• Journal of Applied Reliability
• /
• v.16 no.4
• /
• pp.263-271
• /
• 2016

Purpose: A slurry pump for flue gas desulfurization system performs a role that discharges the slurry of a plaster shape in a thermal power plant. Since a slurry pump transfers the slurry by the centrifugal force, it has the friction wear in the impeller and liner because of the slurry. Methods: In this study, failure analysis and test evaluation on the slurry pump have been proposed and the process that reliability of the product improves through design improvement has been presented. And failure cause of typical failure case has been investigated and improvement design has been presented. Results: Reliability improvement is established by analysis of the test results of before and after acceleration test. Conclusion: This study can be provided to improve the product reliability through failure analysis of a slurry pump.

• The Transactions of The Korean Institute of Electrical Engineers
• /
• v.60 no.4
• /
• pp.766-770
• /
• 2011

In this paper, we describe the failure analysis and representation test method that applied high frequency transformer for SMPS through analysing insulation resistance, frequency characteristic, CT analysis, Q-factor atc. And we study the judgement method that a high frequency transformer affects to other beside parts in different condition or environment. According to this method, we devise a plan for the field failure prevent and propose the securing product reliability of high frequency transformer.

• Journal of the Korean Society for Precision Engineering
• /
• v.26 no.9
• /
• pp.96-102
• /
• 2009

In this study, performs analysis of the life of parallel opening type pneumatic chucks that are usually applied in the factory automation line. Pneumatic chucks have complicated failure cause because they are organized as a complex of various elements. Therefore, we analyzed the main failure mode of pneumatic chuck, and then performed life test and performance test according to the international standards. On the basis of these processes, shape parameter of pneumatic chuk is proposed that is the main factor for the calculation of zero failure test time for the reliability of pneumatic chuck and their data analysis of life distribution.

• Transactions of the Korean Society of Mechanical Engineers A
• /
• v.29 no.5 s.236
• /
• pp.689-697
• /
• 2005

This paper presents the reliability estimation of door hinge for home appliances, which consists of bushing and shaft. The predominant failure mechanism of bushing made of polyoxymethylene(POM) is brittle fracture due to decrease of strength caused by voids existing, and that of shaft made of acrylonitrile-butadiene-styrene(ABS) is creep due to plastic deformation caused by excessive temperature and lowering of glass transition temperature by absorbed moisture. Since the brittle fracture of bushing is overstress failure mechanism, the load-strength interference model is used to estimate the failure rate of it along with failure analysis. By the way, the creep of shaft is wearout failure mechanism, and an accelerated life test is then planned and implemented to estimate its lifetime. Through the technical review about failure mechanism, temperature and humidity are selected as accelerating variables. Assuming Weibull lifetime distribution and Eyring model, the life-stress relationship and acceleration factor, $B_{10}$ life and its lower bound with $90\%$ confidence at worst case use condition are estimated by analyzing the accelerated life test data.

• Proceedings of the Korean Reliability Society Conference
• /
• 2004.07a
• /
• pp.303-311
• /
• 2004

This paper presents the reliability estimation of door hinge for home appliances, which consists of bushing and shaft. The predominant failure mechanism of bushing made of polyoxymethylene(POM) is brittle fracture due to decrease of strength caused by voids existing, and that of shaft made of acrylonitrile-butadiene-styrene(ABS) is creep due to plastic deformation caused by excessive temperature and lowering of glass transition temperature by absorbed moisture. Since the brittle fracture of bushing is overstress failure mechanism, the load-strength interference model is used to estimate the failure rate of it along with failure analysis. By the way, the creep of shaft is wearout failure mechanism, and an accelerated life test is then planned and implemented to estimate its lifetime. Through the technical review about failure mechanism, temperature and humidity are selected as accelerating variables. Assuming Weibull lifetime distribution and Eyring model, the life-stress relationship and acceleration factor, B$_{10}$ life and its lower bound with 90% confidence at worst case use condition are estimated by analyzing the accelerated life test data.a.

• Proceedings of the Korean Society of Agricultural Engineers Conference
• /
• 1998.10a
• /
• pp.382-387
• /
• 1998

Triaxial compression tests were run to study on the undrained strength characteristics of fiber mixed kaolin clay(Hadong). The influence of various test parameters such as amount and aspect ratio(ratio of length to diameter) of fiber, confining stress was also investigated. Test results showed that the increase in aspect ratio was increased in deviator stress at failure, but no effect on pore water pressure at failure. Deviator stress at failure was also increased at 0.5％ mixing ratio(weight fraction of fiber to that of soil solid) of fiber but it was, thereafter, decreased and wits reached to constant after 2％ mixing ratio. On the contrary, Pore water pressure at failure was increased as mixing ratio of fiber was greater than 1%. Deviator stress and pore water pressure of both clay and fiber mixed clay(FMC) at failure were increased as confining stress was increased. Deviator stress of FMC at failure was about 10％ larger than that of clay, but pore water pressure of FMC at failure was almost similar to that of clay.

• Journal of Applied Reliability
• /
• v.5 no.2
• /
• pp.221-239
• /
• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

• Tunnel and Underground Space
• /
• v.15 no.6 s.59
• /
• pp.400-410
• /
• 2005

During excavation of shallow tunnels in soft ground, failure mechanism around the tunnel face have major influence on the stability of tunnels. In this paper, a series of laboratory tests under plane strain condition on the small scale of a shallow tunnel considering unsupported tunnel length has been performed. The results have shown that tunnel failure mechanism changes from failure mode 1 to failure mode 2 as unsupported tunnel length increases. By comparing the experimental and the numerical results, the loosening pressure for the shallow tunnel and progressive failure have been investigated.

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
• /
• 2003.11a
• /
• pp.388-394
• /
• 2003

This paper deals with a premature failure mechanism of deep grooved ball bearing for automobiles. A close examination of used bearings revealed that the premature failure could be arose by dents on the ball. Universal testing machine with specially designed tools is used to simulate the practical dents on the ball and test bearings are assembled with dented balls and new hearing components. The endurance test results showed that the dents on the balls were printed on the races and these phenomena come to premature failure.

• Proceedings of the Korean Reliability Society Conference
• /
• 2005.06a
• /
• pp.51-67
• /
• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.