• 한국전자파학회논문지
• /
• 제13권8호
• /
• pp.741-747
• /
• 2002

본 논문에서는 WRD 가이드를 이용하여 38 MHz 밀리미터파 대역의 대역통과 필터를 설계하고, 실제 제작하여 그 측정 결과를 비교 분석하였다. 기존의 공극 결합된 NRD 가이드 필터의 경우, NRD 가이드로 사용되는 PTFE 선로의 정밀 가공 및 공진기 간의 정위치가 어려워 대량생산에 불리한 단점이 있었으나, 본 연구에서는 각각의 유전체 공진기를 Inductive Iris로 결합, 하나의 선로상에 공진기를 제작할 수 있으므로 가공 및 조립성이 뛰어나 양산에 적합한 구조를 갖는다. 설계 한 필터는 측정 결과, 통과대역 38.66 - 39.06 MHz로 400 MHz 대역폭을 가지며, 대역내 삽입손실 1.4 dB, 반사손실 -18 dB 이하의 우수한 특성을 갖는다.

• Tribology and Lubricants
• /
• 제27권3호
• /
• pp.156-161
• /
• 2011

The rectangular waveguide technique can be used to measure the complex permittivity of dielectric material of various thickness and cross section. This paper presents the analysis system of engine oil permittivity at which deterioration of engine oil is measured at the X-band(8-12.5 GHz). The middle of the rectangular waveguide has engine oil case and is connected with VNA(Vector Network Analyzer) for the measurement of the transmission$(S_{21})$ and reflection$(S_11)$ and then the permittivity is extracted. The deterioration of engine oil is proved by the comparison with both the extracted data and reference data. As the additional research, This paper suggest that an accurate permittivity is considered by not only the wave guide length but the air gap between oil case and the waveguide.

• 한국진공학회지
• /
• 제11권4호
• /
• pp.207-211
• /
• 2002

반도체-유전체 덮개층의 다양한 조합이 I $n_{0.53}$G $a_{0.47}$As/InGaAsP(Q1.25) 양자우물 무질서화에 미치는 영향을 PL(Photoluminescence)을 이용하여 조사하였다. 청색 편이에 대한 문턱 온도는 약 $750^{\circ}C$ 였으며 전반적으로 온도가 올라감에 따라 청색 편이도 점차 증가하였으나 $SiO_2$의 경우에는 온도가 올라감에 따라 포화되는 경향을 보였다. $SiN_{x}$ 가 $SiO_2$보다 더 큰 청색 편이를 야기하였는데 이것은 $SiN_{x}$의 낮은 성장 온도와 관계가 있는 것으로 생각된다. $SiN_{x}$의 경우 P의 확산이, 그리고 $SiO_2$의 경우 Ga의 확산이 청색 편이에 중요한 역할을 하는 것으로 여겨진다.겨진다.

• 전기학회논문지
• /
• 제66권4호
• /
• pp.659-665
• /
• 2017

Power semiconductor devices required the low on-resistance and high breakdown voltage. Wide band-gap materials opened a new technology of the power devices which promised a thin drift layer at an identical breakdown voltage. The diamond had the wide band-gap of 5.5 eV which induced the low power loss, high breakdown capability, low intrinsic carrier generation, and high operation temperature. We investigated the p-type pseudo-vertical diamond Schottky barrier diodes using a numerical simulation. The impact ionization rate was material to calculating the breakdown voltage. We revised the impact ionization rate of the diamond for adjusting the parallel-plane breakdown field at 10 MV/cm. Effects of the field plate on the breakdown voltage was also analyzed. A conventional diamond Schottky barrier diode without field plate exhibited the high forward current of 0.52 A/mm and low on-resistance of $1.71{\Omega}-mm$ at the forward voltage of 2 V. The simulated breakdown field of the conventional device was 13.3 MV/cm. The breakdown voltage of the conventional device and proposed devices with the $SiO_2$ passivation layer, anode field plate (AFP), and cathode field plate (CFP) was 680, 810, 810, and 1020 V, respectively. The AFP cannot alleviate the concentration of the electric field at the cathode edge. The CFP increased the breakdown voltage with evidences of the electric field and potential. However, we should consider the dielectric breakdown because the ideal breakdown field of the diamond is higher than that of the $SiO_2$, which is widely used as the passivation layer. The real breakdown voltage of the device with CFP decreased from 1020 to 565 V due to the dielectric breakdown.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
• /
• pp.314-314
• /
• 2016

In this paper, the effects of carrier concentration on dielectric constant of ITO films were investigated by spectroscopic ellipsometry. From SE results, we find the pronounced shift of the ${\varepsilon}1$ peaks toward high energy with concentration; while contrarily, the ${\varepsilon}2$ values at low energy region increases with decreasing concentration. These shifts are attributed to the Burstein-Moss and free-carrier absorption effects within ITO films. With increases carrier concentration, the values of extinction coefficients show quite different behaviors in range of wavelength from 200 to 1200 nm. The reduction in k at ${\lambda}{\leq}500nm$, while increasing at ${\lambda}{\geq}500nm$ was observed. The QE of HJ solar cells behaviors can be roughly classified into two regions: short-wavelengths (${\leq}650nm$) and long-wavelengths region (${\geq}650nm$). With increasing carrier concentration as well as energy band gap, QE shows improvement at short-wavelength, while at long-wavelength QE shows opposite trend. Widening band gap energy due to Burstein-Moss shift is the key to improve QE in short-wavelength; simultaneously FCA effect due to optical scattering is attributed to the reduction in QE at long-wavelength. In spite of band gap extension, Jsc calculated from QE decreases from 34.7 mA/cm2 to 33.2 mA/cm2 with increasing carrier concentration. It demonstrated that FCA effect may more govern Jsc in the HJ solar cells.

• 한국진공학회지
• /
• 제9권3호
• /
• pp.254-257
• /
• 2000

MBE 법으로 GaAs 기판 위에 성장시킨 $Cd_{1-x}Mg_x/Te$ 박막시료를 조성비(x=0, 0.23, 0.43)에 따라 타원편광 분석기로 측정하여 연구하였다. 기존에 보고된 고상시료(bulk)의 결과와 비교한 결과, 첫째 $E_0$ 밴드갭 에너지 아래에서 나타나는 간섭무늬를 확인할 수 있었고, 이는 박막이 투명함을 보여주는 사실이며 그 결과 이번 시료의 우수성을 확인할 수 있었다. 둘째 $E_2$밴드갭 에너지 영역에서 종전의 고상시료에서 측정 발표된 값보다도 매우 높고 명확한 <$\varepsilon_2$> 값이 측정되어, $E_2$와 $E_0$' 밴드갭 에너지가 명확히 분리되는 것을 보았다. 간섭무늬를 제거하기 위해 다층구조계산(multilayer calculation)을 수행하여 x=0.23일 때의 $E_0$ 밴드갭 에너지를 볼 수 있었다.

• 한국진공학회지
• /
• 제7권s1호
• /
• pp.134-139
• /
• 1998

Amorphous fluorocarbon (a-C:F) is of interest for low dielectric interlayer material, but in this work we applied this material to FED field emitter. N-doped a-C:F films were deposited by inductively coupled plasma chemical vapor deposition (ICPCVD). The Raman spectra were measured to study the film structure and inter-band optical absorption coefficients were measured using Perkin-Elmer UV-VIS-IR spectrophotometer and optical band gap was obtained using Tauc's plot. XPS spectrum and AFM image were investigated to study bond structure and surface morphology. Current-electric field(I-E) characteristic of the film was measured for the characterization of electron emission properties. The optimum doping concentration was found to be [N2]/[CF4]=9% in the gas phase. The turn-on field and the emission current density at $[N_2]/[CF_4]$=9% were found to be 7.34V/$\mu\textrm{m}$ and 16 $\mu\textrm{A}/\textrm{cm}^2$ at 12.8V/$\mu\textrm{m}$, respectively.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2000년도 추계학술대회 논문집
• /
• pp.221-224
• /
• 2000

The microwave dielectric properties of Ba(Mg$_{1}$3/Ta$_{2}$3/)O$_3$-xBa(Co$_{1}$3/Nb$_{2}$3/)O$_3$[BMT-BCN] ceramics were investigated. The specimens were prepared by the conventional mixed oxide method. It was found that Ba(Mg$_{1}$3/Ta$_{2}$3/)O$_3$ and Ba(Co$_{1}$3/Nb$_{2}$3/)O$_3$ formed a solid solution with complex perovskite structure. Increasing the BCN content, dielectric constant was increased, but temperature coefficient of resonant frequency was decreased. In the range of x$\geq$0.4, dielectric constant was about 30. 0.55BMT-0.45BCN ceramics showed excellent microwave dielectric properties with $\varepsilon$$_{r}$=30.84, Q$\times$f$_{0}$=75,325[GHz] and $\tau$$_{f}$=-2.9015[ppm/$^{\circ}C$].X>].

• 한국전자통신학회논문지
• /
• 제14권5호
• /
• pp.877-886
• /
• 2019

본 연구에서는 band anticrossing 모델을 사용하여 온도와 조성비 변화에 따른 4원계 질화물계 화합물 반도체 $In_yGa_{1-y}As_{1-x}N_x$의 에너지 밴드갭과 광학상수를 계산하였다. 300K의 조성비 구간($0{\leq}x{\leq}0.05$, $0{\leq}y{\leq}1.0$)에서 에너지 밴드갭들이 연속적으로 감소하며, 계산된 휨 매개변수는 0.522eV가 사용되었다. 에너지 밴드갭 계산 결과는 다른 연구 결과와 대체로 잘 일치하였다. 또한 에너지 밴드갭 결과를 새롭게 제안한 모델식에 적용하여 굴절률 n과 고주파 유전상수 ${\varepsilon}$를 계산하였다.

• 한국전자통신학회논문지
• /
• 제12권5호
• /
• pp.783-790
• /
• 2017

본 연구에서는 무질서 효과가 고려된, 새로이 가정한 가상 결정 근사법을 갖는 empirical pseudopotential method를 사용하여 온도와 조성비 변화에 따른 3원계 질화물계 화합물 반도체 GaP1-xNx의 휨 매개변수 및 에너지 밴드갭을 계산하였다. 300K의 조성비 구간($0{\leq}x{\leq}0.05$)에서 에너지 밴드갭들이 급격히 감소하며, 해당하는 계산된 휨 매개변수가 13.1eV임을 알 수 있었다. 에너지 밴드갭 계산 결과로부터 굴절률 n과 실수부 유전상수 함수 ${\varepsilon}$를 계산하였고, 에너지 밴드갭 계산 결과는 실험치를 대체로 잘 설명하였다.