• 제목/요약/키워드: continuous path(CP) measurement

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Scanning Probe를 이용한 OMM(On the Machine Measuring) 시스템 개발 및 평가 (The Development and Evaluation of OMM(On the Machine Measuring) System Using Scanning Probe)

  • Kim, S.H.;Kim, I.H.
    • 한국정밀공학회지
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    • 제13권10호
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    • pp.71-77
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    • 1996
  • This paper describes the development of on the machine measuring(OMM) system which can directlry measure the three dimensional machined dimensilnal accuracy using scanning probe in milling machine. Two algolithms, continuous path(CP) measurement using UC program and CAD data assisted point to point(PTP) measurement, were developed regarding specification of scanning probe. The OMM system was contructed to verify the developed system suing the proposed algorithm, and actually measured three kinds of machined TV shadow mask molds. The developed system was evaluated it's repeatability and compared with the current measurement system of CMM(Coording Measuring Machine) in terms of relative accuracy and time reduction and productivity increase.

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기상측정(機上測定) 시스템 개발 (Development of On-the-Machine Measurement(OMM) System)

  • 이승우;김선호
    • 산업공학
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    • 제11권1호
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    • pp.199-205
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    • 1998
  • This paper describes the development of on-the-machine measuring(OMM) system which can directly measure the two and three dimensional machined accuracy using a scanning probe in milling machine. Two algorithms, NC program based continuous path(CP) measurement and CAD data assisted point to point(PTP) measurement, are developed for three dimensional measurements, with consideration of the characteristics of the scanning probe. The algorithms are used to develop an auto measuring system. The delveloped system is compared with the CMM (Coordinate Measuring Machine) in terms of accuracy and repeatability. The OMM system is expected to realize measurement time reduction and hence result in high productivity.

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