• Title/Summary/Keyword: deposition power

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The development of power supply for dry scrubber (건식 세정기용 전원장치 개발)

  • 김수석;원충연;최대규;최상돈
    • The Transactions of the Korean Institute of Power Electronics
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    • v.6 no.5
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    • pp.394-399
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    • 2001
  • In this Paper, the development of the power supply for dry scrubber is discussed. 1500w, 100kHz power supply Is designed and tested. The main power stage is used for the FB PWM inverter with an LC filter in the secondary circuit. The operation characteristics of power supply are verified by simulation and experimental results.

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The H2 and H2S sensing characteristics of Pd and Pd-Rh gate MOS sensor (Pd 및 Pd-Rh 게이트 MOS센서의 수소 및 황화수소가스에 대한 검지특성)

  • Lee, Chang-Hee;Park, Chong-Ook
    • Transactions of the Korean hydrogen and new energy society
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    • v.8 no.4
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    • pp.145-154
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    • 1997
  • The $H_2$ and $H_2S$ sensing characteristics of Pd and Pd-Rh gate MOS sensor and the effect of Pd deposition condition on the hydrogen sensing performance of Pd gate MOS sensor was investigated. The increase of rf power and deposition temperature led to the decrease in the sensitivity and the initial response rate. The deposition temperature gave more effects on the decrease of the sensitivity and the initial response rate than the rf power. The sensitivity of Pd-Rh sensor gave better performance than pure Pd sensor. As the concentration of Rh in the gate increased, the sensitivity decreased. For Pd-Rh sensor, the sensitivity to $H_2$ was higher than that to $H_2S$. It was demonstrated that rf power, deposition temperature had an important role in the sensor performance.

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Effects of Sputter Deposition Rate on the Thin Film Property (Sputtering 성막속도가 박막의 특성에 미치는 영향)

  • Lee, Ky-Am
    • Journal of the Korean Vacuum Society
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    • v.2 no.2
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    • pp.152-160
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    • 1993
  • In this study, we have investigated the influence of sputtering conditions (Ar pressure input powers, substrates) on coercivity and microstructures of GdFe, Co, CoCr thin films produced by the method of DC magnetron sputtering. In GdFe films, we have observed that the Gd atomic ratio was decreased with the deposition rate, and deposition rate decreased with the pressure of Ar gas and the increased linearly with input power. It was also observed that the coercivity of thin films was increased with input power. In Co films, we have investigated the deposition was increased and the Co thin film became finer structure with the increase in the input power, was increased and the Co thin film became finer structure with the increase in the input power, and the deposition rate was decreased with the pressure of Ar gas. In CoCr films, we have investigated the effects of substrates on the coercivity $(H_c)$ and the microstructure. We have found that the substrates plays a crucial role in the microstructure and the coercivity $(H_c)$.

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Computer Simulation of Temperature Parameter for Diamond Formation by using Hot- Filament Chemical Vapor Deposition (온도 매개 변수의 컴퓨터 시뮬레이션을 통한 HF-CVD를 이용한 다이아몬드 증착 거동 분석)

  • Song, Chang-Won;Lee, Yong-Hui;Choe, Su-Seok;Hwang, Nong-Mun;Kim, Gwang-Ho
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2018.06a
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    • pp.54-54
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    • 2018
  • To optimize the deposition parameters of diamond films, the temperature, pressure, and distance between the filament and the susceptor need to be considered. However, it is difficult to precisely measure and predict the filament and susceptor temperature in relation to the applied power in the hot filament chemical vapor deposition (HFCVD) system. In this study the temperature distribution inside the system was numerically calculated for the applied powers of 12, 14, 16 and 18 kW. The applied power needed to achieve the appropriate temperature at a constant pressure and other conditions was deduced, and applied to actual experimental depositions. The numerical simulation was conducted using the commercial computational fluent dynamics software, ANSYS-FLUENT. To account for radiative heat-transfer in the HFCVD reactor, the discrete ordinate (DO) model was used. The temperatures of the filament surface and the susceptor at different power levels were predicted to be 2512 ~ 2802 K, and 1076 ~ 1198 K, respectively. Based on the numerical calculations, experiments were performed. The simulated temperatures for the filament surface were in good agreement with experimental temperatures measured using a 2-color pyrometer. The results showed that the highest deposition rate and the lowest deposition of non-diamond was obtained at a power of 16 kW.

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Deposition of 3C-SiC Films by Plasma-enhanced Chemical Vapor Deposition (I): Deposition Behaviors of SiC with Deposition Parameters (PECVD법에 의한 3C-SiC막 증착(I): 증착변수에 따른 SiC 증착거동)

  • 김광호;서지윤;윤석영
    • Journal of the Korean Ceramic Society
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    • v.38 no.6
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    • pp.531-536
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    • 2001
  • SiCl$_4$/CH$_4$/H$_2$계를 사용한 플라즈마 화학증착법(PECVD)으로 실리콘(100) 기판 위에 3C-SiC막을 117$0^{\circ}C$~1335$^{\circ}C$의 온도범위에서 증착하였다. 증착온도, 유입가스비, R$_{x}$ [=CH$_4$/(CH$_4$+H$_2$)], 그리고 r.f. power를 변화시켜 증착막의 결정성에 대해 검토하였다. Thermal CVD에 비해 PECVD법은 박막의 증착속도를 향상시켰다. 증착된 3C-SiC은 (111) 면으로 최대의 우선배향성을 지님을 알 수 있었다. 실리콘 기판 위의 3C-SiC막의 결정성은 R$_{x}$값에 의존하였으며, R$_{x}$가 감소할수록 결정성이 더욱 향상되었다. Free Si가 3C-SiC막과 함께 증착되었으나, 증착온도와 r.f power가 증가함에 따라 free Si의 함량은 감소하였다. 증착온도 127$0^{\circ}C$, 유입가스비 R$_{x}$=0.04, r.f. power가 60W에서 비교적 결정성을 가진 3C-SiC막을 얻을 수 있었다.

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A Comparison of the Properties of DC and RF Sputter - deposited Cr films (DC 및 RF 스퍼터링법으로 증착한 Cr 박막의 특성 비교)

  • Park, Min-Woo;Lee, Chong-Mu
    • Korean Journal of Materials Research
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    • v.16 no.8
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    • pp.461-465
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    • 2006
  • Chromium (Cr) films were deposited on plain carbon steel sheets by DC and RF magnetron sputtering as well as by electroplating. Effects of DC or RF sputtering power on the deposition rate and properties such as, hardness, surface roughness and corrosion-resistance of the Cr films were investigated. X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microcopy (SEM) analyses were performed to investigate the crystal structure, surface roughness, thickness of the Cr films. Salt fog tests were used to evaluate the corrosion resistance of the samples. The deposition rate, hardness, and surface roughness of the Cr film deposited by either DC or RF sputtering increase with the increase of sputtering power but the adhesion strength is nearly independent of the sputtering power. The deposition rate, hardness, and adhesion strength of the Cr film deposited by DC sputtering are higher than those of the Cr film deposited by RF sputtering, but RF sputtering offers smoother surface and higher corrosion-resistance. The sputter-deposited Cr film is harder and has a smoother surface than the electroplated one. The sputter-deposited Cr film also has higher corrosion-resistance than the electroplated one, which may be attributed to the smoother surface of the sputter-deposited film.

Culturing of Rat Intestinal Epithelial Cells-18 on Plasma Polymerized Ethylenediamine Films Deposited by Plasma Enhanced Chemical Vapor Deposition

  • Choi, Chang-Rok;Kim, Kyung-Seop;Kim, Hong-Ja;Park, Heon-Yong;Jung, Dong-Geun;Boo, Jin-Hyo
    • Bulletin of the Korean Chemical Society
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    • v.30 no.6
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    • pp.1357-1359
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    • 2009
  • Many researchers studied cell culturing on surfaces with chemical functional groups. Previously, we reported surface properties of plasma polymerized ethylenediamine (PPEDA) films deposited by plasma enhanced chemical vapor deposition with various plasma conditions. Surface properties of PPEDA films can be controlled by plasma power during deposition. In this work, to analyze correlation of cell adherence/proliferation with surface property, we cultured rat intestinal epithelial cells-18 on the PPEDA films deposited with various plasma powers. It was shown that as plasma power was decreased, density of cells cultured on the PPEDA film surface was increased. Our findings indicate that plasma power changed the amine density of the PPEDA film surface, resulting in density change of cells cultured on the PPEDA film surface.

Electrical Properties of Molybdenum Metal Deposited by Plasma Enhanced - Atomic Layer Deposition of Variation Condition (다양한 조건의 플라즈마 원자층 증착법으로 증착된 Mo 금속의 전기적 특성)

  • Lim, Taewaen;Chang, Hyo Sik
    • Korean Journal of Materials Research
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    • v.29 no.11
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    • pp.715-719
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    • 2019
  • Molybdenum is a low-resistivity transition metal that can be applied to silicon devices using Si-metal electrode structures and thin film solar cell electrodes. We investigate the deposition of metal Mo thin film by plasma-enhanced atomic layer deposition (PE-ALD). $Mo(CO)_6$ and $H_2$ plasma are used as precursor. $H_2$ plasma is induced between ALD cycles for reduction of $Mo(CO)_6$ and Mo film is deposited on Si substrate at $300^{\circ}C$. Through variation of PE-ALD conditions such as precursor pulse time, plasma pulse time and plasma power, we find that these conditions result in low resistivity. The resistivity is affected by Mo pulse time. We can find the reason through analyzing XPS data according to Mo pulse time. The thickness uniformity is affected by plasma power. The lowest resistivity is $176{\mu}{\Omega}{\cdot}cm$ at $Mo(CO)_6$ pulse time 3s. The thickness uniformity of metal Mo thin film deposited by PE-ALD shows a value of less than 3% below the plasma power of 200 W.

Recent Studies of Laser Metal 3D Deposition with Wire Feeding (와이어 송급 레이저 금속 3차원 적층 연구동향)

  • Kam, Dong-Hyuck;Kim, Young-Min;Kim, Cheolhee
    • Journal of Welding and Joining
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    • v.34 no.1
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    • pp.35-40
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    • 2016
  • Recent developments of Laser metal 3D deposition with wire feeding are reviewed which provide an alternative to powder feeding method. The wire feeding direction, angle and position as well as laser power, wire feeding rate, and deposition speed are found to be key parameters to make quality deposition with high throughput. When compared with the powder feed, the wire feed shows higher material efficiency, higher deposition rate, and smoother surface. Large elongated columnar grains which have epitaxial growth across deposit layers are observed in deposit cross sections. The growth direction is parallel to the thermal gradient during the deposit process. Tensile properties are found to be dependent on the direction due to the anisotropic deposit property. A real-time feedback control is demonstrated to be effective to improve the deposition stability.

Effects of Deposition Variables on Plasma-Assisted CVD of TiN Films (TiN박막의 증착특성에 미치는 플라즈마 화학증착변수들의 영향)

  • 이정래;김광호;신동원;박찬경
    • Journal of the Korean Ceramic Society
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    • v.31 no.10
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    • pp.1188-1196
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    • 1994
  • TiN films were deposited onto high speed steel(SKH9) and silicon wafer by plasma-assisted chemical vapor deposition(PACVD) using a TiCl4/N2/H2/Ar gas mixture. The effects of deposition temperature, R.F. power, and H2 concentration on the deposition of TiN were studied. The residual chlorine content and the microhardness of TiN films were also investigated. It was found that TiN films grew with a columnar structure of a strong (200) preferred orientation regardless of the substrate type and the deposition variables. The TiN films consisted of columnar-grains of about 50 to 100 nm in diameter. The columnar grains themselves contained much finer fibrous grains. As deposition temperature increased, the residual chlorine content decreased sharply. R. F. powder enhanced the deposition rate largely. Increasing of H2 concentration had little effect on the residual chlorine.

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