• Title/Summary/Keyword: and Infrared (IR) detector

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Study on the Analytical Method and Monitoring of the Oxidized Polyethylene Wax in Foods (식품 중 oxidized polyethylene wax 분석법 연구 및 함유량 실태 조사)

  • Choi, Seung-Hyun;Kim, Jae-Min;Choi, Sun-il;Jung, Tae-Dong;Cho, Bong-Yeon;Lee, Jin-Ha;Lee, Gunyoung;Lim, Ho Soo;Yun, Sang Soon;Lee, Ok-Hwan
    • Journal of Food Hygiene and Safety
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    • v.32 no.4
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    • pp.284-289
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    • 2017
  • Oxidized polyethylene wax (OPEW) is, one of the food additives, used as a coating agent in citrus fruits and nuts. OPEW is authorized to quantum satis in EU, USA, and is acceptable less than 250 mg/kg in Australia and New Zealand. But OPEW is unauthorized as a food additive in Korea. This study was to establish the analytical method of OPEW and demonstrate the effective application of various food samples. We first conducted to compare the various analytical method including acid value (AV), high temperature gel permeation chromatography (HT-GPC), matrix-assisted laser desorption ionization time-of-flight mass spectrometry (MALDI-TOF/MS), gas chromatography flame ionization detector (GC-FID) and fourier transform infrared spectroscopy (FT-IR). This result indicated that FT-IR spectrum of OPEW treated food sample displayed absorption bands for carbonyl group (C=O, $1714cm^{-1}$), ester group (C-O, $1463cm^{-1}$), aliphatic group (C-H, $2916cm^{-1}$). Furthermore, IR spectrum of OPEW treated food sample showed similar tendency with IR spectrum of OPEW standard. Therefore, it is confirmed that analytical method using FT-IR can be detected on analysis of OPEW in food. As a result of monitoring of 111 samples using established analytical method, OPEW was not detected in the food samples.

Discussion of Preliminary Design Review for MIRIS, the Main Payload of STSAT-3

  • Han, Won-Yong;Jin, Ho;Park, Jang-Hyun;Nam, Uk-Won;Yuk, In-Soo;Lee, Sung-Ho;Park, Young-Sik;Park, Sung-Jun;Lee, Dae-Hee;Ree, Chang-H.;Jeong, Woong-Seob;Moon, Bong-Kon;Cha, Sang-Mok;Cho, Seoung-Hyun;Rhee, Seung-Woo;Park, Jong-Oh;Lee, Seung-Heon;Lee, Hyung-Mok;Matsumoto, Toshio
    • Bulletin of the Korean Space Science Society
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    • 2008.10a
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    • pp.27.1-27.1
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    • 2008
  • KASI (Korea Astronomy and Space Science Institute) is developing a compact wide-field survey space telescope system, MIRIS (The Multi-purpose IR Imaging System) to be launched in 2010 as the main payload of the Korea Science and Technology Satellite 3. Through recent System Design Review (SDR) and Preliminary Design Review (PDR), most of the system design concept was reviewed and confirmed. The near IR imaging system adopted short F/2 optics for wide field low resolution observation at wavelength band 0.9~2.0 um minimizing the effect of attitude control system. The mechanical system is composed of a cover, baffle, optics, and detector system using a $256\times256$ Teledyne PICNIC FPA providing a $3.67\times3.67$ degree field of view with a pixel scale of 51.6 arcsec. We designed a support system to minimize heat transfer with Muti-Layer Insulation. The electronics of the MIRIS system is composed of 7 boards including DSP, control, SCIF. Particular attention is being paid to develop mission operation scenario for space observation to minimize IR background radiation from the Earth and Sun. The scientific purpose of MIRIS is to survey the Galactic plane in the emission line of Pa$\alpha$ ($1.88{\mu}m$) and to detect the cosmic infrared background (CIB) radiation. The CIB is being suspected to be originated from the first generation stars of the Universe and we will test this hypothesis by comparing the fluctuations in I (0.9~1.2 um) and H (1.2~2.0 um) bands to search the red shifted Lyman cutoff signature.

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Poly-4-vinylphenol and Poly (melamine-co-formaldehyde)-based Tungsten Diselenide (WSe2) Doping Method

  • Nam, Hyo-Jik;Park, Hyung-Youl;Park, Jin-Hong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.194.1-194.1
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    • 2015
  • Transition metal dichalcogenide (TMD) with layered structure, has recently been considered as promising candidate for next-generation flexible electronic and optoelectronic devices because of its superior electrical, optical, and mechanical properties.[1] Scalability of thickness down to a monolayer and van der Waals expitaxial structure without surface dangling bonds (consequently, native oxides) make TMD-based thin film transistors (TFTs) that are immune to the short channel effect (SCE) and provide very high field effect mobility (${\sim}200cm^2/V-sec$ that is comparable to the universal mobility of Si), respectively.[2] In addition, an excellent photo-detector with a wide spectral range from ultraviolet (UV) to close infrared (IR) is achievable with using $WSe_2$, since its energy bandgap varies between 1.2 eV (bulk) and 1.8 eV (monolayer), depending on layer thickness.[3] However, one of the critical issues that hinders the successful integration of $WSe_2$ electronic and optoelectronic devices is the lack of a reliable and controllable doping method. Such a component is essential for inducing a shift in the Fermi level, which subsequently enables wide modulations of its electrical and optical properties. In this work, we demonstrate n-doping method for $WSe_2$ on poly-4-vinylphenol and poly (melamine-co-formaldehyde) (PVP/PMF) insulating layer and adjust the doping level of $WSe_2$ by controlling concentration of PMF in the PVP/PMF layer. We investigated the doping of $WSe_2$ by PVP/PMF layer in terms of electronic and optoelectronic devices using Raman spectroscopy, electrical measurements, and optical measurements.

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Quantitative analysis of formation of oxide phases between SiO2 and InSb

  • Lee, Jae-Yel;Park, Se-Hun;Kim, Jung-Sub;Yang, Chang-Jae;Kim, Su-Jin;Seok, Chul-Kyun;Park, Jin-Sub;Yoon, Eui-Joon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.162-162
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    • 2010
  • InSb has received great attentions as a promising candidate for the active layer of infrared photodetectors due to the well matched band gap for the detection of $3{\sim}5\;{\mu}m$ infrared (IR) wavelength and high electron mobility (106 cm2/Vs at 77 K). In the fabrication of InSb photodetectors, passivation step to suppress dark currents is the key process and intensive studies were conducted to deposit the high quality passivation layers on InSb. Silicon dioxide (SiO2), silicon nitride (Si3N4) and anodic oxide have been investigated as passivation layers and SiO2 is generally used in recent InSb detector fabrication technology due to its better interface properties than other candidates. However, even in SiO2, indium oxide and antimony oxide formation at SiO2/InSb interface has been a critical problem and these oxides prevent the further improvement of interface properties. Also, the mechanisms for the formation of interface phases are still not fully understood. In this study, we report the quantitative analysis of indium and antimony oxide formation at SiO2/InSb interface during plasma enhanced chemical vapor deposition at various growth temperatures and subsequent heat treatments. 30 nm-thick SiO2 layers were deposited on InSb at 120, 160, 200, 240 and $300^{\circ}C$, and analyzed by X-ray photoelectron spectroscopy (XPS). With increasing deposition temperature, contents of indium and antimony oxides were also increased due to the enhanced diffusion. In addition, the sample deposited at $120^{\circ}C$ was annealed at $300^{\circ}C$ for 10 and 30 min and the contents of interfacial oxides were analyzed. Compared to as-grown samples, annealed sample showed lower contents of antimony oxide. This result implies that reduction process of antimony oxide to elemental antimony occurred at the interface more actively than as-grown samples.

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Development of Passive Millimeter-wave Security Screening System (수동 밀리미터파 보안 검색 시스템 개발)

  • Yoon, Jin-Seob;Jung, Kyung Kwon;Chae, Yeon-Sik
    • Journal of the Institute of Electronics and Information Engineers
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    • v.53 no.7
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    • pp.138-143
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    • 2016
  • The designed and fabricated millimeter-wave security screening system receives radiation energy from an object and a human body. The imaging system consist of sixteen array antennas, sixteen four-stage LNAs, sixteen detectors, an infrared camera, a CCD camera, reflector, and a focusing lens. This system requires high sensitivity and wide bandwidth to detect the input thermal noise. The LNA module of the system has been measured to have 65.8 dB in average linear gain and 82 GHz~102 GHz in bandwidth to enhance the sensitivity for thermal noise, and to receive it over a wide bandwidth. The detector is used for direct current (DC) output translation of millimeter-wave signals with a zero bias Schottky diode. The lens and front-end of the millimeter-wave sensor are important in the system to detect the input thermal noise signal. The frequency range in the receiving sensitivity of the detectors was 350 to 400 mV/mW at 0 dBm (1 mW) input power. The developed W-band imaging system is effective for detecting and identifying concealed objects such as metal or plastic.