• 제목/요약/키워드: carrier phase measurement

검색결과 117건 처리시간 0.025초

Si(100) 기판 위에 성장돈 3C-SiC 박막의 물리적 특성 (Physical Characteristics of 3C-SiC Thin-films Grown on Si(100) Wafer)

  • 정귀상;정연식
    • 한국전기전자재료학회논문지
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    • 제15권11호
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    • pp.953-957
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    • 2002
  • Single crystal 3C-SiC (cubic silicon carbide) thin-films were deposited on Si(100) wafer up to the thickness of 4.3 ${\mu}{\textrm}{m}$ by APCVD (atmospheric pressure chemical vapor deposition) method using HMDS (hexamethyildisilane; {CH$_{3}$$_{6}$ Si$_{2}$) at 135$0^{\circ}C$. The HMDS flow rate was 0.5 sccm and the carrier gas flow rate was 2.5 slm. The HMDS flow rate was important to get a mirror-like crystal surface. The growth rate of the 3C-SiC film was 4.3 ${\mu}{\textrm}{m}$/hr. The 3C-SiC epitaxial film grown on Si(100) wafer was characterized by XRD (X-ray diffraction), AFM (atomic force microscopy), RHEED (reflection high energy electron diffraction), XPS (X-ray photoelecron spectroscopy), and Raman scattering, respectively. Two distinct phonon modes of TO (transverse optical) near 796 $cm^{-1}$ / and LO (longitudinal optical) near 974$\pm$1 $cm^{-1}$ / of 3C-SiC were observed by Raman scattering measurement. The heteroepitaxially grown film was identified as the single crystal 3C-SiC phase by XRD spectra (2$\theta$=41.5。).).

Si(100) 기판상에 성장된 3C-SiC의 특성 (Characterization of 3C-SiC grown on Si(100) water)

  • 나경일;정연식;류지구;정귀상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
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    • pp.533-536
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    • 2001
  • Single crystal cubic silicon carbide(3C-SiC) thin film were deposited on Si(100) substrate up to a thickness of $4.3{\mu}m$ by APCVD(atmospheric pressure chemical vapor deposition) method using hexamethyildisilane(HMDS) at $1350^{\circ}C$. The HMDS flow rate was 0.5 sccm and the carrier gas flow rate was 2.5 slm. The HMDS flow rate was important to get a mirror-like. The growth rate of the 3C-SiC films was $4.3{\mu}m/hr$. The 3C-SiC epitaxical layers on Si(100) were characterized by XRD(X-ray diffraction), raman scattering and RHEED(reflection high-energy electron diffraction), respectively. The 3C-SiC distinct phonons of TO(transverse optical) near $796cm^{-1}$ and LO(longitudinal optical) near $974{\pm}1cm^{-1}$ were recorded by raman scattering measurement. The deposition films were identified as the single crystal 3C-SiC phase by XRD spectra($2{\theta}=41.5^{\circ}$). Also, with increase of films thickness, RHEED patterns gradually changed from a spot pattern to a streak pattern.

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2 inch Si(100)기판위에 성장된 3C-SiC 박막의 결정특성 (Crystal Characteristics of 3C-SiC Thin-films Grown on 2 inch Si(100) wafer)

  • 정수용;정연식;류지구;정귀상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 추계학술대회 논문집 Vol.15
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    • pp.452-455
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    • 2002
  • Single crystal 3C-SiC(cubic silicon carbide) thin-films were deposited on Si(100) substrate up to a thickness of $4.3{\mu}m$ by APCVD method using HMDS(hexamethyildisilane) at $1350^{\circ}C$. The HMDS flow rate was 0.5 sccm and the carrier gas flow rate was 2.5 slm. The HMDS flow rate was important to get a mirror-like crystal surface. The growth rate of the 3C-SiC films was $4.3{\mu}m/hr$. The 3C-SiC epitaxical films grown on Si(100) were characterized by XRD, AFM, RHEED, XPS and raman scattering, respectively. The 3C-SiC distinct phonons of TO(transverse optical) near $796cm^{-1}$ and LO(longitudinal optical) near $974{\pm}1cm^{-1}$ were recorded by raman scattering measurement. The heteroepitaxially grown films were identified as the single crystal 3C-SiC phase by XRD spectra$(2{\theta}=41.5^{\circ})$.

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A Study on the Applicability of the Kinematic and the Static GPS Methods for Coastal Ocean Structure Survey

  • Lee, Byung-Gul;Yang, Sung-Kee;Kang, In-Jun
    • 한국환경과학회지
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    • 제11권2호
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    • pp.103-110
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    • 2002
  • The position fixing usually is determined by triangulation, traverse surveying and astronomy surveying. However, when the station is moving, it is impossible to determine its position continuously by the former method. By a satellite positioning method(GPS), this problem can be solved. In our study, we used two methods to determine the length and coordinate of a point position. One is a kinematic GPS method and the other is a static one. Each is based on carrier phase measurement and employs a relative position technique. We implemented observation experiments such as Geodimeter and DGPS(Differential GPS) successfully. To estimate the accuracy between the kinematic and static methods, we compared the results of Geodimeter, the kinematic, and the static. The results showed that the static is relatively a little more accurate than the kinematic. However, in the kinematic mode, when we received the GPS data for a long time, we found that the kinematic also had a high accuracy value for the length survey Finally, we applied the GPS to Jeju Harbor Breakwater to examine the applicability of GPS for coastal ocean structure based on the kinematics and the statics, respectively.

Effects of observation parameters on time transfer using GPS

  • Lee, Seung-Woo;Lee, Chang-Bok;Yang, Sung-Hoon;Lee, Young-Kyu;Han, Ji-Ae
    • 한국항해항만학회:학술대회논문집
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    • 한국항해항만학회 2006년도 International Symposium on GPS/GNSS Vol.2
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    • pp.113-116
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    • 2006
  • In order to fully utilize the inherent precision that GPS observables could offer, accurate estimation of dynamic and measurement parameters is vital. Among these parameters some are indispensable in virtually every form of GPS processing, while some are limitedly relevant to a particular application. In the context of time transfer by GPS, the transmission-related errors such as ionospheric and tropospheric delays, and the integer ambiguity of the carrier phase observables belong to the former, the atomic clock parameters and data batch-related parameters to the latter. Obviously the atomic clock parameters are of prime importance in GPS time transfer. In this study some of important parameters in conducting time transfer experiments by use of GPS were characterized and their effects on time transfer performance were investigated in detail

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Si(100) 기판상에 성장된 3C-SiC의 특성 (Characterization of 3C-SiC grown on Si(100) wafer)

  • 나경일;정연식;류지구;정귀상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
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    • pp.533-536
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    • 2001
  • Single crystal cubic silicon carbide(3C-SiC) thin film were deposited on Si(100) substrate up to a thickness of 4.3 $\mu\textrm{m}$ by APCVD(atmospheric pressure chemical vapor deposition) method using hexamethyildisilane(HMDS) at 1350$^{\circ}C$. The HMDS flow rate was 0.5 sccm and the carrier gas flow rate was 2.5 slm. The HMDS flow rate was important to get a mirror-like. The growth rate of the 3C-SiC films was 4.3 $\mu\textrm{m}$/hr. The 3C-SiC epitaxical layers on Si(100) were characterized by XRD(X-ray diffraction), raman scattering and RHEED(reflection high-energy electron diffraction), respectively The 3C-SiC distinct phonons of TO(transverse optical) near 796 cm$\^$-1/ and LO(longitudinal optical) near 974${\pm}$1 cm$\^$-1/ were recorded by raman scattering measurement. The deposition films were identified as the single crystal 3C-SiC phase by XRD spectra(2$\theta$=41.5$^{\circ}$). Also, with increase of films thickness, RHEED patterns gradually changed from a spot pattern to a streak pattern

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The Mg Solid Solution far the P-type Activation of GaN Thin Films Grown by Metal-Organic Chemical Vapor Deposition

  • Kim, KeungJoo;Chung, SangJo
    • Transactions on Electrical and Electronic Materials
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    • 제2권4호
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    • pp.24-29
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    • 2001
  • GaN films were grown for various Mg doping concentrations in metal-organic chemical vapor deposition. Below the Mg concentration of 10$^{19}$ ㎤, the thermally annealed sample shows the compensated phase to n-type GaN in Hall measurement. In the MB concentration of 4$\times$10$^{19}$ ㎤ corresponding to the hole carrier concentration of 2.6$\times$1$^{19}$ ㎤ there exists a photoluminescence center of the donor and the acceptor pair transition of the 3.28-eV band. This center is correlated with the defects for a shallow donor of the $V_{Ga}$ and for an acceptor of $Mg_{Ga}$ . The acceptor level shows the binding energy of 0.2-0.25 eV, which was observed by the photon energy of the photocurrent signal of 3.02-3.31 eV. Above the Mg concentration of 4$\times$10$^{19}$ ㎤, both the Mg doping level and Mg concentration were saturated and there Is a photoluminescence center of a deep donor and an acceptor pair transition of the 2.76-eV blue band.

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Si(100)기판상에 성장된 3C-SiC의 결정 특성 (Crystal Characteristics of 3C-SiC Grown on Si(100) Wafers)

  • 정연식;류지구;선주헌;정수용;정귀상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 춘계합동학술대회 논문집
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    • pp.30-34
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    • 2002
  • Single crystal 3C-SiC(cubic silicon carbide) thin-films were deposited on Si(100) wafers up to a thickness of 4.3 ${\mu}m$ by APCVD method using HMDS(hexamethyldisilane) at $1350^{\circ}C$. The HMDS flow rate was 0.5 sccm and the carrier gas flow rate was 2.5 slm. The HMDS flow rate was important to get a mirror-like crystal surface. The growth rate of the 3C-SiC films was 4.3 ${\mu}m$/hr. The 3C-SiC epitaxial films grown on Si(100) were characterized by XRD, AFM, RHEED, XPS and raman scattering, respectively. The 3C-SiC distinct phonons of TO(transverse optical) near 796 $cm^{-1}$ and LO(longitudinal optical) near $974{\pm}1cm^{-1}$ were recorded by raman scattering measurement. The heteroepitaxially grown films were identified as the single crystal 3C-SiC phase by XRD spectra($2{\theta}=41.5^{\circ}$).

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AlxGal-xN/GaN 에피층의 비정상적인 광발광과 Persistent Photoconductivity 현상 (Anomalous Photoluminescence and Persistent Photoconductivity of AlxGal-xN/GaN Epilayers)

  • 정상조;전용기
    • 한국재료학회지
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    • 제13권10호
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    • pp.673-676
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    • 2003
  • We have investigated $Al_{x}$ $Ga_{l-x}$ N/GaN epilayers (x = 0.08, 0.15) grown by metal organic vapor phase epitaxy on sapphire with photoluminescence(PL), and persistent photoconductivity(PPC) experiments. An anomalous S-shaped shift behavior of temperature dependencies of PL peak energy is observed for the x = 0.15 sample. In PPC measurement, showed that the dark current recovery time of $Al_{x}$$Ga_{l-x}$ N/GaN epilayers mainly depends on the Al content. These behaviors are usually attributed to the presence of carrier localization states. All these phenomena are explained based on the alloy compositional fluctuations in the $Al_{x}$ /$Ga_{l-x}$ N/ epilayers. The photocurrent quenching observed in PPC measurements for $Al_{x}$ $Ga_{l-x}$ N/ epilayers less than 0.2 $\mu\textrm{m}$ thickness indicates that the presence of metastable state in the bandgap of GaN layer, and that the excess holes in the valence band recombine with free electrons.

국토지리정보원 기준국 사용 Network RTK 테스트베드 구축 (Construction of Network RTK Testbed Using Reference Stations of NGII)

  • 김부겸;기창돈
    • Journal of Positioning, Navigation, and Timing
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    • 제13권1호
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    • pp.103-110
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    • 2024
  • In this paper, a test bed for real-time network Real-Time Kinematic (RTK) research was constructed using reference stations of the NGII. A group of candidate station networks was derived, including three stations in Seoul. The group consisted of four stations with a distance of less than 100 km between them. Among several candidates, a network composed of stations with short distances between them and demonstrating good data quality for all reference stations was selected as the test bed. After collecting real-time data in Radio Technical Committee for Maritime services (RTCM) format from the selected stations and conducting a noise analysis on measurements, mm-level carrier phase measurement noise was confirmed. Afterwards, the user set the reference station inside the test bed and analyzed the network RTK positioning performance of the MAC method using the GPS L1 frequency as post-processing. From the result of the analysis it was confirmed that the residual error for all users was within 10 cm after applying the correction. Additionally, after determining integer ambiguities through Least-squares AMBiguity Decorrelation Adjustment (LAMBDA), it was confirmed that the fix rate was 100%, and all ambiguities were resolved as true values.