• Economic and Environmental Geology
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• v.42 no.5
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• pp.479-486
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• 2009

In natural environments, manganese (Mn) exists in the valence of +2, +3, and +4 and plays a pivotal role as a strong oxidant or reductant in the geochemical cycles of elements. Especially, Mn forms varying (oxyhydr)oxides. The oxidation state of structural Mn is characteristic to each oxide and is one of the most important factors controlling its geochemical behaviors such as solubility, sorption capacity, and redox potential. Therefore, it is important to elucidate processes governing Mn oxidation state in predicting the fate and transport of many redox sensitive elements in the environment. X-ray photoelectron spectroscopy (XPS) is a very useful method to determine the oxidation state of various elements in solid phases. In this study, the oxidation states of structural Mn in MnO, $Mn_2O_3$, $MnO_2$ were assessed based on the binding energy spectra of $Mn2p_{3/2}$ and Mn3s using XPS and were compared with those reported elsewhere. $Mn2p_{3/2}$ binding energies were determined as 640.9, 641.5, 641.8 eV for MnO, $Mn_2O_3$, $MnO_2$, respectively, which indicates that the binding energy increased with increasing Mn oxidation state. It was also noted that Ar etching may cause changes in electronic structure configuration on surface of the original sample.

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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• 2002.10b
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• pp.137-138
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• 2002

The benefits of using DLC coatings on steel in dry sliding are well known. The present study has investigated the effects of using the same materials but in a boundary lubricated environment. Tribological tests were performed using a load-scanning device and a lubricant with an extreme-pressure (EP) additive. XPS and grazing incidence XRD are used for chemical analysis. The chemical composition of the resulting tribofilm is correlated to different friction behaviors and contact loads, and indicates that high loads are beneficial for formation of low friction tribofilm.

• Journal of the Korean Vacuum Society
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• v.5 no.2
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• pp.99-106
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• 1996

Two types of regularization method (singular system and HMP approaches) for generating depth-concentration profiles from angle-resolved XPS data were evaluated. Both approaches showed qualitatively similar results although they employed different numerical algorithms. The application of the regularization method to simulated data demonhstrates its excellent utility for the complex depth profile system . It includes the stable restoration of depth-concentration profiles from the data with considerable random error and the self choice of smoothing parameter that is imperative for the successful application of the regularization method. The self choice of smoothing parameter is based on generalized cross-validation method which lets the data themselves choose the optimal value of the parameter.

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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• 1999.11a
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• pp.84-93
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• 1999

Sliding friction and wear tests for silicon nitride(Si$_3$N$_4$) was carried out with a ball-on-disk specimen configuration. The material used in this study was HIPed silicon nitride. The tests was carried out from room temperature to 1000"I with self mated couples of slicon nitride in laboratory air. Worn surfaces were observed by SEM and debris particles from worn surfaces were analyzed degree of oxidation by XPS. XPS.

• Bulletin of the Korean Chemical Society
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• v.22 no.3
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• pp.263-266
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• 2001

Isopropylation of phenol with 2-propanol has been carried out over Na-exchanged ZSM-5 zeolites to determine the effect of catalyst acidity on phenol conversion and product selectivity. The acid type and strength of the catalyst such as Lewis, weak and strong Bronsted acid sites are measured by pyridine adsorbed XPS and the catalytic properties are interpreted in terms of the acid properties. The active site and mechanism for the reaction are suggested based on evidence of study from the reactant adsorbed FT-IR.

• Analytical Science and Technology
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• v.5 no.2
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• pp.1067-1082
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• 1992

• Current Photovoltaic Research
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• v.4 no.1
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• pp.21-24
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• 2016

Chalcopyrite based (CIGS) thin films have considered to be a promising candidates for industrial applications. The growth of quality CIGS thin films without secondary phases is very important for further efficiency improvements. But, the identification of complex secondary phases present in the entire film is crucial issue due to the lack of powerful characterization tools. Even though X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and normal Raman spectroscopy provide the information about the secondary phases, they provide insufficient information because of their resolution problem and complexity in analyzation. Among the above tools, a normal Raman spectroscopy is better for analysis of secondary phases. However, Raman signal provide the information in 300 nm depth of film even the thickness of film is > $1{\mu}m$. For this reason, the information from Raman spectroscopy can't represent the properties of whole film. In this regard, the authors introduce a new way for identification of secondary phases in CIGS film using depth Raman analysis. The CIGS thin films were prepared using DC-sputtering followed by selenization process in 10 min time under $1{\times}10^{-3}torr$ pressure. As-prepared films were polished using a dimple grinder which expanded the $2{\mu}m$ thick films into about 1mm that is more than enough to resolve the depth distribution. Raman analysis indicated that the CIGS film showed different secondary phases such as, $CuIn_3Se_5$, $CuInSe_2$, InSe and CuSe, presented in different depths of the film whereas XPS gave complex information about the phases. Therefore, the present work emphasized that the Raman depth profile tool is more efficient for identification of secondary phases in CIGS thin film.

• Journal of the Korean Vacuum Society
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• v.10 no.3
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• pp.328-334
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• 2001

The characteristics of $NO/N_2O$ nitrided oxide and reoxidized nitrided oxide being studied as super thin gate oxide and gate dielectric layers of nonvolatile semiconductor memory(NVSM) was investigated by dynamic secondary ion mass spectrometry(D-SMS), time-of-flight secondary ion mass spectrometry(ToF-SIMS), and x-ray photoelectron spectroscopy (XPS). The specimen was annealed in $NO/N_2O$ ambient after initial oxide process. The result of D-SIMS exhibits that the center of nitrogen exists at the initial oxide interface and the distribution of nitrogen is wider in the annealing process with $N_2O$ than with NO annealing process. For investigating the condition of nitrogen that exists within the nitrided oxide, ToF-SIMS and XPS analysis were carried out. It was shown that the center of nitrogen investigated by D-SIMS was expected the SiON chemical bonds. The nitrogen near the newly formed reoxide/silicon substrate interface was appeared as $Si_2NO$ chemical bonds, and it is agreed with the distribution of SiN and $Si_2NO$ species by ToF-SIMS.

• Applied Chemistry for Engineering
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• v.29 no.3
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• pp.312-317
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• 2018

In this study, activated carbon fibers (ACFs) were treated by oxy-fluorination to improve the adsorption property of benzene gas, one of the gases causing sick house syndrome. Surface properties and pore characteristics of oxyfluorinated activated carbon fibers were confirmed by X-ray photoelectron Spectroscopy (XPS) and Brunauer-Emmett-Teller (BET), and adsorption properties of benzene gas were evaluated by gas chromatography (GC). As a result of XPS data, it was confirmed that the fluorine functional groups on activated carbon fibers surface increased with increasing the fluorine partial pressure. The specific surface area of all samples decreased after the oxyfluorination treatment, but the micropore volume ratio increased when the fluorine partial pressure was at 0.1 bar. The oxyfluorinated activated carbon fibers adsorbed 100 ppm benzene gas for an 11 h, it was found that the adsorption efficiency of benzene gas was improved about twice as much as that of untreated ones.

• Analytical Science and Technology
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• v.7 no.1
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• pp.115-124
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• 1994

The corroded surface of cold rolled steel sheet in the process of rinsing after alkali-cleaning was examined by means of X-ray Photoelectron Spectroscopy(XPS). In addition, the surface-treated cold rolled steel with 0.05wt% $Na_5P_3O_{10}$ solution for the purpose of preventing the corrosion was examined by means of XPS and the results were compared with those for the non-treated cold rolled steel. It was found that the corroded surface consists of $Fe_2O_3$, FeO and $Fe(OH)_3$ and the thickness of the oxide layer is about $1500{\AA}$. On the other hand, in the case of surface-treated cold rolled steel, the phosphate layer of $60{\AA}$ thickness was found to act as a protective film over the relatively thin Fe oxide layer.