• Korean Chemical Engineering Research
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• v.50 no.5
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• pp.778-782
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• 2012

Until a recent day, degradation of PEMFC MEA (membrane and electrode assembly) has been studied, separated with membrane degradation and electrode degradation, respectively. But membrane and electrode were degraded coincidentally at real PEMFC operation condition. Therefore in this work, AST (Accelerated Stress Test) of MEA degradation was done at the condition that membrane and electrode were degraded simultaneously. There was interaction between membrane degradation and electrode degradation. Membrane degradation reduced the decrease range of catalyst active area by electrode degradation. Electrode degradation reduces increase range of the hydrogen crossover current and FER (Fluoride Emission Rate) by membrane degradation.

• Journal of Welding and Joining
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• v.15 no.1
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• pp.46-54
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• 1997

The object of this paper is to evaluate SCC(stress corrosion cracking) susceptibility for parent metal and bond line region of weld joints which have the various weld heat input condtions in TMCP(thermo-mechanical control process) steel by SP-SSRT(small punch-slow strain rate test) method. And the SCC test results of TMCP steel are compared with those of the conventional HT50 steel which has te almost same tensile strength level like TMCP steel. The loading rate used was $3\times10^{-4}$mm/min and the corrosive environment was synthetic sea water. According to the test results, in the case of parent metal, TMCP steel showed higher SCC susceptibility than HT50 steel because of the high plastic strain level of ferrite microstructure obtained by accelerated cooling. And in the case of bond line, the both TMCP steel and HT50 steel showed low load-displacement behaviors and higher SCC susceptibility above 0.6. These results may be caused by theembrittled martensite structure on HT50 steel and by the coarsened grain and the proeutectoid ferrite structure obtained by the impart of accelerated cooling effect on TMCP steel.

• Journal of the Korea Safety Management & Science
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• v.9 no.5
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• pp.43-48
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• 2007

This paper is to present linkage parameter to integrate statistical models and physical models for accelerated life test. Statistical models represent the relationship of probability distribution and life. Physical models show the relationship of life and stress. Moreover, this study proposes the four steps for construction of integrated models for accelerated life test using linkage parameter. Finally, this paper develops new integrated models such as extreme value distribution-general Eyring, linearly increasing failure rate function-general Eyring, etc., and estimates various reliability measures.

• Journal of Applied Reliability
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• v.8 no.2
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• pp.75-85
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• 2008

In this paper, we compared domestic with foreign pilot lamps installed on the instrument board or electronic modules (car audio, air-conditional system, etc.) of an automotive vehicle by an accelerated life test in order to estimate the life of domestic pilot lamps. An accelerated life test method was developed and the relation of the life and voltage stress was analyzed. The main results are as follows; i) $B_{10}$ life of pilot lamp is above 5,000 hours, vehicle travel time for 10 years. ii) the life of domestic pilot lamp is longer than that of foreign thing. iii) the life distribution of domestic pilot lamp is wider than that of foreign thing. iv) it is possible to promote import replacement of automobile pilot lamp.

• Transactions on Electrical and Electronic Materials
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• v.10 no.1
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• pp.5-8
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• 2009

The reliability of multilayer ceramic capacitor with active thin dielectric layer was investigated by highly accelerated life test at various stress condition. The distribution of multilayer ceramic capacitor failure times is plotted as a function of time from Weibull distribution function. According to the test result, voltage acceleration factor is obtained from 2.24 to 2.96. The acceleration by temperature is much higher than other values of active thick dielectric layer. It is clear that median time to failure is affected by the stress voltage for high volumetric efficiency ceramic capacitors with active thin dielectric layer. The degradation under stress of voltage involves electromigration and accumulation of oxygen vacancy at Ni electrode interface of cathode.

• Journal of Electrical Engineering and Technology
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• v.3 no.2
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• pp.184-191
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• 2008

Electrical endurance is the critical characteristic of Magnetic contactors(MCs), which are widely used in such power equipment as elevators, cranes, and factory control rooms in order to close and open control circuits. Testing time, however, is not short in typical cases in which some method of reducing the testing period is required. This study shows the method of determining the stress level of electrical ALT(Accelerated Life Test) through optical temperature sensor and the relationship between 0.05 s and 0.1 s for on-time. The tool used for analyzing the test result is MINITAB. I will propose the method of determining the optimized stress level through optical temperature sensor, which will contribute to minimize the testing time and development period and also raise the product reliability.

• Journal of Applied Reliability
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• v.9 no.4
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• pp.275-290
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• 2009

This paper considers accelerated thermal degradation tests which are performed for rubber seal materials used for undersea tunnels constructed by immersion method. Three types of rubber seals are tested; rubber expansion seal, omega seal, and shock absorber hose. Main ingredient of rubber expansion seal is EPDM(Ethylene Propylene Diene Monomer) and that of both omega seal and shock absorber hose is SBR(Styrene Butadiene Rubber). The accelerated stress is temperature and an Arrhenius model is introduced to describe the relationship between the lifetime and the stress. From the accelerated degradation tests, dominant failure mode of the rubber seals is found to be the loss of elongation. The lifetime distribution and the service life of the rubber seals at use condition are estimated from the test results. The acceleration factor for three types of rubber seals are also investigated.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.481-484
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• 2003

Recently polymer insulators are being used for outdoor high voltage applications. Polymer insulators have significant advantages over porcelain and glass insulators. With the gradual improvement of their design and material, their reliability has also increased. It is however difficult to establish how they will perform after several years of service. Aging of the insulator weathershed may lead to damages such as excessive chalking and crazing, erosion and tracking which affect the insulator performance. In service insulator are subjected to aging stresses such as humidity, pollution and electrical field which act singly or in combination. There have been numerous accelerated laboratory tests developed with the intention of evaluating suitability of polymeric materials. Some of these are strictly material tests, where as, others evaluate full scale devices. Service experience plays a key role in the utility selection of polymer insulator, but is time consuming, and may not always be available. Hence there is a need for a meaningful and reliable accelerated aging test for polymer insulator. This paper describes multi-stress aging test for reliability of polymer insulator This paper presents the rule of multi-stress aging test and test chamber for polymer insulator in korea electrotechnology research institute.

• The KSFM Journal of Fluid Machinery
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• v.16 no.5
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• pp.29-35
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• 2013

Butterfly valve seated rubber has been widely used in water works and industrial fields because it has advantages which are small installation area and low weight. The size and material of butterfly valve have been selected by service environments and purposes. But there are out of the ordinary to find papers for the life characteristics of the butterfly valve. So, this study carries out the accelerated life test, which has an acceleration factor with pressure, using performance and life test equipment. Accelerated model is adopted with 3 stress level and the inverse power law model to estimate the life of the test samples. After the analysis of the test result, accelerated index has 7.0 and the acceleration factor has 208 which is applied with field condition with the pressure 6.3 bar.

• Current Photovoltaic Research
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• v.2 no.3
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• pp.140-145
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• 2014

The globally used PV qualification tests and reports the pass/fail only. Therefore, the reliability of new PV materials and parts can't be compared quantitatively with the reliability of the PV parts and materials in the market. Global PV materials and parts companies test and compare their materials, parts, and modules using the failure-to-test (FTT). However, it takes a long accelerated stress test (AST) until failure. It also needs to test the new and existing materials and parts. Therefore, it requires excessive equipment time and cost. In order to reduce the time and cost, a new reliability enhancement methodology has been developed. It tests the PV materials, parts, and modules in the global market and stores them in the PV reliability database. It reduces the time and cost of the comparison and enhancement of PV reliability. An example of the reliability enhancement of the PV encapsulant, EVA is presented.