• 펄프종이기술
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• 제48권1호
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• pp.5-18
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• 2016

Electron microscopy is an important investigation and analytical method for the morphological characterization of various cellulosic materials, such as micro-crystalline cellulose (MCC), microfibrillated cellulose (MFC), nanofibrillated cellulose (NFC), and cellulose nanocrystals (CNC). However, more accurate morphological analysis requires high-quality micrographs acquired from the proper use of an electron microscope and associated sample preparation methods. Understanding the interaction of electron and matter as well as the importance of sample preparation methods, including drying and staining methods, enables the production of high quality images with adequate information on the nanocellulosic materials. This paper provides a brief overview of the micro and nano structural analysis of cellulose, as investigated using transmission and scanning electron microscopy.

• 한국전기전자재료학회논문지
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• 제25권11호
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• pp.916-921
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• 2012

This research measured the dielectric properties of silicone rubber with various hardness in 100 Hz~3 MHz, $30{\sim}170^{\circ}C$ conditions. When the hardness increases from 65 degree to 75 degree, the dielectric loss increased within frequency range of 100 kHz~3 MHz and was a little change in dielectric loss within temperature range of $90^{\circ}C{\sim}170^{\circ}C$. Thermogravimetric Analysis (TGA) showed the weight change rate increased a little while heated until $800^{\circ}C$. Scanning Electron Microscope (SEM) measurement showed that Aluminium Trihydroxide($AlOH_3$) which acts as a reinforcement agent reduced the size of the particles as the hardness increased.

• Applied Microscopy
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• 제36권spc1호
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• pp.63-69
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• 2006

By utilizing a field emission gun and a biprism installed on a transmission electron microscope (TEM), electron holography is extensively carried out to visualize the electric and magnetic fields of nanomaterials. In the electric field analysis, the distribution of electric potential in a sharp tip made of W coated with $ZrO_2$ is visualized by applying the voltage to the tip. Denser contour lines due to the electric potential are observed with an increase in the bias voltage. In the magnetic field analysis by producing the strong magnetic field with a sharp magnetic needle made of a permanent magnet, the in situ experiment is carried out to investigate the magnetization of hard magnetic materials. The results of these experiments clearly demonstrate that electron holography is a promising advanced transmission electron microscopy technique to characterize the electric and magnetic properties of nanomaterials.

• 한국원자력학회:학술대회논문집
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• 한국원자력학회 2001년도 춘계학술발표회요약집
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• pp.301.1-301
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• 2001

• Applied Microscopy
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• 제36권3호
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• pp.209-216
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• 2006

투과전자현미경을 이용한 3차원적 구조분석의 신뢰도를 향상시키기 위해서는 고니오미터와 사용되는 시료 홀더에 대한 정확도와 정밀도의 측정 및 보정이 필요하다. 본 연구에서는 상업용 투과전자현미경 홀더 중의 하나인 rotation holder에 대한 작동원리를 기술하고 회전각의 정확도를 측정하였다. 투과전자현미경 내부에서 회전된 이미지의 분석을 통한 홀더의 회전각의 측정오차는 ${\pm}0.42^{\circ}$이었다. 회전각의 정확도를 비교하기 위해 투과전자 현미경 외부에서 시료 홀더에 부착된 반사경에 레이저 빔을 반사시켜 측정한 결과, 회전각의 측정오차는 ${\pm}0.6^{\circ}$이었다. 추가적으로 시료컵과 회전벨트 사이의 불안정한 맞물림에 의해 야기된 비정상적인 시료의 회전경로에 대해서도 점검하였다.

• Applied Microscopy
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• 제45권3호
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• pp.131-134
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• 2015

Here we show how by processing energy dispersive X-ray spectrometry (EDS) data obtained using highly sensitive, new generation EDS detectors in the AZtec LayerProbe software we can obtain data of sufficiently high quality to non-destructively measure the number of layers in two-dimensional (2D) $MoS_2$ and $MoS_2/WSe_2$ and thereby enable the characterization of working devices based on 2D materials. We compare the thickness measurements with EDS to results from atomic force microscopy measurements. We also show how we can use electron backscatter diffraction (EBSD) to address fabrication challenges of 2D materials. Results from EBSD analysis of individual flakes of exfoliated $MoS_2$ obtained using the Nordlys Nano detector are shown to aid a better understanding of the exfoliation process which is still widely used to produce 2D materials for research purposes.

• Applied Microscopy
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• 제39권1호
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• pp.41-48
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• 2009

본 연구는 색조화장품에 사용되는 진주광택안료의 특성을 주사전자현미경과 에너지분산분광분석기 및 열분석기를 사용하여 규명하였다. 본 연구에 사용된 인공합성 진주광택안료를 여성의 볼과 눈두덩 부위에 화장을 한 후 육안으로 관찰하였을 때 진주 광택안료는 보는 각도에 따라 흰색에서 보라색까지 다양한 색조로 빛을 반사하였다. 진주광택안료의 주사전자현미경 관찰 결과 안료는 얇은 판상의 다각형의 형태를 하고 있었으며 크기는 규격화된 모양이 아니고 다양하게 관찰되었다. 이런 조각의 크기는 약 $30{\mu}m$에서 $300{\mu}m$까지 측정되었고 안료 조각은 끝이 뾰족하거나 각진 상태로 존재하였다. 고배율의 주사전자현미경상에서 안료조각의 모서리 부위와 측면은 날카롭지 않은 타원형의 형태로 나타났으며 두께는 약 $9{\mu}m$로 측정되었다. 안료조각 표면은 직경이 약 60 nm의 이산화티탄 입자들에 의해서 피복되어 있었다. 진주광택안료의 에너지분산분석기를 사용하여 구성 원소 성분을 분석한 결과 안료의 표면은 O, Si, C, Na, Ca, Ti, Zn 등이 검출되었고 안료의 측면 부위도 동일한 성분들이 검출되었다. 이들 안료는 운모 티타니아(mica titania)로 확인되었다. 진주광택안료의 열분석 결과 초기 $100^{\circ}C$부터 $800^{\circ}C$까지 중량 감소는 큰 차이를 보이지 않았다. 열분석 결과 $115^{\circ}C$에서 1.1% 중량 감소를 하였고 $416^{\circ}C$에서 1.7% 감소하였으며 $797^{\circ}C$ 에서 1.9%의 중량이 감소된 것을 확인하였다.

• Applied Microscopy
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• 제44권4호
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• pp.138-143
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• 2014

Transmission electron microscope (TEM) is an excellent tool for studying the structure and properties of nanostructured materials. As the development of $C_s$-corrected TEM, the direct analysis of atomic structures of nanostructured materials can be performed in the high-resolution transmission electron microscopy (HRTEM). Especially, fast Fourier transform (FFT) technique in image processing is very useful way to determine the crystal structure of HRTEM images in reciprocal space. To apply FFT technique in HRTEM analysis in more reasonable and friendly manner, we made a new circular region of interest (C-ROI) FFT script and tested it for several HRTEM analysis. Consequentially, it was proved that the new FFT application shows more quantitative and clearer results than conventional FFT script by removing the streaky artifacts in FFT pattern images. Finally, it is expected that the new FFT script gives great advantages for quantitative interpretation of HRTEM images of many nanostructured materials.

• Bulletin of the Korean Chemical Society
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• 제33권9호
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• pp.2966-2970
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• 2012

Fullerene/polystyrene ($C_{60}$/PS) nano particle was prepared by using emulsion polymerization. Styrene and fullerene were emulsified in aqueous media in the presence of poly(N-vinyl pyridine) as an emulsion stabilizer, and polymerization was initiated by water soluble radical initiator, potassium persulfate. The obtained nano particles have an average diameter in the range of 400-500 nm. The fullerene contents in the nano particle can be controlled up to 15 wt % by varying the feed ratio, which was confirmed by themogravimetric analysis (TGA) and elemental analysis (EA). The structure and morphologies of the $C_{60}$/PS nano particles were examined by various analytical techniques such as dynamic light scattering (DLS), scanning electron microscope (SEM), transmission electron microscope (TEM), electron diffraction (ED) pattern, X-ray powder diffraction (XRD), and UV spectroscopy. Unlike conventional $C_{60}$/PS particles initiated by organic free radical initiators, in which the fullerene is copolymerized forming a covalent bond with styrene monomer, the prepared $C_{60}$/PS nano particles contain pristine fullerene as secondary particles homogeneously distributed in the polystyrene matrix.

• Bulletin of the Korean Chemical Society
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• 제30권1호
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• pp.183-187
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• 2009

The structure of nano-crystalline $MnFe_2O_4$ was determined and refined with electron powder diffraction data employing the Rietveld refinement technique. A nano-crystalline sample (with average crystal size of about 10.9 nm) was characterized by selected area electron diffraction in an energy-filtering transmission electron microscope operated at 120 kV. All reflection intensities were extracted from a digitized image plate using the program ELD and then used in the course of structure refinements employing the program FULLPROF for the Rietveld analysis. The final structure was refined in space group Fd-3m (# 227) with lattice parameters a=8.3413(7) $\AA$. The reliability factors of the refinement are $R_F$=7.98% and $R_B$=3.55%. Comparison of crystallographic data between electron powder diffraction data and reference data resulted in better agreement with ICSD-56121 rather than with ICSD-28517 which assumes an initial structure model.