• Title/Summary/Keyword: all-ceramics

Search Result 502, Processing Time 0.025 seconds

The microwave dielectric properties of $Bi_{(1-x)}Tm_xNbO_4$ (마이크로파 유전체 $Bi_{(1-x)}Tm_xNbO_4$의 유전특성)

  • Hwang, Chang-Gyu;Jang, Gun-Eik
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2002.07b
    • /
    • pp.662-665
    • /
    • 2002
  • The microwave dielectric properties and the microstructures of $Tm_2O_3$-modified $BiNbO_4$ ceramics were investigated. $Bi_{(1-x)}Tm_xNbO_4$ ceramics combined with orthorhombic and triclinic phases were identified at sintering temperatures of $920{\sim}960^{\circ}C$. The apparent density decreased slightly with the increasing Tm content. Regardless of the Tm content the dielectric constant $(\varepsilon_r)$ of all compositions except x=0.1 in $Bi_{(1-x)}Tm_xNbO_4$ ceramics saturated at the range of 42~44. The $Q{\times}f_0$ values of 6,000-12,000(GHz) were obtained for all compositions when the sintering temperatures were in the range of $920{\sim}960^{\circ}C$. The temperature coefficient of the resonant frequency$(\tau_f)$ can be also adjusted with increasing the amount of the doped Tm from a positive value of $+15ppm/^{\circ}C$ to a negative value of $-20ppm/^{\circ}C$. The $Bi_{(1-x)}Tm_xNbO_4$ ceramics can be possibly applied to multilayer microwave devices with low processing temperatures.

  • PDF

Electrochemical Properties of (Li0.5-xNaxLa0.5)Ti0.8Zr0.2O3 Ceramics as Improved Electrolyte Materials for Li-ion Batteries

  • Lee, Seung-Hwan;Kim, Hong-Ki;Yun, Ye-Sol;Jeong, Tae-Hoon;Nam, Sung-Pill;Kim, Young-Sung;Kim, Jae-Chul;Lee, Ku-Tak;Im, In-Ho
    • Transactions on Electrical and Electronic Materials
    • /
    • v.15 no.2
    • /
    • pp.96-99
    • /
    • 2014
  • We fabricated $(Li_{0.5-x}Na_xLa_{0.5})Ti_{0.8}Zr_{0.2}O_3$(LNTLZ)ceramics ($0{\leq}x{\leq}0.4$) with a perovskite structure via standard solid state synthesis. The influence of Na content on the structural and electrical properties of LNTLZ ceramics was also investigated. During XRD patterns analysis, all of the samples showed orthorhombic structure. The resistance of LNTLZ ceramics decreased as Na content increased, and the maximum activation energy shows 0.56 eV at x=0.4 at room temperature. These results indicated that LNTLZ ceramics are a candidate for use Lithium ion batteries as electrolytes.

Microwave Dielectric Properties of Sb substituted $BiNbO_4$ Ceramics (Sb 치환에 따른 $BiNbO_4$ 세라믹스의 고주파 유전특성의 변화)

  • Lim, Hyouk;Oh, Young-Jei;Chio, Seo-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2002.07b
    • /
    • pp.646-649
    • /
    • 2002
  • The microwave dielectric properties and the structure of $Sb_2O_5$ modified $BiNb_xSb_{1-x}O_4$ ceramics were investigated. The structure of these ceramics were orthohombic phase at all sintering temperatures and there were not the second phase. These ceramics added sintering additive such as CuO and $V_2O_5$ were sinterable at a low temperature$(880^{\circ}C{\sim}960^{\circ}C)$ by liquid phase. Dielectric properties of $BiNb_xSb_{1-x}O_4$ ceramics were also improved than these of $BiNbO_4$ ceramics. The content of modified atom controlled the microstructure, dielectric constant and quality factor. As a result, We could obtain following result; ${\varepsilon}r$=42~44, $Q{\cdot}f_0$=20,000~42,000GHz, $\tau_f=-7{\sim}-28ppm/^{\circ}C$.

  • PDF

Development of the dielectric ceramics with low loss for microwave applications (고주파 응용을 위한 저손실 유전체 세라믹스의 개발)

  • Kim, Jae-Sik;Choi, Eui-Sun;Ryu, Ki-Won;Lee, Young-Hie
    • Proceedings of the KIEE Conference
    • /
    • 2008.07a
    • /
    • pp.1250-1251
    • /
    • 2008
  • In this study, the dielectric ceramics with low loss were investigated for high frequency application. All sample of the $Ba_5M_4O_{15}$ (M=Ta, Nb) ceramics were prepared by the conventional mixed oxide method and sintered at $1325{\sim}1575^{\circ}C$. The bulk density and dielectric constant of the $Ba_5Ta_4O_{15}$ ceramics were increased continuously with increasing of sintering temperature. The quality factor was increased in the sintering temperature of $1375{\sim}1475^{\circ}C$ but decreased at the temperature above 1475$^{\circ}C$. In the case of $Ba_5Nb_4O_{15}$ ceramics, the bulk density, dielectric constant and quality factor were increased with sintering temperature but decreased above temperature of 1400$^{\circ}C$. The dielectric constant, quality factor and temperature coefficient of the resonant frequency (TCRF) of the $Ba_5Ta_4O_{15}$ and $Ba_5Nb_4O_{15}$ ceramics, sintered at 1475$^{\circ}C$ and 1400$^{\circ}C$, were 25.15, 53105 GHz, -3.06 ppm/$^{\circ}C$ and 39.55, 28052 GHz, 5.7 ppm/$^{\circ}C$, respectively.

  • PDF

Microwave Dielectric Properties of $TiTe_3O_8$ Ceramics with addition at $CaF_2$ ($CaF_2$ 첨가에 따른 $TiTe_3O_8$ 세라믹스의 마이크로파 유전특성)

  • Lee, Moon-Kee;Kim, Jae-Sik;Choi, Eui-Sun;Ryu, Ki-Won;Lee, Young-Hie
    • Proceedings of the KIEE Conference
    • /
    • 2003.07c
    • /
    • pp.1589-1591
    • /
    • 2003
  • The microwave dielectric properties of $TiTe_3O_8-CaF_2$ ceramics were investigated. All sample of $TiTe_3O_8-CaF_2$ ceramics were prepared by the conventional mixed oxide method, and sintered in the temperature of $730^{\circ}C{\sim}750^{\circ}C$. The structural properties of $TiTe_3O_8-CaF_2$ ceramics were investigated by the X-ray diffractor meter. According to the X-ray diffraction patterns of $TiTe_3O_8-CaF_2$ ceramics, the major phase of the cubic $TiTe_3O_8$ were presented. In the case of $1molTiTe_3O_8-0.1molCaF_2$ ceramics sintered at $740^{\circ}C$ for 5hr., the bulk density, dielectric constant, quality factor were $2.8g/cm^3$, 39.1, 36.100GHz, respectively.

  • PDF

Microwave Dielectric Properties of $0.6Mg_4Ta_2O_9-0.4TiO_2$ Ceramics with Sintering Temperature (소결은도에 따른 $0.6Mg_4Ta_2O_9-0.4TiO_2$ 세라믹스의 마이크로파 유전특성)

  • Kim, Jae-Sik;Choi, Eui-Sun;Park, In-Gil;Lee, Young-Hie
    • Proceedings of the KIEE Conference
    • /
    • 2003.07c
    • /
    • pp.1541-1543
    • /
    • 2003
  • The microwave dielectric properties of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics were investigated. All sample of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics were prepared by the conventional mixed oxide method, and sintered in the temperature of $1350^{\circ}C{\sim}1450^{\circ}C$. The structural properties of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics were investigated by the X-ray diffraction meter. According to the X-ray diffraction patterns of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics, the major phase of the hexagonal $0.6Mg_4Ta_2O_9-0.4TiO_2$ were presented, In the case of $0.6Mg_4Ta_2O_9-0.4TiO_2$ ceramics sintered at $1400^{\circ}C$ for 5hr., the dielectric constant, quality factor and temperature coefficient of resonant frequency were 12.19, 109.411GHz, -17.21ppm/$^{\circ}C$, respectively.

  • PDF

Cryogenic microwave dielectric properties of Mg2TiO4 ceramics added with CeO2 nanoparticles

  • Bhuyan, Ranjan K.;Thatikonda, Santhosh K.;Dobbidi, Pamu;Renehan, J.M.;Jacob, Mohan V.
    • Advances in materials Research
    • /
    • v.3 no.2
    • /
    • pp.105-116
    • /
    • 2014
  • The microwave dielectric properties of $CeO_2$ nanoparticles (0.5, 1.0 & 1.5wt%) doped $Mg_2TiO_4$ (MTO) ceramics have been investigated at cryogenic temperatures. The XRD patterns of the samples were refined using the full proof program reveal the inverse spinel structure without any secondary phases. The addition of $CeO_2$ nanoparticles lowered the sintering temperature with enhancement in density and grain size as compared to pure MTO ceramics. This is attributed to the higher sintering velocity of the fine particles. Further, the microwave dielectric properties of the MTO ceramics were measured at cryogenic temperatures in the temperature range of 6.5-295 K. It is observed that the loss tangent ($tan{\delta}$) of all the samples increased with temperature. However, the $CeO_2$ nanoparticles doped MTO ceramics manifested lower loss tangents as compared to the pure MTO ceramics. The loss tangents of the pure and MTO ceramics doped with 1.5 wt% of $CeO_2$ nanoparticles measured at 6.5K are found to be $6.6{\times}10^{-5}$ and $5.4{\times}10^{-5}$, respectively. The addition of $CeO_2$ nanoparticles did not cause any changes on the temperature stability of the MTO ceramics at cryogenic temperatures. On the other hand, the temperature coefficient of the permittivity increased with rise in temperature and with the wt% of $CeO_2$ nanoparticles. The obtained lower loss tangent values at cryogenic temperatures can be attributed to the decrease in both intrinsic and extrinsic losses in the MTO ceramics.

Microstructure and Dielectric Properties of Low Temperature Sintering (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3 System Ceramics (저온소결 (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3계 세라믹스의 미세구조와 유전 특성)

  • Yoo, Ju-Hyun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.29 no.7
    • /
    • pp.404-407
    • /
    • 2016
  • In this study, to develop low temperature sintering capacitor composition ceramics with the good dielectric properties, $(Ba_{0.86}Ca_{0.14})(Ti_{0.85}Zr_{0.12}Sn_{0.03})O_3$ (BCTZ) ceramics were prepared by the conventional solid-state reaction method. The effects of $B_2O_3$ addition on the dielectric properties and microstructure was investigated. The XRD patterns demonstrated that all the specimens showed Perovskite phase, and secondary phases are indicated in the measurement range of XRD. And also, temperature coefficient of capacitance(TCC) of all the specimen sintered at $1,180^{\circ}C$ showed +3~-56% except for x=0.006. For all the specimens, observed one peak was tetragonal cubic difuse phase transition temperature(Tc), which is located in the vicinity of room temperature.

Microstructure and Dielectric Properties of (Ba1-xCax)(Ti0.85Zr0.12Sn0.03)O3 Ceramics ((Ba1-xCax)(Ti0.85Zr0.12Sn0.03)O3계 세라믹스의 미세구조 및 유전 특성)

  • Shin, Sang-Hoon;Yoo, Ju-Hyun;Shin, Dong-Chan
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.27 no.12
    • /
    • pp.797-802
    • /
    • 2014
  • In this study, in order to develop the capacitor composition ceramics with the good dielectric properties, $(Ba_{1-x}Ca_x)(Ti_{0.85}Zr_{0.12}Sn_{0.03})O_3$ (abbreviated as BCTZ) ceramics were prepared by the conventional solid-state reaction method. The effects of Ca substitution on the microstructure and dielectric properties was investigated. The X-ray diffraction patterns demonstrated that all the specimens showed perovskite phase, and secondary phases are indicated in the measurement range of X-ray diffraction. Also, all the specimens indicated an rhombohedron phase structure. It was identified from the X-ray diffraction patterns that the secondary phase formed in grain boundaries and then decreased the dielectric properties. For all the specimens, observed one peak was tetragonal cubic phase transition temperature($T_c$), which is located in the vicinity of room temperature.

Reliability Improvement of Titania Ceramics with Surface Flaw Through High Voltage Screening

  • Tanaka, Tomohiro;Kishimoto, Akira
    • The Korean Journal of Ceramics
    • /
    • v.5 no.4
    • /
    • pp.386-389
    • /
    • 1999
  • Effect of high voltage screening was examined on mechanical strength of titania ceramics with two different surface roughness. Roughly finished sample showed degraded mechanical strength meaning that the introduced flaw played the role of starting point of mechanical fracture. On such sample, electrically weak parts were eliminated by applying a screening field. Mechanical strength measurement on survived parts revealed that after screening the Weibull plots bended to become a convex curve while plots at high strength region were almost the same. This result means that relatively low mechanical strength parts were eliminated by the electrical method. As a result the Weibull modulus calculated from all the data increased, demonstrating the effect of high voltage screening on titania ceramics containing fracture controlling surface flaws. Roles of the surface flaw such as a common weak spot for both failures are disscussed in relation to the electric field concentration similar to that of mechanical stress.

  • PDF