• Proceedings of the Materials Research Society of Korea Conference
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• 2001.11a
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• pp.175-175
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• 2001

• Proceedings of the Materials Research Society of Korea Conference
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• 1997.10a
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• pp.160-160
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• 1997

• Bulletin of the Korean Chemical Society
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• v.31 no.11
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• pp.3451-3453
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• 2010

• Proceedings of the Materials Research Society of Korea Conference
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• 1999.05a
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• pp.50-50
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• 1999

• Proceedings of the Materials Research Society of Korea Conference
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• 2002.11a
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• pp.114-114
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• 2002

• Proceedings of the KIEE Conference
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• 1987.07a
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• pp.553-555
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• 1987

In the standard system of low voltage-oriented ZnO varistor,a small amount of $Sb_2O_3$ was added to improve the nonlinear exponent and then to find the variation of breakdown characteristics, 0.1m/o-SiO and 0.1m/o-$TiO_2$, respectively,were added We considered relationship between the breakdown voltage of systems and the microstructure. We found that the system containing 0.1m/o-$Sb_2O_3$ showed very high nonlinear exponent. And we found that SiO enhanced breakdown voltage and $TiO_2$ lowered it.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.319.1-319.1
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• 2016

Recently, the Al-doped ZnO (ZnO:Al) films are intensively used in thin film a-Si solar cell applications due to their high transmittance and good conductivity. The textured ZnO:Al films are used to enhance the light trapping in thin film solar cells. The wet etch process is used to texture ZnO:Al films by dipping in diluted acidic solutions like HCl or HF. During that process the glass substrate could be damaged by the acidic solution and it may be difficult to apply it for the inline mass production process since it has to be done outside the chamber. In this paper we report a new technique to control the surface morphology of RF-sputtered ZnO:Al films. The ZnO:Al films are textured with vaporized HF formed by the mixture of HF and H2SiO3 solution. Even though the surface of textured ZnO:Al films by vapor etching process showed smaller and sharper surface structures compared to that of the films textured by wet etching, the haze value was dramatically improved. We achieved the high haze value of 78% at the wavelength of 540 nm by increasing etching time and HF concentration. The haze value of about 58% was achieved at the wavelength of 800 nm when vapor texturing was used. The ZnO:Al film texture by HCl had haze ratio of about 9.5 % at 800 nm and less than 40 % at 540 nm. In addition to low haze ratio, the texturing by HCl was very difficult to control etching and to keep reproducibility due to its very fast etching speed.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2017.05a
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• pp.106-106
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• 2017

가스센서는 사내 및 산업 환경에서의 유독성 또는 폭발성 가스 검출, 환경 모니터링, 질병 진단 등 매우 다양한 응용분야에서 큰 관심을 가지고 있다. 반도체 금속산화물(SMOs) 기반의 센서 분야에서는 이들의 감도 및 선택성을 향상시키기 위해 많은 노력을 기울이고 있다. 이는 센서의 선택성을 부여하게 되면 다양한 가스들이 존재하는 환경에서도 검출자가 원하는 가스만의 응답을 얻을 수 있기 때문이다. 본 연구에서는 MOF(Metal-Organic Framwork) 기반 멤브레인으로 ZIF-8(Zeolitic Imidazolate Frameworks 구조들 중 하나) 멤브레인 쉘 층을 이용하여 ZnO 나노선에 형성하였다. ZnO 나노선은 VLS공정 (Vapor-Liquid-Solid)을 이용하여 패턴된 전극을 갖는 $SiO_2$-grown Si 웨이퍼 상에 성장되었고, 성장된 ZnO 나노선은 2-methyl imidazole과 methanol이 포함된 고용체에 넣고 폐쇄된 압력용기 속에서 가열시켜 얻게 된다. 이렇게 얻어진 ZIF-8@ZnO 나노선의 ZIF-8 멤브레인은 분자 체 구조(molecular sieving structure)를 갖게 되며, 이들의 pore 크기는 약 $3.4{\AA}$을 갖는다. 따라서 이보다 더 큰 동적 직경을(kinetic diameter) 갖는 가스 종은 이 멤브레인을 통과할 수 없음을 나타내므로 제작된 시편은 $H_2$(kinetic diameter : $2.89{\AA}$), $C_7H_8$(kinetic diameter : $5.92{\AA}$), 그리고 $C_6H_6$(kinetic diameter : $5.27{\AA}$) 가스들을 각각 사용함으로써 ZIF-8@ZnO 나노선의 센서 특성을 조사했으며, 보다 정확한 비교를 위해 순수한 ZnO 나노선 역시 동일한 조건에서 측정되었다. 결과를 통해, 수소 가스를 제외한 다른 가스들에 대해서는 반응을 하지 않고, 오직 수소 가스에 대해서만 반응을 나타냈으며, 순수 ZnO 나노선의 수소 감응도보다 낮은 감응도를 나타내었다. 이는 멤브레인 쉘 층을 형성함으로써 ZnO 나노선의 표면적이 감소해 가스 분자와의 접촉점을 감소시키기 때문이라고 판단된다. 이와 같은 MOF 멤브레인의 캡슐화 전략은 가스센서뿐 아니라 바이오 센서 및 광촉매 등과 같은 이온 선택성을 필요로 하는 다양한 응용분야에 적용될 수 있을 것으로 기대된다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.333-336
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• 1999

The relationship between the DC degradation characteristics of the $ZnO-Bi_2O_3$ varistor and post-annealing is investigated in this study. $ZnO-Bi_2O_3$ varistors containing $SiO_2$ range 0.3 mol% were fabricated by standard ceramic techniques. The post- annealing is performed at $550^{\circ}C$ for 0, 1.5 and 5h. A little phase transition is found according to the analysis of X-ray diffraction. DC degradation tests were conducted at $115\pm3^{\circ}C$ for periods up to 22h. Current-voltage analysis was used to determine nonlinear coefficients($\alpha$). Capacitance-voltage analysis enable the donor density($N_d$) and the barrier height($E_B$) to be determined. From above analysis, it is found that the past-annealing for 5h improved degradation characteristics in $ZnO-Bi_2O_3$ with Si additive.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.34D no.2
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• pp.27-37
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• 1997

Photoluminescent and cathodoluminescent charcteristics of inorganic luminescent materials were investigated ot develop possible phosphors for thin film electroluminescent (TFEL) device applications. Mg, Zn, and Photoluminescent and cathodoluminescent charcteristics of inorganic luminescent materials were investigated ot develop possible phosphors for thin film electroluminescent (TFEL) device applications. Mg, Zn, and $Si_3N_4$ powders were used to synthesize $(Mg_xZn_{1-x})SiN_2$ host materials. $Tb_4O_7$ and $Eu_2O_3$ powdrs were added as luminescent centers. Very sharp emission spectra of $Tb^{3+}$ ions were observed from $Mg._5Zn._5SiN_2:Tb$ sampels sintered at $1400^{\circ}C$ for an hour and the maximum intensity of emission spectra occured at wavelength of 550nm (green light). Synthetic conditions of $(Mg_xZn_{1-x})SiN_2:Eu$ phosphors were optimized for the hghest luminescence. The Eu concentrations were varied from 0.2% to 1.6%. Before firing, the powders were mixed using ballmills, methanol, acetone, or D.I. water. The Mg/Zn ratio also were varied from x=0.3 to x=0.7. The maximum PL intensity was obtained from a sample with 1.2% Eu concentration and the powder was mixed with methanol and dried before firing. The maximum intensity of the emission spectra occurred t the wavelength of 470nm(blue light). TFEL devices fabricated by using sputter deposition of $(Mg._3Zn._7)SiN_2:Eu$ phosphor layer showed yellowish white emission at the phosphor field of 2MV/cm.