• Journal of Energy Engineering
• /
• v.9 no.1
• /
• pp.54-59
• /
• 2000

전자부품 및 시스템의 고속/고밀도화 추세에 따라 발열밀도가 계속증가하고 있다. 최근 팬티엄 II 급이상의 노트북 컴퓨터의 CPU에서는 칩당 발열량이 10W 이상으로 증가하고 있고 패키징 공간의 제한 때문에 소형히트파이프를 이용한 냉각이 많이 적용되고 있다. 본 연구에서는 모세압구동력이 크고 생산성등이 고려된 편조 형태의 새로운 윅을 개발하였으며 , 노트북 컴퓨터의 CPU 등 소형 전자부품냉ㄱ가에 적용가능한 직경 3, 4 mm 히트파이프를 설계 및 제작하였다. 직경 3, 4 mm Miniature Heat Pipe (이하 MHP) 의 작동특성은 일반적인 중형히트파이프와 다르므로 MHP 의 열전달 특성 및 작동성능에 미치는 각종 인자들의 영향을 파악하고자 성능시험을 수행하였다. 고려된 작동인자로는 작동유체 충전률, 전체 파이프길이 및 증발부, 응축부길이, 설치 경사각, 윅의 가닥수, 열부하 등이다. 작동인자의 영향과 관련된 연구결과는 향후 패키징을 위한 응용연구의 기초자료로 활용할 수 있을 것이다.

• Proceedings of the Korean Society For Composite Materials Conference
• /
• 2002.05a
• /
• pp.73-76
• /
• 2002

This study developed SiC/Al composites for electronic packaging to which reinforcements were added with the volume fractions of 49%, 56% and 63% by the squeeze casting method. 0.8 wt.% of the inorganic binder as well as the $Al_2O_3$ fiber and SiC particles with the volume fraction of 1:10 were added to the SiC/Al composites For the produced SiC/Al composites, the CTEs (coefficients of thermal expansion) were measured from 30 to $300^{\circ}C$ and compared with the FEM numerical simulation to analyze the temperature dependent properties. The experiment showed the CTEs of SiC/Al composites that were intermediate values of those of Rule of Mixture and Turner's Model. The CTEs were close to Turner's Model in the room temperature and approached the Rule of Mixture as the temperature increases. These properties analyzed from the difference of the average stress acting between the matrix and the reinforcements proposed in this study

• Journal of the Microelectronics and Packaging Society
• /
• v.21 no.2
• /
• pp.23-29
• /
• 2014

Less power consumption, lower cost, smaller size and more functionality are the increasing demands for consumer electronic devices. The three dimensional(3-D) TSV packaging technology is the potential solution to meet this requirement because it can supply short vertical interconnects and high input/output(I/O) counts. Cu(Copper) has usually been chosen to fill the TSV because of its high conductivity, low cost and good compatibility with the multilayer interconnects process. However, the CTE mismatch and Cu ion drift under thermal stress can raise reliability issues. This study discribe the thermal stress reliability trend for successful implementation of 3-D packaging.