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Yang, Soo-Hyo;Oh, Dong-Geun;Jeong, Joong-Yeon
- Proceedings of the Korean Society of Surveying, Geodesy, Photogrammetry, and Cartography Conference
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- 2009.04a
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- pp.65-73
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- 2009
The terrestrial laser scanner measures the signal delay time of electronic circuit in EDM(Electronic Distance Measurement) Module for distance measurement. To measure signal delay time precisely, transmitting laser beam of terrestrial laser scanner is divided optically. Therefore, 10% of the laser beam power is entered into the electronic circuit and the others go out through lens. But, measure of delay time is severe in the laser scanner system that the laser beam power is changed dynamically by reflectance of a object, because characters like gain of electronic circuit involving APD(Avalanche Photo Diode) and so on are changed by incident laser beam. Therefore, we adapt ND(Neutral Density) filter that has grid pattern to the laser scanner system to keep constant the incident laser beam power. In this paper, we propose the simulation program for efficient design of ND filter pattern. Finally, to affirm simulation program, we conduct the experimental test of simulated ND filter that has linearly transmittance change, and we consider the experiment result.
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Yoo, Hyun-Kuk;Jeong, Jung-Yeon;Oh, Dong-Geun;Kim, Jae-Soon
- Proceedings of the Korean Society of Surveying, Geodesy, Photogrammetry, and Cartography Conference
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- 2009.04a
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- pp.41-48
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- 2009
Laser diode is used as a crucial part for minimization of terrestrial 3D Laser Scanner. But it has certain limitations such as oval beam shape and inevitable astigmatism. In order to realize a parallel light with beam divergence below 1 mrad, These problems of laser diode can be solved through beam shaping by Pinhole and Aperture. Finally, this study could materialize a collimated beam with 0.3 mrad beam divergence angle and 3mm diameter, that performance and checked by using real manufacture.
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김홍석;정진만;이현용;정홍배
- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 1997.11a
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- pp.30-33
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- 1997
In this paper, we studied the variation in optical constants of Te-doped G $e_{15}$ /$Sb_{85}$ thin films with 7800$\AA$ diode-laser exposing time and power. The reflectances were increased with the increase of laser exposure time and the laser power in all films. Also, the refractive indices of the films after exposing were higher than those of the as-deposited films. Thus, the fast crystallization was caused by addition to the more Te content at the lower lacer power. It was observed that the surface morphologies of the exposed films are higher than those of the as-deposited films by SEM analysis. Therefore, it is considered that the T $e_{0.5}$(G $e_{15}$ /$Sb_{85}$)$_{99.5}$ thin films will show the high contrast ratio and high SNR and have fast erasing time due to crystallization when these films is applied to optical recording materials.terials.s.
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