조광섭;김태환;서윤호;강승언
    • Journal of the Korean Vacuum Society
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    • v.1 no.2
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    • pp.269-276
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    • 1992
  • 경계 요소법을 이용하여 Finely-focused ion beam 시스템을 위한 전계형 시뮬레 이터를 개발하였다. 경계 요소법을 시뮬레이터에 적용함으로써 기존의 유한 요소법, 차분근 사법에서는 피할 수 없었던 내부격자망 구성이 불필요하게 됨에 따라 계산속도를 현저히 줄 일 뿐만 아니라 불규칙 경계에 대한 요소분할이 가능하게 되어 최적렌즈구조 설계의 새로운 요소인 전극구조의 모양을 자유롭게 시뮬레이션 할 수 있게 되었다. 또한 개발된 시뮬레이 터를 이용하여 최적조건을 만족하는 구조를 제안한다. 이때 렌즈설계조건은 beam half-angle 3.0 mrad, working distance 50mm, 빔에너지 퍼짐 (beam energy spread) 10eV, 가속에너지 35keV이다.

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-The Optical- and Ion-Induced Characteristics of a-$Se_{75}Ge_{25}$ Thin Film for Focused Ion Beam (FIB)- (집속이온빔 (FIB) 레지스트를 위한 비정질 $Se_{75}Ge_{25}$ 박막의 이온 및 광유기특성)

  • Lee, Hyun-Yong;Park, Tae-Sung;Kim, Jong-Bin;Lee, Young-Jong;Chung, Hong-Bay;Cho, Guang-Sup;Kang, Seung-Oun;Hwang, Ho-Jung;Park, Sun-Woo
    • Proceedings of the KIEE Conference
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    • 1992.07b
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    • pp.843-846
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    • 1992
  • This thesis was investigated on optical-and ion-induced characteristics in positive(a-$Se_{75}Ge_{25}$) and negative (Ag/a-$Se_{75}Ge_{25}$) resists for focused-ion-beam microlithogaphy. The a-$Se_{75}Ge_{25}$ inorganic thin film shows an increase in optical absorption after exposure to$\sim$$10^{16}$ dose(ions/$cm^{2}$) of Ga ions. The observed shift in the absorption edge toward longer wavelengths is consistent with that in films exposed to band-gap photons ($\sim$$10^{20}$ photons/$cm^{2}$). But, ion induced shift is twice as much as that in film exposed to optical radiation. This result may be related with microstructural rearrangements with in the short range of SeGe network. Due to changes in the short range order, the chemical bonding may be affected, which results in increased chemical dissolution in ion-induced film. Also, this resist exhibits good thermal stability because of its high Tg(~220$^{\circ}C$). The composition of deposited film measured by AES is consistent with that of bulk.

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