• Proceedings of the KWS Conference
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• 2003.05a
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• pp.52-54
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• 2003

• ETRI Journal
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• v.36 no.5
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• pp.876-879
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• 2014

In current NAND flash design, one of the most challenging issues is reducing peak current consumption (peak ICC), as it leads to peak power drop, which can cause malfunctions in NAND flash memory. This paper presents an efficient approach for reducing the peak ICC of the cache program in NAND flash memory - namely, a program Cache Busy Time (tPCBSY) control method. The proposed tPCBSY control method is based on the interesting observation that the array program current (ICC2) is mainly decided by the bit-line bias condition. In the proposed approach, when peak ICC2 becomes larger than a threshold value, which is determined by a cache loop number, cache data cannot be loaded to the cache buffer (CB). On the other hand, when peak ICC2 is smaller than the threshold level, cache data can be loaded to the CB. As a result, the peak ICC of the cache program is reduced by 32% at the least significant bit page and by 15% at the most significant bit page. In addition, the program throughput reaches 20 MB/s in multiplane cache program operation, without restrictions caused by a drop in peak power due to cache program operations in a solid-state drive.

• Journal of KIISE:Computing Practices and Letters
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• v.14 no.7
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• pp.636-645
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• 2008

OneNAND flash is a high-performance hybrid flash memory that combines the advantages of both NAND flash and NOR flash. OneNAND flash has not only all virtues of NAND flash but also greatly enhanced read performance which is considered as a downside of NAND flash. As a result, it is widely used in mobile applications such as mobile phones, digital cameras, PMP, and portable game players. However, most of the general purpose operating systems, such as Linux, can not exploit the read performance of OneNAND flash because of the restrictions imposed by their virtual memory system and block I/O architecture. In order to solve that problem, we suggest a new approach called virtual I/O segment. By using virtual I/O segment, the superior read performance of OneNAND flash can be exploited without modifying the existing block I/O architecture and MTD subsystem. Experiments by implementations show that this approach can reduce read latency of OneNAND flash as much as 54%.

• Journal of KIISE:Databases
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• v.37 no.6
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• pp.292-299
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• 2010

Recently, as flash memory is used as digital storage devices, necessity for digital forensics is growing in a flash memory area for digital evidence analysis. For this purpose, it is important to recover crashed files stored on flash memory efficiently. However, it is inefficient to apply the hard disk based file recovery techniques to flash memory, since hard disk and flash memory have different characteristics, especially flash memory being unable to in-place update. In this paper, we propose a flash-aware file recovery technique for digital forensics. First, we propose an efficient search technique to find all crashed files. This uses meta-data maintained by FTL(Flash Translation Layer) which is responsible for write operation in flash memory. Second, we advise an efficient recovery technique to recover a crashed file which uses data location information of the mapping table in FTL. Through diverse experiments, we show that our file recovery technique outperforms the hard disk based technique.

• Journal of KIISE:Computer Systems and Theory
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• v.32 no.11_12
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• pp.587-597
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• 2005

Flash memory based embedded computing systems are becoming increasingly prevalent.These systems typically have to provide an instant start-up time. However, we observe that mounting a file system toy flash memory takes 1 to 25 seconds mainly depending on the flash capacity. Since the flash chip capacity is doubled in every year, this mounting time will soon become the most dominant reason of the delay of system start-up time Therefore, in this paper, we present instant mounting techniques for flash file systems by storing the In-memory file system metadata to flash memory when unmounting the file system and reloading the stored metadata quickly when mounting the file system. These metadata snapshot techniques are specifically developed for NOR- and NAND-type flash memories, while at the same time, overcoming their physical constraints. The proposed techniques check the validity of the stored snapshot and use the proposed fast trash recovery techniques when the snapshot is Invalid. Based on the experimental results, the proposed techniques can reduce the flash mounting time by about two orders of magnitude over the existing de facto standard flash file system, JFFS2.

• Journal of KIISE
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• v.44 no.11
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• pp.1130-1137
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• 2017

The multi-leveling technique that stores multiple bits in a single memory cell has significantly improved the density of NAND flash memory along with shrinking processes. However, because of the side effects of the multi-leveling technique, the average write performance of MLC NAND flash memory is degraded more than twice that of SLC NAND flash memory. In this paper, we introduce existing cross-layer optimization techniques proposed to improve the performance of MLC NAND flash-based storages, and propose a new integration technique that overcomes the limitations of existing techniques by exploiting their complementarity. By fully exploiting the performance asymmetry in MLC NAND flash devices at the flash translation layer, the proposed technique can handle many write requests with the performance of SLC NAND flash devices, thus significantly improving the performance of NAND flash-based storages. Experimental results show that the proposed technique improves performance 39% on average over individual techniques.

• Journal of KIISE:Computer Systems and Theory
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• v.32 no.4
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• pp.177-185
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• 2005

NAND-type flash memory is becoming increasingly popular as a large data storage for mobile computing devices. Since flash memory is an order of magnitude more expensive than magnetic disks, data compression can be effectively used in managing flash memory based storage systems. However, compressed data management in NAND-type flash memory is challenging because it supports only page-based I/Os. For example, when the size of compressed data is smaller than the page size. internal fragmentation occurs and this degrades the effectiveness of compression seriously. In this paper, we present an efficient flash compression layer (FCL) for NAND-type flash memory which stores several small compressed pages into one physical page by using a write buffer Based on prototype implementation and simulation studies, we show that the proposed scheme offers the storage of flash memory more than $140\%$ of its original size and expands the write bandwidth significantly.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.12 no.3
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• pp.312-320
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• 2019

In this paper, we design a 512Kb eFlash IP using 110nm eFlash cells. We proposed eFlash core circuit such as row driver circuit (CG/SL driver circuit), write BL driver circuit (write BL switch circuit and PBL switch select circuit), read BL switch circuit, and read BL S/A circuit which satisfy eFlash cell program, erase and read operation. In addition, instead of using a cross-coupled NMOS transistor as a conventional unit charge pump circuit, we propose a circuit boosting the gate of the 12V NMOS precharging transistor whose body is GND, so that the precharging node of the VPP unit charge pump is normally precharged to the voltage of VIN and thus the pumping current is increased in the VPP (boosted voltage) voltage generator circuit supplying the VPP voltage of 9.5V in the program mode and that of 11.5V in the erase mode. A 12V native NMOS pumping capacitor with a bigger pumping current and a smaller layout area than a PMOS pumping capacitor was used as the pumping capacitor. On the other hand, the layout area of the 512Kb eFlash memory IP designed based on the 110nm eFlash process is $933.22{\mu}m{\times}925{\mu}m(=0.8632mm^2)$.

• Journal of Information Technology Applications and Management
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• v.11 no.2
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• pp.29-43
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• 2004

As the development of an information technique, gradually, mobile device is going to be miniaturized and operates at high speed. By such the requirements, the devices using a flash memory as a storage media are increasing. The flash memory consumes low power, is a small size, and has a fast access time like the main memory. But the flash memory must erase for recording and the erase cycle is limited. JFFS is a representative filesystem which reflects the characteristics of the flash memory. JFFS to be consisted of LSF structure, writes new data to the flash memory in sequential, which is not related to a file size. Mounting a filesystem or an error recovery is achieved through the sequential approach. Therefore, the mounting delay time is happened according to the file system size. This paper proposes a MJFFS to use a multi-checkpoint information to manage a mass flash file system efficiently. A MJFFS, which improves JFFS, divides a flash memory into the block for suitable to the block device, and stores file information of a checkpoint structure at fixed interval. Therefore mounting and error recovery processing reduce efficiently a number of filesystem access by collecting a smaller checkpoint information than capacity of actual files. A MJFFS will be suitable to a mobile device owing to accomplish fast mounting and error recovery using advantage of log foundation filesystem and overcoming defect of JFFS.

• Journal of the Korean Society of Safety
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• v.31 no.5
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• pp.42-48
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• 2016

The usage of the correct combustion properties of the treated substance for the safety of the process is critical. For the safe handling of n-nonane being used in various ways in the chemical industry, the flash point and the autoignition temperature(AIT) of n-nonane was experimented. And, the explosion limit of n-nonane was calculated by using the flash point obtained in the experiment. The flash points of n-nonane by using the Setaflash and Pensky-Martens closed-cup testers measured $31^{\circ}C$ and $34^{\circ}C$, respectively. The flash points of n-nonane by using the Tag and Cleveland open cup testers are measured $37^{\circ}C$ and $42^{\circ}C$. The AIT of n-nonane by ASTM 659E tester was measured as $210^{\circ}C$. The lower explosion limit by the measured flash point $31^{\circ}C$ was calculated as 0.87 vol%. And the upper explosion limit by the measured upper flash point $53^{\circ}C$ was calculated as 2.78 vol%. It was possible to predict lower explosion limit by using the experimental flash point or flash point in the literature.