• 제목/요약/키워드: YBCO coaled conductors

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절연거리 변화에 따른 적층된 YBCO 도체의 자화손실 변화 (Effects of the insulation thickness on the magnetization loss of the multi-stacked YBCO coated conductor)

  • 임형우;이희준;차귀수;이지광
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2005년도 추계학술대회 논문집 전기기기 및 에너지변환시스템부문
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    • pp.95-97
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    • 2005
  • Loss in the multi-stacked HTS wires are affected by a number of factor, such as, number of wires used in the stack, direction of external magnetic field and insulation thickness between the wire. This paper examines the effects of the insulation thickness on the magnetization loss of the multi-stacked YBCO coated conductor. Measurements of magnetization loss were performed using 4 different typo of multi-stacked wires and under various angle of external magnetic field. Test results show that loss density per unit volume increased for YBCO coated conductors when thickness of insulation increased. Loss density per unit volume decreased for YBCO coaled conductors when stacking number of tapes increased.

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YBCO Coated Conductor용 버퍼총의 제조 및 특성 (Preparation of buffer layers for YBCO coated conductors and the properties)

  • 김찬중;홍계원;박해웅;김호진;지봉기
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 하계학술대회 논문집
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    • pp.98-104
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    • 2002
  • CeO$_2$ and NiO buffers for YBCO coated conductors were deposited on biaxially textured Ni substrate by metalorganic chemical vapor deposition(MOCVD) and the deposition behavior were investigated. The degree of texture of deposited CeO$_2$ and NiO films was strongly dependent on the deposition temperature(T$\sub$d/) and oxygen partial pressure(P$\sub$O$_2$/). ($\ell$00) textured films were well deposited at specific deposition temperatures and oxygen partial pressures. The in-plane and out of plane textures estimated form the full width half maximum of the pole figure peaks were less than 10$^{\circ}$. The surface morphology showed that the CeO$_2$ films consisted of columnar grains grown normal to the Ni substrates, while NiO films were slate and clean like a mirror. The surface roughness of both films estimated by atomic force microscopy(AFM) were as smooth as 3-10 m. The growth rate of the films is much faster than that of other physical deposition methods.

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