• 제목/요약/키워드: X-ray reflectivity

검색결과 62건 처리시간 0.037초

Soft X-ray Absorption Spectroscopy via Reflectivity

  • Jang, H.;Ko, K.T.;Lee, J.S.;Khim, T.Y.;Lee, H.;Kim, J.Y.;Park, J.H.
    • 한국자기학회:학술대회 개요집
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    • 한국자기학회 2007년도 The 1st International Symposium on Advanced Magnetic Materials
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    • pp.30.1-30.1
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    • 2007
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Liquid Crystal Alignment on Solid Substrates

  • Kim, Jae-Hoon;Shi, Yushan;Kumar, Satyendra
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.I
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    • pp.755-758
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    • 2005
  • The mechanism responsible for liquid crystal (LC) alignment on solid substrates treated with mechanical rubbing or polarized UV is not understood. The results of x-ray reflectivity study of LC alignment on a large number of different alignment layers show that the anisotropy in the surface roughness of the substrate completely determines the LC alignment. The anchoring energy depends on the degree of roughness anisotropy and chemical interactions between the substrate and LC molecules.

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스퍼터링 방법에 의한 AIN/Si(111)의 성장 방향과 표면 거칠기의 성장 시간에 대한 연구 (Evolution of Growth Orientation and Surface Roughness During Sputter Growth of AIN/Si(111))

  • 이민수;이현휘;서선희;노동영
    • 한국진공학회지
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    • 제7권3호
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    • pp.237-241
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    • 1998
  • In-situ X-선 산란 방법을 이용하여 R.F. 스퍼터링 방법에 의하여 성장시킨 AIN/Si(111)박막의 우선성장과 표면 거칠기의 성장 시간에 따른 변화를 연구하였다. 대부분 의 성장 조건하에서 초기의 AIN박막은 <001> 우선 성장 방위를 가지고 성장하였다. 하지 만 박막의 두께가 증가함에 따라 우선 성장 방위가 많이 바뀌었는데 이 현상은 높은 기판 온도와 높은 R.F. power에서 더욱 뚜렷이 나타났다. 이러한 현상은 <001> 성장 방위를 선 호하는 표면 에너지와 우선 성장 방위의 무질서도를 증가하게 하는 응력(strain)에너지에 관 련된 것으로 해석된다. 이 실험에서는 X-선 반사율을 측정하여 성장 도중의 표면 현상 또 는 연구하였다.

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A Monte Carlo Simulation Incorporated with Genetic Algorithm for the Transition Deposition of LB Film of Fatty Acid

  • 최정우;조경상;이원홍;이상백;이한섭
    • Bulletin of the Korean Chemical Society
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    • 제19권5호
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    • pp.544-548
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    • 1998
  • A Monte Carlo simulation incorporated with the genetic algorithm is presented to describe the defect known as "transition from Y-to X-type deposition" of the cadmium arachidate Langmuir-Blodgett multilayer film. Simulation is performed based on the detachment models of XY-type deposition. The transition is simulated by introducing a probability of surface molecule detachment considering interaction between neighboring molecules. The genetic algorithm is incorporated into Monte Carlo simulation to get the optimum value of the probability factors. The distribution of layers having different thickness predicted by the simulation correlates well with the measured distribution of thickness using the small-angle X-ray reflectivity. The effect of chain length and subphase temperature on the detachment probability are investigated using the simulation. Simulation results show that an increase (or a decrease) of two hydrocarbon chain is roughly equivalent to the detachment probability to a temperature decrease (or increase) of 15 K.

Dielectric and Magnetic Properties of Co-doped Ni0.65Zn0.35Fe2O4 Thin Films Prepared by Using a Sol-gel Method

  • Lee, Hyun-Sook;Lee, Jae-Gwang;Baek, K.S.;Oak, H.N.
    • Journal of Magnetics
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    • 제8권4호
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    • pp.138-141
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    • 2003
  • $Ni_{0.65}Zn_{0.35}Fe_2O_4$thin films were prepared by using a sol-gel method. Their crystallographic, dielectric and magnetic properties were investigated as a function of Cu contents by means of an X-ray diffractometer (XRD), X-ray reflectivity, LCZ meter (NF2232), a vibrating sample magnetometer (VSM), and an atomic force microscope (AFM). From typical C-V measurements for $Ni_{0.65}Zn_{0.35}Fe_2O_4$ thin films on p-type silicon substrate, the surface charge density was calculated as 1.4 ${\mu}$C/$m^2$. The dielectric constant evaluated from the capacitance at the accumulation state was 28. The high $H_{c}$ and low $M_{sat}$ at x=0.0 and 0.1 were due to the growth of the ${\alpha}$-$Fe_2O_3$ phase having antiferromagnetic properties. The rapidly decreased $H_{c}$ and increased $M_{sat}$ at x=0.2 and 0.3 can be explained that the ${\alpha}$-$Fe_2O_3$ phases have completely disappeared at x=0.3 and so, non-magnetic defects are minimized. The $M_{sat}$ was slightly decreased and the $H_{c}$ was increased above at x=0.3 because the increase of grain boundary due to smaller grain size acts as defects during magnetization process.

Interface and Crystallinity of 1,4,5,8,9,11-Hexaazatriphenylene-hexanitrile thin films between an Organic and Transparent Conductive Oxide layers

  • 이현휘;이정환;김장주;김효정
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.248-248
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    • 2016
  • We have investigated the crystallinity, preferential ordering, and interfacial stability of 1,4,5,8,9,11-hexaazatriphenylene-hexanitrile (HATCN) thin film interconnected with organic/inorganic multilayer. At the region close to the organic-organic interface, HATCN formed low crystalline order with substantial amorphous phase. As film growth continued, HATCN stacked with high crystalline phase. After a sputtering deposition of the indium zinc oxide (IZO) layer on top of HATCN/organic layer, the volume fraction of preferentially ordered HATCN crystals increased without any structural deterioration. In addition, the HATCN surface was kept quite stable by preserving the sharp interface between HATCN and sputtering deposited IZO layers.

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Electromagnetic Interference Reflectivity of Nanostructured Manganese Ferrite Reinforced Polypyrrole Composites

  • Chakraborty, Himel;Chabri, Sumit;Bhowmik, Nandagopal
    • Transactions on Electrical and Electronic Materials
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    • 제14권6호
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    • pp.295-298
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    • 2013
  • Nano-size manganese ferrite reinforced conductive polypyrrole composites reveal a core-shell structure by in situ polymerization, in the presence of dodecyl benzene sulfonic acid as the surfactant and dopant, and iron chloride as the oxidant. The structure and magnetic properties of manganese ferrite nano-fillers were measured, by using X-ray diffraction and vibrating sample magnetometer. The morphology, microstructure, and conductivity of the composite were characterized by transmission electron microscopy, Fourier transform infrared spectroscopy, and four-wire technique. The microwave-absorbing properties of composites reinforcement dispersed in resin coating with the coating thickness of 1.2 nm were investigated, by using vector network analyzers, in the frequency range of 8~12 GHz. A reflection loss of -8 dB was observed at 10.5 GHz.

ArF 포토리소그라피공정을 위한 실리콘이 함유된 반사방지막코팅 (Silicon Containing Bottom Anti-Reflective Coating for ArF Photolithography)

  • 이준호;김형기;김명웅;임영택;박주현
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
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    • pp.66-66
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    • 2006
  • Development of ArF Photo-lithography process has proceeded with the increase of numerical aperature (NA) and the decrease of resist thickness. It makes many problems such as cost and process complexity. A novel spin-on hard mask system is proposed to overcome many problems Spin-on hard mask composed of two layers of siloxane and carbon. The optical thickness of two layers is designed from reflectivity measurement at specified n, k respectively. The property of photo-resist shows different results according to Si contents. Si-contents was measured XPS(X-ray Photoelectron spectroscopy).

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MAGNETIC AND MAGNETO-OPTICAL PROPERTIES OF Co-BASED MULTILAYERED FILMS PREPARED BY ELECTRON-BEAM EVAPORATION

  • Lee, Y.P.;Lee, B.J.;Park, H.K.;Kim, S.K.;Kang, J.S.;Jeong, J.I.
    • 한국진공학회지
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    • 제4권S2호
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    • pp.24-29
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    • 1995
  • The magnetic amd magneto-optical(MO)properties of Co-based multilayered(ML)films are known to vary sensitively according to the manufacturing methods and the film microstructures. Co/Pd and Co/Pt ML films with ultrathin layers of Co were prepared by alternating deposition in an ultrahigh-vacuum physical-vapor-deposition system. The individual layer thicknesses of the samples were estimated making use of the angular positions of x-ray diffraction peaks. The magnetic and MO properties were investigated, and correlated systematically to the structural parameters of the films. A Kerr spectrometer was self-manufactured to measure the MO properties such as Kerr rotation angle, ellipticity and reflectivity. The rms surface roughness was also measured using atomic force microscopy. Some of the samples showed good properties for MO medium, such as large perpendicular magnetic anisotropy and Kerr rotation, and perfect squareness of the magnetic hysteresis loop.

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