• Proceedings of the KIEE Conference
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• 2005.10c
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• pp.95-97
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• 2005

Loss in the multi-stacked HTS wires are affected by a number of factor, such as, number of wires used in the stack, direction of external magnetic field and insulation thickness between the wire. This paper examines the effects of the insulation thickness on the magnetization loss of the multi-stacked YBCO coated conductor. Measurements of magnetization loss were performed using 4 different typo of multi-stacked wires and under various angle of external magnetic field. Test results show that loss density per unit volume increased for YBCO coated conductors when thickness of insulation increased. Loss density per unit volume decreased for YBCO coaled conductors when stacking number of tapes increased.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07a
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• pp.98-104
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• 2002

CeO$_2$ and NiO buffers for YBCO coated conductors were deposited on biaxially textured Ni substrate by metalorganic chemical vapor deposition(MOCVD) and the deposition behavior were investigated. The degree of texture of deposited CeO$_2$ and NiO films was strongly dependent on the deposition temperature(T$\sub$d/) and oxygen partial pressure(P$\sub$O$_2$/). ($\ell$00) textured films were well deposited at specific deposition temperatures and oxygen partial pressures. The in-plane and out of plane textures estimated form the full width half maximum of the pole figure peaks were less than 10$^{\circ}$. The surface morphology showed that the CeO$_2$ films consisted of columnar grains grown normal to the Ni substrates, while NiO films were slate and clean like a mirror. The surface roughness of both films estimated by atomic force microscopy(AFM) were as smooth as 3-10 m. The growth rate of the films is much faster than that of other physical deposition methods.