• International Journal of Reliability and Applications
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• v.18 no.2
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

• Journal of the Korean Statistical Society
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• v.18 no.2
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• pp.125-134
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• 1989

This paper presents optimum simple step-stress accelerated life test plans for the case where the test process is observed periodically at intervals of the same length. Two types of failure data, periodically observed complete data and periodically observed censored data, are considered. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model for the effect of changing stress are assumed. For each type of data, the optimum test plan which minimizes the asymptotic variance of the maximum likelihood estimator of the mean life at a design stress is obtained and its behaviors are studied.

• Journal of Korean Society for Quality Management
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• v.43 no.2
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• pp.169-184
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• 2015

Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.

• Proceedings of the Safety Management and Science Conference
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• 2006.04a
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• pp.411-419
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• 2006

This paper aims at designing an accelerated life test sampling plan for bulk material and showing its application for an arc-welded gas pipe. It is an integrated model of the accelerated life test procedure and bulk sampling procedure. The accelerated life tests were performed by the regulation, RSD 0005 of ATS at KITECH and bulk sampling was used for acceptance. Design parameters might be total sample size(segments and increments), stress level and so on. We focus on deciding the sample size by minimizing the asymptotic variance of test statistic as well as satisfying consumer's risk under Weibull life time distribution with primary information on shape parameter.

• Journal of Applied Reliability
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• v.11 no.3
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• pp.281-291
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• 2011

This paper presents an accelerated life test of booster pump for home water purifier. The failure analysis shows that decreased flux due to the plastic deformation of bypass spring adjusting pressure is the predominant failure mechanism. An accelerated life test is designed and implemented to estimate the lifetime of the booster pump. Temperature, water pressure and voltage are selected as accelerating variables through the technical review about failure mechanism. It is assumed that the lifetimes of booster pumps follow lognormal distribution and the combination model of temperature and non-thermal stresses holds. The life-stress relationship, acceleration factor, and $B_{10}$ life at design condition are estimated by analyzing the accelerated life test data.

• The Korean Journal of Applied Statistics
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• v.13 no.2
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• pp.563-573
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• 2000

In this paper, we propose three estimators of Kullback-Leibler Information functions using the data from accelerated life tesb. This acceleration model is assumed to be a tampered random variable model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

• Journal of the Korea Safety Management & Science
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• v.4 no.3
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• pp.59-66
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• 2002

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, S, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, $\theta$ is a random variable of environments and a function of probabilistic stress. In detail, it is assumed that the hazard rate is linear function of the stress, the general stress distribution is a gamma distribution and the life distribution for the given hazard rate, $\theta$is an exponential distribution. Maximum likelihood estimators of model parameters are obtained, and the mean life in use stress condition is estimated. A hypothetical example is given to show its applicability.

• Proceedings of the Korean Reliability Society Conference
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• 2006.05a
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• pp.93-100
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• 2006

The failure of hydraulic hose assemblies is caused by the impulse pressure and repetitive motions of bending and stretching (flexing) used at high pressure pipe in the form of bursting Since it takes long time to observe the bursting for life analysis, we can reduce test time by the method of applying the Knockdown stress which is equivalent to 70% of initial bursting pressure on rubber hose assemblies with maintaining the failure mode equally In this study, after scale parameter, shape parameter, and acceleration factor by preforming the impulse pressure test until the hose bursts, and finally analyzed the accelerated life.

• Journal of Korean Society for Quality Management
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• v.23 no.1
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• pp.29-40
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• 1995

This paper considers the problem of optimally designing accelerated degradation tests in which the performance value of a specimen is measured only at one of three test conditions for a given exposure time. For the product having lognormally distributed performance, the optimum plan-low stress level and sample proportion allocated to each test condition - is obtained, which minimize the asymptotic variance of maximum likelihood estimator of a stated quantile at design stress. An illustrative example for the optimum plan is given.

• Journal of Korean Society for Quality Management
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• v.41 no.4
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• pp.659-672
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• 2013

Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.