• Journal of the Korea Society of Computer and Information
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• v.16 no.12
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• pp.1-10
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• 2011

As requirements of embedded system get complicated, the tool for analyzing the reliability of embedded software is being needed. A probabilistic modeling is used as the way of analyzing the reliability of a software and to apply it to embedded software controlling multiple devices. So, it is necessary to specialize that to embedded software. Also, existing reliability analyzers should measure the transition probability of each condition in different ways and doesn't consider reusing the model once used. In this paper, we suggest a reliability analyzer for embedded software using embedded software Markov chin model and a unit testing tool. Embedded software Markov chain model is model specializing Markov chain model which is used for analyzing reliability to an embedded software. And a unit testing tool has host-target structure which is appropriate to development environment of embedded software. This tool can analyze the reliability more easily than existing tool by automatically measuring the transition probability between units for analyzing reliability from the result of unit testing. It can also directly apply the test result updated by unit testing tool by representing software model as a XML oriented document and has the advantage that many developers can access easily using the web oriented interface and SVN store. In this paper, we show reliability analyzing of a example by so doing show usefulness of reliability analyzer.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.8 no.6
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• pp.2139-2151
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• 2014

Embedded system testing, especially long-term reliability testing, of flash memory solutions such as embedded multi-media card, secure digital card and solid-state drive involves strategic decision making related to test sample size to achieve high test coverage. The test sample size is the number of flash memory devices used in a test. Earlier, there were physical limitations on the testing period and the number of test devices that could be used. Hence, decisions regarding the sample size depended on the experience of human testers owing to the absence of well-defined standards. Moreover, a lack of understanding of the importance of the sample size resulted in field defects due to unexpected user scenarios. In worst cases, users finally detected these defects after several years. In this paper, we propose that a large number of potential field defects can be detected if an adequately large test sample size is used to target weak features during long-term reliability testing of flash memory solutions. In general, a larger test sample size yields better results. However, owing to the limited availability of physical resources, there is a limit on the test sample size that can be used. In this paper, we address this problem by proposing a self-adaptive reliability testing scheme to decide the sample size for effective long-term reliability testing.

• IEMEK Journal of Embedded Systems and Applications
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• v.4 no.4
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• pp.156-163
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• 2009

Recently a standard software platform for automotive, AUTOSAR, has been developed to manage growing software complexity and improve software reuseability. However reuse of testing system and test data are difficult because they are dependant on implementation language and testing phases. In this paper, we suggest a automated testing approach for AUTOSAR software component using a standardized testing language, TTCN-3. AUTOSAR defines the AUTOSAR XML Schema for the data exchange format so that it is possible to automatically convert AUTOSAR model into TTCN-3 testing model. Therefore our approach is to present generation techniques for the TTCN-3 testing system from a AUTOSAR XML description. With the proposed testing techniques we can reduce time and effort to build the testing system and reuse testing environment.

• KIPS Transactions on Software and Data Engineering
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• v.4 no.9
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• pp.419-424
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• 2015

As Internet of Things (IoT) is recently serviced in several fields, the reliability and safety issues for IoT embedded systems are emerged. During the development of embedded systems, it is not easy to build the virtual execution environment and to test the developing version. Therefore, it is difficult to ensure its reliability due to lack of unit testing. In this paper, we propose a log-based unit testing framework for embedded software, which performs on real target board by extracting information of function execution. And, according to execution paths, duplicated logs are eliminated to keep a minimal log size. As a result, during system testing, testers can efficiently decide whether the executed paths of each function are correctly performed or not.

• IEMEK Journal of Embedded Systems and Applications
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• v.3 no.1
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• pp.19-24
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• 2008

To reduce time-to-market, more and more embedded system developers and system-on-chip designers rely on microprocessor-based design methodology. ARM processor has been a major player in this industry over the last 10 years. However, there are many restrictions on developing embedded software using ARM processor in the early design stage. For those who are not familiar with embedded software development environment or who cannot afford to have an expensive embedded hardware equipment, testing their software on a real ARM hardware platform is a challenging job. To overcome such a problem, we have designed VMA (Virtual ARM Machine), which offers easier testing and debugging environment to ARM based embedded system developers. Major benefits that can be achieved by utilizing a virtual ARM platform are (1) reducing development cost, (2) lowering the entrance barrier for embedded system novices, and (3) making it easier to test and debug embedded software designs. Unlike many other purely software-oriented ARM simulators which are independent of real hardware platforms, VMA is specifically targeted on SYS-Lab 5000 ARM hardware platform, (designed by Libertron, Inc.), which means that VMA imitates behaviors of embedded software as if the software is running on the target embedded hardware as closely as possible. This paper will describe how VMA is designed and how VMA can be used to reduce design time and cost.

• IEMEK Journal of Embedded Systems and Applications
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• v.7 no.1
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• pp.17-24
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• 2012

Recently automotive software has been more complex and needs to be reduced its development time. Software testing of its functionalities and performance should be conducted in an early development phase to reduce time to market and the development cost. Software functional testing can be performed through simulating the hardware, but it is not guaranteed that evaluation of real-time performance using simulation has enough accuracy. Real-time performance can be precisely evaluated with hardware-in-the-loop simulation, but it costs time and effort to set up hardware for testing. In this paper, we suggest a testing system that can evaluate functional requirements and real time properties with a general-purpose development board in the early development phase. In addition, we improve reusability of the testing system through modularized and layered architecture. With the proposed testing system we can contribute to building reliable testing system at low cost without difficulty.

• Journal of information and communication convergence engineering
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• v.11 no.1
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• pp.56-61
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• 2013

Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.

• 한국IT서비스학회:학술대회논문집
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• 2006.11a
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• pp.190-193
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• 2006

Ther are many stages of the development for the embedded systems' hardware and software as well, which results in many test stages of it with respect to corresponding development stages. The software validation of embedded systems is taken into consideration for the testers to make sure that the systems work correctly after the deployment. Among test stages, especially control logic level testing and system validation testing are considered as the most important test, because the robustness of embedded systems' software can be validated by those two level of tests. in this paper, we would like to introduce the idea of how software test system for embedded systems can be established and of what necessary components are needed

• Journal of KIISE:Computing Practices and Letters
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• v.16 no.5
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• pp.576-580
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• 2010

Generally, due to the strong coherence between embedded software and hardware or peripheral software, embedded software is tested by using black-box test based on user scenario for the whole system. This paper suggests the method to coordinate between testing and debugging under consideration for difficulties on solving out the defects detected from black-box test. First of all, from test result analysis, it builds up the debugging strategies enable to trace the locations of the defect's causes. And along with the strategies, it implements the generator of test scripts to be performed on the emulator environment. Through these steps, it can coordinate embedded software testing and debugging activities.

• Journal of KIISE:Software and Applications
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• v.33 no.4
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• pp.388-401
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• 2006

A tool for analyzing and testing software in real-time is required for the efficient development of highly reliable real-time mobile embedded software This too] requires various technologies, such as source code based white-box test and real-time system monitoring and control. The tool also should be designed to improve reusability and portability by considering the interaction with other kinds of real-time system. This paper identifies and analyzes the functional requirements for the test tool on real-time mobile embedded software and suggests an adequate tool architecture based on the collected requirements. It also suggests the specific implementation technology and architecture design pattern to support the tool's expandability and portability.