• Journal of the Korean Ceramic Society
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• v.30 no.11
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• pp.941-948
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• 1993

The powder mixture of Si3N4-AlN-Y2O3, Si3N4-AlN-CeO2 and Si3N4-AlN-Y2O3-CeO2 system was hot-pressed at 175$0^{\circ}C$ for 2h in N2 to prepare $\alpha$-Sialon ceramics. The mechanical property and oxidation behaviour of the prepared $\alpha$-Sialon ceramics were investigated. At 120$0^{\circ}C$, oxidation resistance was best for the Y2O3 added $\alpha$-Sialon ceramics and oxidation rate increased when the amount of CeO2 increased. But when the mixture of Y2O3 and CeO2 added $\alpha$-Sialon ceramics showed a good oxidation resistance. Fracture toughness of (Y2O3＋CeO2) added $\alpha$-Sialon ceramics was higher than Y2O3 added $\alpha$-Sialon ceramics.

• Proceedings of the KIEE Conference
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• 2002.11a
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• pp.122-123
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• 2002

Cu CMP process control for global planarization of semiconductor surface were studied on a platen polisher by using an experimental copper slurry containing ceria as the abrasive component. In order to understand the process. a design of experiment was conducted. From the experiment. the effects of polishing parameters such as polishing pressure, platen speed, and speed of wafer carrier on the removal rate of copper and the uniformity in copper removal were calculated and discussed. In this study, process parameters of Cu CMP and WIWNU(Within Wafer Non Uniformity) were presented.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07a
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• pp.313-316
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• 2004

Chemical mechanical polishing(CMP) process has been widely used to planarize dielectric layers, which can be applied to the integrated circuits for sub-micron technology. Despite the increased use of CMP process, it is difficult to accomplish the global planarization of in the defect-free inter-level dielectrics(ILD). we investigated the performance of $WO_3$ CMP used silica slurry, ceria slurry, tungsten slurry In this paper, the effects of addition oxidizer on the $WO_3$ CMP characteristics were investigated to obtain the higher removal rate and lower non-uniformity.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.11a
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• pp.188-191
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• 2003

Chemical mechanical polishing (CMP) process has been widely used to planarize dielectric layers, which can be applied to the integrated circuits for sub-micron technology. Despite the increased use of CMP process, it is difficult to accomplish the global planarization of in the defect-free inter-level dielectrics (ILD). we investigated the performance of $WO_3$ CMP used silica slurry, ceria slurry, tungsten slurry. In this paper, the effects of addition oxidizer on the $WO_3$ CMP characteristics were investigated to obtain the higher removal rate and lower non-uniformity.

• Toxicological Research
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• v.35 no.3
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• pp.287-294
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• 2019

The possibility of eye exposure for workers participating in manufacturing of nanoparticles or consumers using products containing nanoparticles has been reported, but toxicity studies on the eye are scarce. In this study, cytotoxicity of five nanoparticles including silver, ceria, silica, titanium and zinc were tested using Statens Seruminstitut Rabbit Cornea (SIRC) cells. When cells were treated with nanoparticles with concentrations of $1-100{\mu}g/mL$ for 24 hr, zinc oxide nanoparticles showed higher toxicity to cornea cells. $LC_{50}$ of zinc oxide nanoparticles was less than $25{\mu}g/mL$ but those of other nanoparticles could not be calculated in this test, which means more than $100{\mu}g/mL$. Generation of reactive oxygen species was observed, and expression of apoptosis related biomarkers including Bax and Bcl-2 were changed after treatment of zinc oxide nanoparticles, while no other significant toxicity-related changes were observed in cornea cells treated with Ag, $CeO_2$, $SiO_2$ and $TiO_2$ nanoparticles.

• Journal of the Korean Ceramic Society
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• v.49 no.5
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• pp.404-411
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• 2012

The reliability of solid oxide fuel cells (SOFCs) particularly depends on the high quality of solid oxide electrolytes. The application of thinner electrolytes and multi electrolyte layers requires a more reliable characterization method. Most of the investigations on thin film solid electrolytes have been made for the parallel transport along the interface, which is not however directly related to the fuel cell performance of those electrolytes. In this work an array of ion-blocking metallic Ti/Au microelectrodes with about a $160{\mu}m$ diameter was applied on top of an ultrathin ($1{\mu}m$) yttria-stabilized-zirconia/gadolinium-doped-ceria (YSZ/GDC) heterolayer solid electrolyte in a micro-SOFC prepared by PLD as well as an 8-${\mu}m$ thick YSZ layer by screen printing, to study the transport characteristics in the perpendicular direction relevant for fuel cell operation. While the capacitance variation in the electrode area supported the working principle of the measurement technique, other local variations could be related to the quality of the electrolyte layers and deposited electrode points. While the small electrode size and low temperature measurements increaseed the electrolyte resistances enough for the reliable estimation, the impedance spectra appeared to consist of only a large electrode polarization. Modulus representation distinguished two high frequency responses with resistance magnitude differing by orders of magnitude, which can be ascribed to the gadolinium-doped ceria buffer electrolyte layer with a 200 nm thickness and yttria-stabilized zirconia layer of about $1{\mu}m$. The major impedance response was attributed to the resistance due to electron hole conduction in GDC due to the ion-blocking top electrodes with activation energy of 0.7 eV. The respective conductivity values were obtained by model analysis using empirical Havriliak-Negami elements and by temperature adjustments with respect to the conductivity of the YSZ layers.

• Clean Technology
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• v.21 no.3
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• pp.200-206
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• 2015

In order to investigate the effect of cerium oxide addition, Cu-ZnO-CeO₂ catalysts were prepared using co-precipitation method for water gas shift (WGS) reaction. A series of Cu-ZnO-CeO₂ catalyst with fixed Cu Content (50 wt%, calculated as CuO) and a given ceria content (e.g., 0, 5, 10, 20, 30, 40 wt%, calculated as CeO₂) were tested for catalytic activity at a GHSV of 95,541 h^-1, and a temperature range of 200 to 400 ℃. Cu-ZnO-CeO₂ catalysts were characterized by using BET, SEM, XRD, H₂-TPR, and XPS analysis. Varying composition of Cu-ZnO-CeO₂ catlysts led the difference characteristics such as Cu dispersion, and binding energy. The optimum 10 wt% doping of cerium facilitated catalyst reduction at lower temperature and improved the catalyst performance greatly in terms of CO conversion. Cerium oxide added catalyst showed enhanced activities at higher temperature when it compared with the catalyst without cerium oxide. Consequently, ceria addition of optimal composition leads to enhanced catalytic activity which is attributed to enhanced Cu dispersion, lower binding energy, and hindered Cu metal agglomeration.

• Journal of the Korean Chemical Society
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• v.31 no.5
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• pp.389-394
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• 1987

The electrical conductivity of CeO$_2$ has been measured in the temperature range of 300 to 1000${\circ}$C under the oxygen pressures of 10$^{-5}$ to 10$^{-1}$ atm. Plots of log ${\sigma}$ vs. 1/T at constant PO$_2$ are found to be linear with an inflection, and the activation energy obtained from the slopes appears to be 2.16 eV for the intrinsic region. The conductivity dependences on PO$_2$ at the above temperature range are closely approximated by ${\sigma}$ ${\alpha}$PO$_2^{-1/4}$ for the intrinsic and ${\sigma}$ ${\alpha}$PO$_2^{-1/6.2}$ for the extrinsic, respectively. The dominant defects in this sample are believed to be Ce$^{3{\cdot}}$ interstitial for the intrinsic and the (Vo-2e') for the extrinsic range. The interpretations of conductivity dependences on temperature and $PO_2$ are presented, and conduction mechanisms are proposed to explain the data.

• Korean Journal of Materials Research
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• v.9 no.8
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• pp.768-774
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• 1999

Yttia-doped ceria-stabilized ziconia polycrystals(Ce-TZP) was prepared by dipping method and its microstructure was investigated. By controlling doped-yttria content and annealing condition, yttria-doped Ce-TZP showed the microstructure with irregular grain shape and undulated grain boundary. Irregularity of grain shape increased with the amount of yttria doped, and severe undulated grain boundary was observed mainly at the surface region. In the case of yttria-doped Ce-TZP annealed at 1$650^{\circ}C$ for 2h after two dipping times into yttrium nitrate solution of 0.2M, it showed irregular grain shape both at the surface and at the interior region as well as the most severe irregularity. Hot pressed specimen had mean grain size of 0.3$\mu\textrm{m}$ and undulated grain boundary. All specimens with irregular grain shape were retained the tetragonal phase. The fracture toughness of yttria-doped Ce-TZP with irregular grain shape was over the value of 17.6MPa.m(sup)1/2.

• Clean Technology
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• v.29 no.4
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• pp.313-320
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• 2023

In order to increase the usability of H₂-SCR, the NOx removal characteristics with catalyst powder of PtNi/CeO₂-W-TiO₂ using Ce as a co-catalyst was synthesized and coated on a porous metal structure (PMS) were evaluated. Catalyst powder of PtNi/CeO₂-W-TiO₂(PtNi nanoparticles onto W-TiO₂, with the incorporation of ceria (CeO₂) as a co-catalysts) was synthesized and coated onto a porous metal structure (PMS) to produce a Selective Catalytic Reduction (SCR) catalyst. H₂-SCR with CeO₂ as a co-catalyst exhibited higher NOx removal efficiency compared to H₂-SCR without CeO₂. Particularly, at a 10wt% CeO₂ loading ratio, the NOx removal efficiency was highest at 90℃. As the amount of catalyst coating on PMS increased, the NOx removal efficiency was improved below 90℃, but it was decreased above 120℃. When the space velocity was changed from 4,000 h^-1 to 20,000 h^-1, the NOx removal efficiency improved at temperatures above 120℃. It was expected that the use of the catalyst could be reduced by applying the PMS with excellent specific surface area as a support.