• Title/Summary/Keyword: dc sputtering

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Gas sensing properties of polyacrylonitrile/metal oxide nanofibrous mat prepared by electrospinning

  • Lee, Deuk-Yong;Cho, Jung-Eun;Kim, Ye-Na;Oh, Young-Jei
    • Journal of Sensor Science and Technology
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    • v.17 no.4
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    • pp.281-288
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    • 2008
  • Polyacrylonitrile(PAN)/metal oxide(MO) nanocomposite mats with a thickness of 0.12 mm were electrospun by adding 0 to 10 wt% of MO nanoparticles ($Fe_2O_3$, ZnO, $SnO_2$, $Sb_2O_3-SnO_2$) into PAN. Pt electrode was patterned on $Al_2O_3$ substrate by DC sputtering and then the PAN(/MO) mats on the Pt patterned $Al_2O_3$ were electrically wired to investigate the $CO_2$ gas sensing properties. As the MO content rose, the fiber diameter decreased due to the presence of lumps caused by the presence of MOs in the fiber. The PAN/2% ZnO mat revealed a faster response time of 93 s and a relatively short recovery of 54 s with a ${\Delta}R$ of 0.031 M${\Omega}$ at a $CO_2$ concentration of 200 ppm. The difference in sensitivity was not observed significantly for the PAN/MO fiber mats in the $CO_2$ concentration range of 100 to 500 ppm. It can be concluded that an appropriate amount of MO nanoparticles in the PAN backbone leads to improvement of the $CO_2$ gas sensing properties.

선형 대향 타겟 스퍼터 시스템으로 성장시킨 GaN-LED용 Ga-doped ZnO 박막 특성 연구

  • Sin, Hyeon-Su;Lee, Ju-Hyeon;Kim, Han-Gi
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.572-572
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    • 2013
  • 본 연구에서는 Plasma damage-free 선형 대향 타겟 스퍼터(Linear Facing Target sputtering: LFTS) 시스템을 이용하여 성막시킨 GaN-LED의 투명전극용 Ga-doped ZnO (GZO) 박막의 특성을 연구하였다. LFTS 시스템을 이용한 GZO 성막 공정 중 LED소자의 플라즈마 노출에 의한 데미지를 최소화 하기 위해 일정한 타겟간 거리(Target-to-Target distance: 65 mm)에서 타겟과 기판간 거리(Target-to-Substrate distance)를 50 mm에서 120 mm로 변화시키며 GZO 투명 전극을 성막해 박막의 특성과 소자의 특성을 동시에 분석하였다. LFTS에서 플라즈마는 GZO 타겟 사이에 형성된 일방향의 자장에 의해 효과적으로 구속되기 때문에 기판과 타겟 거리를 최적화 할 경우 플라즈마 데미지를 최소화하며 GaN-LED의 제작이 가능하다. 기판과 타겟 사이의 거리가 120 mm에서 최적화된 200 nm 두께의 GZO 투명 전극은 DC 파워 250 W, 공정 압력 0.3 mTorr, Ar 20 sccm 실험 조건하에서 LED 소자 위해 성막되었으며, 이후 $600^{\circ}C$ 수소 분위기에서 1분간 급속 열처리하였고 면저항(37 Ohm/sq.)과 450 nm 파장에서의 투과도(83%)를 나타냄을 확인할 수 있었다. LED 소자와 타겟 사이의 거리가 50 mm에서 120 mm로 증가할수록 성막공정 중 LED 소자에 미치는 플라즈마 데미지의 감소로 인해 GaN-LED 소자의 turn on voltage가 8.2 V에서 3.4 V로 감소한 것을 확인하였으며, 또한 radiant intensity는 20 mA의 전류를 인가하였을 시 0.02 mW/sr에서 8 mW/sr로 400배 향상되었다. 이러한 소자 특성은 대향 타겟 스퍼터 시스템으로 성장시킨 GZO 투명전극이 LED 소자의 투명 전극 층(Transparent Conductive Layer: TCL)에 적용될 수 있음을 말해준다.

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Effect of Isotropic Strain on Properties of Amorphous Magnetic films (아몰퍼스자성박막의 특성에 미치는 등방성 스트레인의 영향)

  • 신광호;김흥근;김영학;사공건
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.478-480
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    • 2001
  • Fe-base amorphous films exhibit large saturation magnetostriction and soft magnetic Properties, which make them suitable for strain sensor applications. Most important material properties for the performance of these elements are the superior soft magnetic properties, such as high permeability and small coercive force, as well as magnetoelastic properties. It is well known that the strain generated in film deposition and/or post-heat treatment processes is one of important material properties, which effects on the soft magnetic properties of the film via magnetoelastic coupling. In this study, the effect of an isotropic strain in plane of magnetic films have been performed experimently. Amorphous films with the composition of (F $e_{90}$ $Co_{10}$)$_{78}$S $i_{l2}$ $B_{10}$ were employed in this study. The film with 5${\mu}{\textrm}{m}$ thick was deposed onto the polyimide substrate with 50${\mu}{\textrm}{m}$ thick by virtue of RF sputtering. The film was subject to post annealing with a static magnetic field with 500Oe magnetic field intensity at 35$0^{\circ}C$ for 1 hour. The polyimide substrate with the film was bonded with an adhesive on PZT piezoelectric substrate with 600${\mu}{\textrm}{m}$ thick in applying voltage of 500V. The change in MH loops of films due to the isotropic strain was measured by using VSM. The coercive force was evaluated from MH loops. It has shown in the results that M-H loops of films are subject to change considerably with a dc voltage, resulting of the magnetization rotation from normal to plane direction as the applied voltage is changed from 500V to 250V.50V.V.

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Josephson Property and Magnetoresistance in Y$_1Ba_2Cu_3O_{7-x}$ and La$_{0.2}Sr_{0.8}MnO_3$ Films on Biepitaxial SrTiO$_3$/(MgO/)Al$_2O_3$(1120) (SrTiO$_3$/(MgO/)Al$_2O_3$(1120) 위에 쌍에피택셜하게 성장한 Y$_1Ba_2Cu_3O_{7-x}$와 La$_{0.2}Sr_{0.8}MnO_3$ 박막의 조셉슨 및 자기저항 특성연구)

  • Lee, Sang-Suk;Hwang, Do-Guwn
    • 한국초전도학회:학술대회논문집
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    • v.9
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    • pp.185-188
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    • 1999
  • Biepitaxial Y$_1Ba_2Cu_3O_{7-x}$ (YBCO) and La$_{0.2}Sr_{0.8}MnO_3$ (LSMO) thin films have been prepared on SrTiO$_3$ buffer layer and MgO seed layer grown on Al$_2O_3$(11${\bar{2}}$0)substrates by dc-sputtering with hollow cylindrical targets, respectively. We charaterized Josephson properties and significantly large magnetoresistance in YBCO and LSMO films with 45$^{\circ}$ grain boundary junction, respectively. The observed working voltage (I$_cR_n$) at 77 K in grain boundary junction was below 10${\mu}$V, which is typical I$_cR_n$ value of single biepitaxial Josephson junction. The field magnetoresistance ratio (MR) of LSMO grain boundary juncoon at 77K was enhanced to 13%, which it was significant MR value with high magnetic field sensitivity at a low field of 250 Oe. These results indicate that inserting the insulating layer instead of the grain boundary layer with metallic phase can be possible to apply a new SIS Josephson junction and a novel magnetic device using spin-polarized tunneling junction.

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Physical Properties of Fe Particles Fine-dispersed in AlN Thin Films (Fe 입자를 미세 분산 시킨 AlN 박막의 물리적 성질)

  • Han, Chang-Suk;Kim, Jang-Woo
    • Korean Journal of Materials Research
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    • v.21 no.1
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    • pp.28-33
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    • 2011
  • This paper describes the fabrication of AlN thin films containing iron and iron nitride particles, and the magnetic and electrical properties of such films. Fe-N-Al alloy films were deposited in Ar and $N_2$ mixtures at ambient temperature using Fe/Al composite targets in a two-facing-target DC sputtering system. X-ray diffraction results showed that the Fe-N-Al films were amorphous, and after annealing for 5 h both AlN and bcc-Fe/bct-$FeN_x$ phases appeared. Structure changes in the $FeN_x$ phases were explained in terms of occupied nitrogen atoms. Electron diffraction and transmission electron microscopy observations revealed that iron and iron nitride particles were randomly dispersed in annealed AlN films. The grain size of magnetic particles ranged from 5 to 20 nm in diameter depending on annealing conditions. The saturation magnetization as a function of the annealing time for the $Fe_{55}N_{20}Al_{25}$ films when annealed at 573, 773 and 873 K. At these temperatures, the amount of iron/iron nitride particles increased with increasing annealing time. An increase in the saturation magnetization is explained qualitatively in terms of the amount of such magnetic particles in the film. The resistivity increased monotonously with decreasing Fe content, being consistent with randomly dispersed iron/iron nitride particles in the AlN film. The coercive force was evaluated to be larger than $6.4{\times}10^3Am^{-1}$ (80 Oe). This large value is ascribed to a residual stress restrained in the ferromagnetic particles, which is considered to be related to the present preparation process.

A Study on the Rotation of Uniaxial Anisotropy Field of NiFe Thin Film by Magnetic Annealing (자기장 내 열처리에 의한 퍼멀로이 박막의 일축 이방성 자기장의 회전에 관한 연구)

  • 송용진;김기출;이충선
    • Journal of the Korean Magnetics Society
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    • v.11 no.4
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    • pp.163-167
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    • 2001
  • The rotation of uniaxial anisotropy field of 700 ${\AA}$ thick sputtered NiFe thin film due to magnetic annealing was investigated. NiFe film was annealed in a magnetic field which is perpendicular to the initial induced uniaxial anisotropy field. The NiFe film becomes nearly isotropic after 1 hour annealing at 160 $^{\circ}C$. With increase of annealing temperature over 160 $^{\circ}C$, the film gets uniaxial anisotropy field again. An abrupt increase of H$\sub$c/ was observed with annealing temperature over 400 $^{\circ}C$. The X-ray diffraction analysis and Auger electron spectroscopy with Ar ion etching showed extensive grain growth in NiFe film with (111) texturing and interdiffusion with adjacent Au electrode layer by 400 $^{\circ}C$ magnetic annealing.

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Transparent Conductive Indium Zinc Tin Oxide Thin Films for Solar Cell Applications

  • Damisih, Damisih;Lee, Hee-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.208-208
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    • 2010
  • Indium zinc tin oxide (IZTO) thin films were studied as a possible alternative to indium tin oxide (ITO) films for providing low-cost transparent conducting oxide (TCO) for thin film photovoltaic devices. IZTO films were deposited onto glass substrates at room temperature. A dc/rf magnetron co-sputtering system equipped with a ceramic target of the same composition was used to deposit TCO films. Earlier studies showed that the resistivity value of $In_{0.6}Zn_{0.2}Sn_{0.2}O_{1.5}$ (IZTO20) films could be lowered to approximately $6{\times}10^{-4}ohm{\cdot}cm$ without sacrificing optical transparency and still maintaining amorphous structure through the optimization of process variables. The growth rate was kept at about 8 nm/min while the oxygen-to-argon pressure ratio varied from 0% to 7.5%. As-deposited films were always amorphous and showed strong oxygen pressure dependence of electrical resistivity and electron concentration values. Influence of forming gas anneal (FGA) at medium temperatures was also studied and proven effective in improving electrical properties. In this study, the chemical composition of the targets and the films varied around the $In_{0.6}Zn_{0.2}Sn_{0.2}O_{1.5}$ (IZTO20). It was the main objective of this paper to investigate how off-stoichiometry affected TCO characteristics including electrical resistivity and optical transmission. In addition to the composition effect, we have also studied how film properties changed with processing variables. IZTO thin films have shown their potential as a possible alternative to ITO thin films, in such way that they could be adopted in some applications where currently ITO and IZO thin films are being used. Our experimental results are compared to those obtained for commercial ITO thin films from solar cell application view point.

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A Study on Adhesion and Electro-optical Properties of ITO Films deposited on Flexible PET Substrates with $SiO_2$ Buffer Layer (PET 기판 위해 $SiO_2$ 버퍼층 도입에 따른 IT 박막의 접착 및 전기적.광학적 특성 연구)

  • Kang, Ja-Youn;Kim, Dong-Won;Yun, Hwan-Jun;Park, Kwang-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.316-316
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    • 2008
  • Using an evaporation method, $SiO_2$ was deposited as a buffer layer between a flexible PET substrate and a ITO film deposited by DC magnetron sputtering and electro-optical properties were investigated with thickness variance of $SiO_2$ layers. After coating a $SiO_2$ layer and a ITO film, the ITO/$SiO_2$/PET was heated up to $200^{\circ}C$ and the resistivity and the transmittance were measured by hall effect measurement system and UV/VIS/NIR spectroscopy. As a result of depositing a $SiO_2$ buffer layer, the resistivity increased and the transmittance and adhesion property were enhanced than ITO films with no buffer layers and the resistivity was lowered as $SiO_2$ thickness increased from 50 $\AA$ to 100 $\AA$. It was found that the transmittance was independent of annealing temperature variance in $150^{\circ}C{\sim}200^{\circ}C$ and the resistivity decreased as the temperature increased and especially decreasing rate of the resistivity was higher as the buffer layer thickness was thinner. So under optimized depositing of $SiO_2$ buffer layers and post-annealing of ITO/$SiO_2$/PET, ITO films with enhanced adhesion, electro-optical properties can obtained.

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The Electromagnetic Properties in Uncoupled funnel-junction with Various Cr Seed Layer (비결합형 터널접합구조에서 Cr 하지층에 따른 전자기적 특성변화)

  • Park, J.W.;Jeon, D.M.;Yoon, S.Y.;Lee, J.Y.;Suh, S.J.
    • Journal of the Korean Magnetics Society
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    • v.13 no.3
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    • pp.91-96
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    • 2003
  • Cross-geometrical Cr/Co/Al-Ox/Co/Ni-Fe tunnel junctions were fabricated by magnetron sputtering. To form an insulating layer, The Al layer was oxidized in an atmosphere of oxygen-argon mixture at low power after deposition. To enhance the coercivity of the bottom Co layer, The Cr seed layer was deposited on the glass and it led to increase in coercivity. The coercivity increase is due to the increase of roughness through the Cr thickness. In over oxidation time, the oxidation of Co bottom layer and flat interface of insulator can increase the bottom Co coercivity. But TMR ratio gradually decrease. TMR ratio is relevant with Cr thickness, insulator thickness, and oxidation time. The maximum TMR ratio was 14% at room temperature and the TMR ratio was decreased to half at 0.51 V.

Analyses of Laser Induced Demagnetization and Remagnetization in Carbon Doped FePt Thin Films (탄소가 도핑 된 FePt 박막에서의 펨토 초 펄스 레이저에 의한 자기 소거와 회복 분석)

  • Song, Hyon-Seok;Ko, Hyun Seok;Hong, Jung-Il;Shin, Sung-Chul;Lee, Kyeong-Dong;Park, Byong-Guk
    • Journal of the Korean Magnetics Society
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    • v.25 no.2
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    • pp.39-42
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    • 2015
  • After preparing carbon-doped FePt films by dc magnetron sputtering, we observed ultrafast demagnetization and its recovery by means of a time-resolved magneto-optical Kerr effect technique. We confirm that the degree of $L1_0$ ordering is decreased and coercivity is changed, as the carbon concentration increases. All samples are demagnetized within ~5 ps after the femtosecond laser pulse heated the sample. Interestingly, ultrafast relaxation time, which indicates fast magnetization recovery, increases as the carbon concentration increases due to the low spin-orbit coupling of carbon.