• Journal of Biomedical Engineering Research
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• v.32 no.1
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• pp.37-44
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• 2011

This paper describes the development and assessment of conductive fabric sensor for evaluating knee movement using bio-impedance measurement method. The proposed strip-typed conductive fabric sensor is compared with a dot-typed Ag/AgCl electrode for evaluating validity under knee movement condition. Subjects are composed of ten males($26.6{\pm}2.591$) who have not had problems on their knee. The strip-typed conductive fabric sensor is analyzed by correlation and reliability between a dot-typed Ag/AgCl electrode and the strip-typed conductive fabric sensor. The difference of bio-impedance between a dot-typed Ag/AgCl electrode and the strip-typed conductive fabric sensor averages $7.067{\pm}13.987\;{\Omega}$ As the p-value is under 0.0001 in 99% of t-distribution, the strip-typed conductive fabric sensor is correlated with a dot-typed Ag/AgCl electrode by SPSS software. The strip-typed conductive fabric sensor has reliability when it is compared with a dot-typed Ag/AgCl electrode because most of bio-impedance values are in ${\pm}1.96$ standard deviation by Bland-Altman Analysis. As a result, the strip-typed conductive fabric sensor can be used for assessing knee movement through bio-impedance measurement method as a dot-typed Ag/AgCl electrode. Futhermore, the strip-typed conductive fabric sensor is available for wearable circumstances, applications and industries in the near future.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.19 no.2
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• pp.47-52
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• 2019

In this paper, TE(transverse electric) scattering problems by a conductive strip grating between a double dielectric layer are analyzed by applying the FGMM(Fourier-Galerkin moment method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, and the conductive boundary condition is applied to analysis of the conductive strip. The numerical results for the normalized reflected and transmitted power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the double dielectric layers, and incident angles. Generally, as the value of the dielectric constant increases, the reflected power increases and the transmitted power decreases, respectively. As the dielectric constant increases, the current density induced in the strip increases as it goes to both strip ends. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.20 no.1
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• pp.77-82
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• 2020

In this paper, E-polarized electromagnetic scattering problems by a conductive strip grating between a double dielectric layer are analyzed by applying the FGMM(Fourier-Galerkin moment method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, and the conductive boundary condition is applied to analysis of the conductive strip. The numerical results for the normalized reflected and transmitted power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the double dielectric layers, and incident angles. Generally, as the value of the dielectric constant of the double dielectric layer increases, the reflected power increases and the transmitted power decreases, respectively. As the dielectric constant of the double dielectric layer increases, the current density induced in the strip center increases. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.20 no.1
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• pp.83-88
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• 2020

In this paper, H-polarized electromagnetic scattering problems by a conductive strip grating between a grounded double dielectric layer are analyzed by applying the FGMM(Fourier-Galerkin Moment Method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, and the conductive boundary condition is applied to analysis of the conductive strip. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the grounded double dielectric layers, and incident angles. Generally, as the value of the dielectric constant and dielectric thickness of a grounded double dielectric layer increases, the reflected power increased. And as dielectric thickness of a grounded double dielectric layer increases, the current density induced in the strip center increases. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers using the PMM(Point Matching Method).

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.16 no.4
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• pp.153-158
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• 2016

In this paper, TE(transverse electric) scattering problems by a conductive strip grating between grounded double dielectric layer are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition is applied to analysis of the conductive strip. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the double dielectric layers, and incident angles. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. The numerical results for the presented structure of this paper having a grounded double dielectric layer are shown in good agreement compared to those of the existing papers.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.17 no.2
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• pp.83-88
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• 2017

In this paper, TE(transverse electric) scattering problems by a conductive strip grating between a double dielectric layer are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition is applied to analysis of the conductive strip. The numerical results for the normalized reflected and transmitted power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the double dielectric layers, and incident angles. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.15 no.2
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• pp.65-70
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• 2015

In this paper, the solutions of TE (transverse electric) scattering problems by a conductive strip grating over grounded two dielectric layers are analyzed by applying the PMM (point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition apply to analysis of conducting strip. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the two dielectric layers, and incident angles. The numerical results of present numericl analysis are shown in good agreement compared to those of the existing papers using FGMM (fourier galerkin moment method).

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.16 no.2
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• pp.87-92
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• 2016

In this paper, the solutions of TE(transverse electric) scattering problems by a conductive strip grating over two dielectric layers are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic field. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition apply to analysis of conducting strip. The most normalized reflected and transmitted powers having a sharp variations are scattered in direction of the other angles except incident angle. The numerical results for the normalized reflected and transmitted powers are analyzed by according as the width and spacing of conductive strip, incident angles, and the relative permittivity and thickness of the two dielectric layers. To confirm the validity of this paper, the numerical results of presented structure are shown in good agreement compared to those of the existing papers.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.18 no.2
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• pp.73-79
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• 2018

In this paper, TM(transverse magnetic) scattering problems by a conductive strip grating between a double dielectric layer are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition is applied to analysis of the conductive strip. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. Generally, in the case of numerical analysis except for reflection and transmission power in free space, as the dielectric constants of the double dielectric layer increases, the reflected power increases and the transmitted power decreases relatively, respectively. The numerical results for the presented structure of this paper having a grounded double dielectric layer are shown in good agreement compared to those of the existing papers.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.875-881
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• 2004

Fundamental results obtained from an atomic force microscope (AFM) chemically-induced direct nano-lithography process are presented, which is regarded as a simple method for fabrication nm-scale devices such as superconducting flux flow transistors (SFFTs) and single electron tunneling transistors (SETs). Si cantilevers with Pt coating and with 30 nm thick TiO coating were used as conducting AFM tips in this study. We observed the surfaces of superconducting strip lines modified by AFM anodization' process. First, superconducting strip lines with scan size 2 ${\mu}{\textrm}{m}$${\times}$2 ${\mu}{\textrm}{m}$ have been anodized by AFM technology. The surface roughness was increased with the number of AFM scanning, The roughness variation was higher in case of the AFM tip with a positive voltage than with a negative voltage in respect of the strip surface. Second, we have patterned nm-scale oxide lines on ${YBa}-2{Cu}_3{O}_{7-x}$ superconducting microstrip surfaces by AFM conductive cantilever with a negative bias voltage. The ${YBa}-2{Cu}_3{O}_{7-x}$ oxide lines could be patterned by anodization technique. This research showed that the critical characteristics of superconducting thin films were be controlled by AFM anodization process technique. The AFM technique was expected to be used as a promising anodization technique for fabrication of an SFFT with nano-channel.