• Journal of Korean Society of Industrial and Systems Engineering
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• v.46 no.4
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• pp.312-320
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• 2023

Recently, there has been an increasing attempt to replace defect detection inspections in the manufacturing industry using deep learning techniques. However, obtaining substantial high-quality labeled data to enhance the performance of deep learning models entails economic and temporal constraints. As a solution for this problem, semi-supervised learning, using a limited amount of labeled data, has been gaining traction. This study assesses the effectiveness of semi-supervised learning in the defect detection process of manufacturing using the MixMatch algorithm. The MixMatch algorithm incorporates three dominant paradigms in the semi-supervised field: Consistency regularization, Entropy minimization, and Generic regularization. The performance of semi-supervised learning based on the MixMatch algorithm was compared with that of supervised learning using defect image data from the metal casting process. For the experiments, the ratio of labeled data was adjusted to 5%, 10%, 25%, and 50% of the total data. At a labeled data ratio of 5%, semi-supervised learning achieved a classification accuracy of 90.19%, outperforming supervised learning by approximately 22%p. At a 10% ratio, it surpassed supervised learning by around 8%p, achieving a 92.89% accuracy. These results demonstrate that semi-supervised learning can achieve significant outcomes even with a very limited amount of labeled data, suggesting its invaluable application in real-world research and industrial settings where labeled data is limited.

• Journal of Institute of Control, Robotics and Systems
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• v.21 no.6
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• pp.565-570
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• 2015

Supervised machine learning has become popular in discovering context descriptions from sensor data. However, collecting a large amount of labeled training data in order to guarantee good performance requires a great deal of expense and time. For this reason, semi-supervised learning has recently been developed due to its superior performance despite using only a small number of labeled data. In the existing semi-supervised learning algorithms, unlabeled data are used to build a graph Laplacian in order to represent an intrinsic data geometry. In this paper, we represent the unlabeled data as the spatial-temporal dataset by considering smoothly moving objects over time and space. The developed algorithm is evaluated for position estimation of a smartphone-based robot. In comparison with other state-of-art semi-supervised learning, our algorithm performs more accurate location estimates.

• IEMEK Journal of Embedded Systems and Applications
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• v.18 no.6
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• pp.285-292
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• 2023

With the wide spread of smart farms and the advancements in IoT technology, it is easy to obtain additional data in addition to crop images. Consequently, deep learning-based crop disease diagnosis research utilizing multimodal data has become important. This study proposes a crop disease diagnosis method using multimodal supervised contrastive learning by expanding upon the multimodal self-supervised learning. RandAugment method was used to augment crop image and time series of environment data. These augmented data passed through encoder and projection head for each modality, yielding low-dimensional features. Subsequently, the proposed multimodal supervised contrastive loss helped features from the same class get closer while pushing apart those from different classes. Following this, the pretrained model was fine-tuned for crop disease diagnosis. The visualization of t-SNE result and comparative assessments of crop disease diagnosis performance substantiate that the proposed method has superior performance than multimodal self-supervised learning.

• Journal of the Korean Data and Information Science Society
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• v.18 no.3
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• pp.629-636
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• 2007

A kernel type semi-supervised estimate is proposed. The proposed estimate is based on the penalized least squares loss and the principle of Gaussian Random Fields Model. As a result, we can estimate the label of new unlabeled data without re-computation of the algorithm that is different from the existing transductive semi-supervised learning. Also our estimate is viewed as a general form of Gaussian Random Fields Model. We give experimental evidence suggesting that our estimate is able to use unlabeled data effectively and yields good classification.

• Journal of Information Technology Applications and Management
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• v.15 no.1
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• pp.225-242
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• 2008

PM (Inconsistency Pattern Modeling) is a hybrid supervised learning technique using the inconsistence pattern of input variables in mining data sets. The IPM tries to improve prediction accuracy by combining more than two different supervised learning methods. The previous related studies have shown that the IPM was superior to the single usage of an existing supervised learning methods such as neural networks, decision tree induction, logistic regression and so on, and it was also superior to the existing combined model methods such as Bagging, Boosting, and Stacking. The objectives of this paper is explore the characteristics of the IPM. To understand characteristics of the IPM, three experiments were performed. In these experiments, there are high performance improvements when the prediction inconsistency ratio between two different supervised learning techniques is high and the distance among supervised learning methods on MDS (Multi-Dimensional Scaling) map is long.

• Journal of the Semiconductor & Display Technology
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• v.19 no.4
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• pp.121-125
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• 2020

With miniaturization of semiconductor, the manufacturing process become more complex, and undetected small changes in the state of the equipment have unexpectedly changed the process results. Fault detection classification (FDC) system that conducts more active data analysis is feasible to achieve more precise manufacturing process control with advanced machine learning method. However, applying machine learning, especially in supervised learning criteria, requires an arduous data labeling process for the construction of machine learning data. In this paper, we propose a semi-supervised learning to minimize the data labeling work for the data preprocessing. We employed equipment status variable identification (SVID) data and optical emission spectroscopy data (OES) in silicon etch with SF6/O2/Ar gas mixture, and the result shows as high as 95.2% of labeling accuracy with the suggested semi-supervised learning algorithm.

• Journal of Wind Energy
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• v.13 no.3
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• pp.33-42
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• 2022

In this paper, a semi-supervised machine learning technique applied to actual field vibration data acquired from Jeju-do wind turbines for predictive diagnosis of abnormal conditions of offshore wind turbines is introduced. Semi-supervised machine learning, which combines un-supervised learning with supervised learning, can be used to perform anomaly detection in situations where sufficient fault data cannot be obtained. The signal processing results using the spectrogram of the original signal were shown, and external data were used to overcome the problem that disturbance reactions easily occurred due to the imbalance between the number of normal and abnormal data. Out of distribution (OOD), which uses external data, is a technology that is regarded as abnormal data that is unlikely to occur in reality, but we were able to use it by expanding it. By rearranging the distribution of data in this way, classification can be performed more robustly. Specifically, by observing the trends of the abnormal score and the change in the feature of the representation layer, continuous learning was performed through a mixture of existing and new data.

• Journal of Positioning, Navigation, and Timing
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• v.5 no.4
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• pp.173-180
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• 2016

This paper presents a method to suppress multipath induced by pulses using supervised learning. In modern electronics, pulses have been used for various purposes such as communication or distance measurements. Like other signals, pulses also suffer from multipath. When a pulse and a multipath are overlapped, the original pulse shape is distorted. The distorted pulse could result in communication failures or distance measurement errors. However, a large number of samples available from a pulse can be used to effectively reject multipath by using a supervised learning method. This paper introduces how a supervised learning method can be applied to Distance Measuring Equipment. Simulation results show that multipath induced distance measuring error can be suppressed by 10 ~ 45 percent depending on the allowed pulse shape variation allowed in a standard.

• The Journal of the Korea institute of electronic communication sciences
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• v.14 no.4
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• pp.701-706
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• 2019

The advent of the AI(: Artificial Intelligence) has applied to many industrial and general applications have havingact on our lives these days. Various types of machine learning methods are supported in this field. The supervised learning method of the machine learning has features and targets as an input in the learning process. There are many supervised learning methods as well and their performance varies depends on the characteristics and states of the big data type as an input data. Therefore, in this paper, in order to compare the performance of the various supervised learning method with a specific big data set, the supervised learning methods supported in the Tensorflow and the Sckit-Learn are simulated and analyzed in the Jupyter Notebook environment with python.

• Journal of KIISE
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• v.42 no.12
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• pp.1561-1567
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• 2015

Abstract Semi-supervised learning is an area in machine learning that employs both labeled and unlabeled data in order to train a model and has the potential to improve prediction performance compared to supervised learning. Graph-based semi-supervised learning has recently come into focus with two phases: graph construction, which converts the input data into a graph, and label inference, which predicts the appropriate labels for unlabeled data using the constructed graph. The inference is based on the smoothness assumption feature of semi-supervised learning. In this study, we propose an enhanced label inference algorithm by incorporating the importance of each vertex. In addition, we prove the convergence of the suggested algorithm and verify its excellence.