• Proceedings of the Materials Research Society of Korea Conference
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• 2003.03a
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• pp.191-191
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• 2003

가시광선영역에서 높은 광학적 투명도를 갖는 n-type 반도체인 ZnO 박막은 넓은 범위에서 응용되고 있다. 현재 ZnO 박막의 특성 향상을 위하여 여러 원소(Al, Ga)의 도핑을 시도하고 있다. 특히 Al-doped ZnO 박막은 sol-gel dip coating에 의해서도 높은 전기전도도와 투과율로 활발히 연구되고 있다 본 논문에서는 여러 도핑농도를 갖는 Al-doped ZnO 박막이 sol-gel dip coating법에 의해 준비되었다. Al-doped ZnO 박막은 zinc acetate [Zn($CH_3$COO$_2$)ㆍ2$H_2O$] powder 와 여러 도핑농도를 갖는 aluminum nitrate (Al(NO$_3$)$_3$ㆍ9$H_2O$) powder를 알코올에 용해하여 $H_2O$, Ethylene glycol, Ethylene diamine 등을 첨가하여 제조하였다 XRD와 SEM (Scanning electron microscope)이 막의 상형성 분석을 위해 이용되었으며, 가시광선 영역 투과율(UV/VIS spectrophotometer)과 표면전기저항(four point probe)이 주요 특성으로 분석되었다.

• Journal of Sensor Science and Technology
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• v.16 no.4
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• pp.307-312
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• 2007

The films of Er-doped ZnO (ZnO:Er) were prepared onto MgO wafers by ultrasonic spray pyrolysis at $550^{\circ}C$. The concentration of Er in the deposition source varied from 0.5 wt% to 3.0 wt%. The crystallographic properties and surface morphologies of the films were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM), respectively. The properties of photoluminescence (PL) for the films were investigated by dependence of PL spectra on the Er concentration in the films. The films were grown as polycrystalline with a dominant direction of [002]. The grain size of the films were reduced by Er-doping. Er-doping enhanced the ultraviolet emission of ZnO:Er films. The ZnO:Er films prepared with the deposition source of 2.0 wt% Er showed the strongest ultraviolet light emission peak among the films in this study.

• Proceedings of the Optical Society of Korea Conference
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• 2003.07a
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• pp.38-39
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• 2003

전기적 저항이 낮은 투명 박막 물질은 현재 flat panel display, electroluminescent device, thin film transistor, solar cell 등 여러 분야에서 연구되고 있다. 그 중에서도 특히 ZnO：Ga는 현재 많이 쓰이는 ITO보다 화학적, 열적으로 안정한 상태를 보이는 투명 전도 산화막 물질로써 본 연구에서는 분광타원법을 이용하여 ZnO：Ga의 광학적 특성을 분석하였다. 본 연구를 위한 시료는 온도에 따른 ZnO：Ga／Sapphire 박막, $O_2$의 압력에 따른 ZnO：Ga／Sapphire 박막, Ga의 doping 농도에 따른 ZnO：Ga／Sapphire 박막으로 제작하였으며, 위상변조형 분광타원계(spectroscopic Phase Modulated Ellipsometer, Jobin-Yvon, UVISEL)를 사용하여 측정대역을 0.74 ~ 4.5 eV, 입사각을 70$^{\circ}$로 하여 측정하였다. (중략)

• 한국신재생에너지학회:학술대회논문집
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• 2009.06a
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• pp.90-90
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• 2009

박막 태양전지의 단락전류를 증가시키기 위해서는 투명전도 산화막의 표면 식각을 통한 광포획 특성 극대화가 중요하며, 일반적으로 스퍼터링법으로 제작된 투명전도 산화막의 표면 식각은 HCl solution을 이용한다. 본 연구는 투면전도 산화막 증착시 seed로 작용할 수 있는 colloidal 형태의 nanoparticle을 유리기판에 형성한 뒤 rf-magnetron sputtering 법을 이용하여 ZnO:Al(AZO) 투명전도 산화막을 증착하여 광학 전기적 특성 변화를 분석하였다. Nanoparticle을 사용하여 제조된 AZO 박막은 nanoparticle의 확산에 의한 전자농도의 향상이 보였으나, 이동도의 감소로 인해 전기적 특성에 큰 변화는 없었다. 반면 AZO 박막의 표면형상이 nanoparticle로 인해 변하여 박막의 광 포획을 위한 안개도가 향상됨을 확인 할 수 있었으며, 이로 인해 표면 형상 제어를 통한 박막 태양전지 적용을 위한 투명전도 산화막을 제작할 수 있었다.

• Journal of Sensor Science and Technology
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• v.13 no.1
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• pp.66-71
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• 2004

Pt-doped zinc oxide (ZnO:Pt) films were deposited by ultrasonic spray pyrolysis. Resistivity variation with Pt concentration was measured. The Pt distribution in ZnO:Pt films was studied through Auger Electron Spectroscopy (AES). The ZnO:Pt films were annealed in the ambient of air, water vapor and ozone, respectively. The variation in crystallographic properties and surface morphologies with respect to the annealing condition was observed by X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). The resistivity variation of the films with the annealing condition was measured. Finally, Atomic Force Microscopy (AFM) measurements were carried out to study the effects of the annealing on the roughness of ZnO:Pt films.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.535-538
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• 2004

Zinc Oxide (ZnO) films have attracted considerable attention for transparent conducting films, because of their high conductivity, good optical transmittance from UV to near IR as well as a low-cost fabrication. To increase the conductivity of ZnO, doping of group III elements (Al, Ga, In and B) has been carried out. Transparent conducting films have been applied for optoelectric devices, the development of the transparent conducting thin films on flexible light-weight substrates are required. In this research, the transparent conducting ZnO thin films doped with Aluminum (Al) on polymer substrates were deposited by the RF magnetron suputtering method, and the structural, optical and electrical properties were investigated.

• Korean Journal of Crystallography
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• v.2 no.2
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• pp.1-6
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• 1991

ZnO thin films were deposited on p-Si(100) and Coming glass 7059 by f magnetron sputtering mothod. The effect of deposition parameters on the electrical, structural and optical properties were investigated. Highly c-axis oriented ZnO thin films were deposited at high rf power. Standard deviation(σ) of X-ray rocking curve of peak at 26θ=34,4˚ ranged from 6.8˚ to 7.2˚, depending on the deposition condition. ZnO thin films deposited on glass substrate eihibited 80% transmittance in the visible range, regardless of the deposition parameters. Resistivity of ZnO thin films was significantly affected by f power and Ar pressure, and ranged widely from 3×102 to 2×109 Ω.

• Journal of the Semiconductor & Display Technology
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• v.11 no.2
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• pp.13-16
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• 2012

Zinc oxide (ZnO) films were deposited by an RF magnetron sputtering system with the RF power of 200W and 300W and flow rate of oxygen gases of 20 and 30 sccm, in order to research the growth of ZnO on carbon doped silicon oxide (SiOC) thin film. The reflectance of SiOC film on Si film deposited by the sputtering decreased with increasing the oxygen flow rate in the range of long wavelength. In comparison between ZnO/Si and ZnO/SiOC/Si thin film, the reflectance of ZnO/SiOC/Si film was inversed that of ZnO/Si film in the rage of 200~1000 nm. The transmittance of ZnO film increased with increasing the oxygen gas flow rate because of the transition from conduction band to oxygen interstitial band due to the oxygen interstitial (Oi) sites. The low reflectance and the high transmittance of ZnO film was suitable properties to use for the front electrode in the display or solar cell.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.8 no.4
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• pp.587-591
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• 1998

AZO transparent conducting thin film were fabricated by DC magnetron sputtering using the Zn: Al (2% aluminu contained ) alloy target with inducing microwave to the plasma, and the effect of microwave was studied. The optical transmittance, the resistivity and dynamic deposition rate at the applied voltage to target of 420 V was 50~70%, $ 5.5{\times}10^{-3}{\Omega}$cm and 6,000 $\AA\textrm{mm}^2$/J, respectively. After annealing AZO coated glass at $400^{\circ}C$ for 30 minutes, the light transmittance was increased to 80% and electrical conductivity was also increased two times, reached to resistivity of $2.0{\times}10^{-3}{\Omega}$cm.

• Proceedings of the Membrane Society of Korea Conference
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• 1998.10a
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• pp.87-90
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• 1998

1. 서론 : 막 분리공정에 사용되고 있는 대부분의 고분자 막들은 침지침강(immersion precipitation) 상변환법에 의해 제조되고 있다. 침지침강 상변환법으로 제조된 막의 최종 구조는 고분자 캐스팅 용액의 열역학적 특성과 비용매와의 속도론적 특성에 따라 대칭형 또는 비대칭형 막구조를 갖게 된다. 고분자/용매로 이루어진 캐스팅 용액에 제3의 성분으로서 PVP, PEG, LiCl. ZnCl$_2$ 와 같은 유.무기물을 첨가시킴으로서 막구조 및 투과성능을 변화시킬 수 있다. 이러한 점에서 이들 첨가제를 pore-forming agent라 부르기도 한다. 본 연구에서는 상대적으로 열적.기계적 특성이 우수하고, 화학약품에 대한 안정성이 뛰어나 상변환 막의 소재물질로서 널리 사용되고 있는 Polyethersulfone(PES)을 막 소재 물질로 사용하여 PES/NMP 캐스팅 용액에 다양한 종류의 무기염[CaCl$_2$, LiCl, LiClO$_4$, Mg(ClO$_4)_2$, ZnCl$_2$]을 PES에 대한 중량비를 달리하여 첨가시켜 비대칭 막을 제조하여 무기염의 첨가가 막구조 형성 및 막투과 특성에 미치는 영향을 연구하였다. 이때 첨가된 무기염 및 첨가 중량비에 따른 영향을 PES/NMP/Salt 계의 coagulation value, light transmittance, 점도 등의 열역학 및 속도론적 특성으로서 설명하였다.