• Title/Summary/Keyword: carbon-nitrogen (CN) nanofibers

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Structure and field emission properties of carbon-nitrogen (CN) nanofibers obtained by hot isostatic pressure (Hot isostatic pressure을 이용한 CN nanofiber의 구조 및 전계방출 특성)

  • Lee, Yang-Doo;Blank, V.D.;Batov, D.V.;Buga, S.G;Nahm, Sahn;Lee, Yun-Hi;Ju, Byeong-Kwon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.04a
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    • pp.84-87
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    • 2003
  • Carbon-nitrogen (CN) nanofibers have been produced using a water cooled hot isostatic pressure (HIP) apparatus. The CN nanofibers were grown in random with the diameter of about 100-150nm and length over $10{\mu}m$. Emission properties of CN nanofibers were investigated for spacing, between anode and cathode, variation. Then turn-on fields about $1.4V/{\mu}m$. The time reliability and light emission test were carried out for above 100 hours. We suggest that CN nanofibers can be possibly applied to high brightness flat lamp because of low turn-on field and time reliability.

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Structure and Electron Emission Properties of CN Nanostructures Obtained by HIP Apparatus (HIP에 의해 합성된 CN nanostructures의 구조 및 전계방출 특성)

  • 오정근;이양두;문승일;양석현;이윤희;김남수;주병권
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.8
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    • pp.723-730
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    • 2003
  • The CN(carbon nitrogen) nanofibers were formed by HIP(high isostatic pressure) process. From the field emission measurement, CN nanofibers shows an excellent characteristics of emitter, better than CNTs and carbon nanofibers. The structures obtained can be divided into three groups : bamboo-like fibers, corrugated structures and bead necklace-like fib res. Emission properties of CN nanofibers were investigated for spacing, between anode and cathode, variation. Turn-on fields was 1.4 v/$\mu\textrm{m}$. The time reliability and light emission test were carried out for about 100 hours. We suggest that CN nanofibers can be possibly applied to the high brightness flat lamp because of low turn-on field and time reliability