• Title/Summary/Keyword: X-ray microscope

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Quantitative Analysis of Skarn Ore Using 3D Images of X-ray Computed Tomography (3차원 X-ray 단층 화상을 이용한 스카른 광석의 정량분석 연구)

  • Jeong, Mi-Hee;Cho, Sang-Ho;Jeong, Soo-Bok;Kim, Young-Hun;Park, Jai-Koo;Kaneko, Katsuhiko
    • Journal of the Mineralogical Society of Korea
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    • v.23 no.3
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    • pp.211-217
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    • 2010
  • A micro-focus X-ray computed tomography (CT) was employed to determine quantitative phase analysis of skarn Zn-Pb-Cu ore by nondestructive visualization of the internal mineral distribution of a skarn ore. The micro CT images of the ore were calibrated to remove beam hardening artifacts, and compared with its scanning electron microscope (SEM) images to set the threshold of CT number range covering sulfide ore minerals. The volume ratio of sulfide and gangue minerals was calculated 20.5% and 79.5%, respectively. The quantitative 3D X-ray CT could be applied to analyse the distribution of economic minerals and their recovery.

Electron Crystallography of CaMoO4 Using High Voltage Electron Microscopy

  • Kim, Jin-Gyu;Choi, Joo-Hyoung;Jeong, Jong-Man;Kim, Young-Min;Suh, Il-Hwan;Kim, Jong-Pil;Kim, Youn-Joong
    • Bulletin of the Korean Chemical Society
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    • v.28 no.3
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    • pp.391-396
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    • 2007
  • The three-dimensional structure of an inorganic crystal, CaMoO4 (space group I 41/a, a = 5.198(69) A and c = 11.458(41) A), was determined by electron crystallography utilizing a high voltage electron microscope. An initial structure of CaMoO4 was determined with 3-D electron diffraction patterns. This structure was refined by crystallographic image processing of high resolution TEM images. X-ray crystallography of the same material was performed to evaluate the accuracy of the TEM structure determination. The cell parameters of CaMoO4 determined by electron crystallography coincide with the X-ray crystallography result to within 0.033-0.040 A, while the atomic coordinates were determined to within 0.072 A.

무전해 Ni도금박막 형성에 DMAB가 미치는영향

  • Kim, Hyeong-Cheol;Kim, Na-Yeong;Baek, Seung-Deok;Na, Sa-Gyun;Lee, Yeon-Seung
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.204.1-204.1
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    • 2014
  • 스마트폰과 같은 통신기기 및 각종 전자제품에 있어 크기의 축소와 간소화 추세에 따라 인쇄회로기판(PCB)의 초미세회로설계 기술이 요구됨에 따라, 인쇄회로기판과 첨단 전자부품 사이의 접합 신뢰성을 향상시키기 위해 무전해 니켈 도금이 널리 사용되고 있다. 일반적으로, 무전해 Ni도금은 강산, 강염기성 용액을 이용하여 수행되고 있다. 따라서, 공정과정 중에 기판의 손상을 초래하기도 할뿐만 아니라, 환경적으로도 문제시 되고 있다. 본 연구에서는 친환경적 도금공정의 개발을 위해 중성에서 N-(B)무전해 도금을 시행하였다. 중성의 무전해 도금공정은 어떠한 기판을 사용하여도 기판의 손상없이 도금이 가능하다는 장점을 가지고 있고, Boron(B)은 Ni을 비정질화 시키는 물질로 알려져 있다. B가 첨가된 무전해 Ni도금 박막에 있어 B의 영향을 알아보기 위하여 중성조건에서 B를 포함한 DMAB의 첨가량을 조절하였다. Ni-(B) 무전해 도금 시 도금조의 온도는 $40^{\circ}C$로 하였고, 무전해 도금액의 pH는 7(중성)로 유지하였다. Cu Foil기판을 사용하여 DMAB의 양에 따라 성장된 Ni-B무전해 도금 박막의 특성을 분석하기 위해 X-ray Diffraction (XRD), Field Emission Scanning Electron Microscope (FE-SEM), Optical microscope (OM), X-ray Photoelectron Spectroscopy (XPS), X-ray Absorption Spectroscopy (XAS)을 이용하였다.

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Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

  • Chae, Sejung R.;Moon, Juhyuk;Yoon, Seyoon;Bae, Sungchul;Levitz, Pierre;Winarski, Robert;Monteiro, Paulo J.M.
    • International Journal of Concrete Structures and Materials
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    • v.7 no.2
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    • pp.95-110
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    • 2013
  • We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction.

Mineral Properties of Yangsan.Mulkum Clay (양산물금 점토의 광물학적 특성)

  • 정하익;이용수;진규남;진현식
    • Proceedings of the Korean Geotechical Society Conference
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    • 1999.10a
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    • pp.75-80
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    • 1999
  • In this study, clay sampled from Yangsan$.$Mulkum site were used to analyze mineral properties. Mineral and chemical properties of clay were investigated through X-ray fluorescence spectrometer(XRF), X-Ray Diffraction(XRD), and Scanning Electron Microscope(SEM) analysis. The result of this test represents that Yangsan$.$Mulkum clay are composed of quartz, albite, anorthite, orthocalse and illite.

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Two Dimensional Atomic Force Microscope (서브나노급 정밀도의 2 차원 원자현미경 개발)

  • Lee, Dong-Yeon;Gweon, Dae-Gab
    • Proceedings of the KSME Conference
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    • 2008.11a
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    • pp.1778-1783
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    • 2008
  • A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head was developed for use in the nanometrology field. The x and y position of the sample with respect to the tip are acquired by using the laser interferometer in the open-loop state, when each z data point of the AFM head is taken. The sample scanner which has a motion amplifying mechanism was designed to move a sample up to $100{\times}100{\mu}m^2$ in orthogonal way, which means less crosstalk between axes. Moreover, the rotational errors between axes are measured to ensure the accuracy of the calibrated AFM within the full scanning range. The conventional homodyne laser interferometer was used to measure the x and y displacements of the sample and compensated via an X-ray interferometer to reduce the nonlinearity of the optical interferometer. The repeatability of the calibrated AFM was measured to sub-nm within a few hundred nm scanning range.

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Construction of an Ultra High Vacuum Molecular Beam Epitaxy System and Optical Property of ZnSe/GaAs(001) Epitaxial films (초고진공 분자선 에피성장 시스템의 제작과 에피성장된 ZnSe/GaAs(001)의 광학특성)

  • Kim, Eun-Do;Son, Young-Ho;Eom, Gi-Seog;Cho, Seong-Jin;Hwang, Do-Weon
    • Journal of the Korean Vacuum Society
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    • v.15 no.5
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    • pp.458-464
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    • 2006
  • The construction and the performance test of an ultra high vacuum (UHV) molecular beam epitaxy (MBE) system has been completed successfully. We have done domestic development and tried performance test for ultra high vacuum molecular beam epitaxy system. This system has reached pressure $2X10-^{10}$ Torr and the substrate has reached temperature $1,100^{\circ}C$. We have investigated into the characteristic of ZnSe/GaAs(001) by using scanning electron microscope (SEM), atomic force microscope (AFM), x-ray diffraction (XRD) and photolumi-nescence (PL).

Asbestos Analysis of China Sepiolite by Transmission Electron Microscopy (중국산 해포석 내 석면 함유 유무 분석)

  • Song, Se Wook;Chung, Yong Hyun;Han, Jeong Hee
    • Journal of Korean Society of Occupational and Environmental Hygiene
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    • v.23 no.3
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    • pp.205-211
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    • 2013
  • Objectives: 21 sepiolite substances produced in China were investigated for the presence of asbestos in their materials. Materials and methods: In order to identify asbestos in sepiolite substances, test materials were analyzed using a transmission electron microscope equipped with energy dispersive X-ray spectrometer (TEM-EDS) for confirming their shape and components (atomic %). Results: Five of 21 sepiolte substances were asbestos-containing materials. Two chrysotile containing sepiolite proved to be asbestoscontaining materials, as did two chrysotile mixed with tremolite containing sepiolite. 16 sepiolite substances did not contain asbestos materials. Conclusions: When importing sepiolite substances, they must be analyzed to determine if there is asbestos in their materials.

A Study on the Micro-lapping process of Sapphire Wafers for optoelectronic devices (광반도체용 사파이어웨이퍼 기계연마특성 연구)

  • 황성원;김근주;서남섭
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2003.06a
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    • pp.82-85
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    • 2003
  • The sapphire wafers for blue light emitting devices were manufactured by the implementation of the surface machining technology based on micro-tribology. This process has been performed by Micro-lapping process. The sapphire crystalline wafers were characterized by DCXD(Double Crystal X-ray Diffraction). The sample quality of crystalline sapphire wafer at surface has a FWHM(Full Width at Half Maximum) of 250 arcsec. This value at the sapphire wafer surfaces indicated 0.12${\mu}{\textrm}{m}$ sizes. Surfaces of sapphire wafers were mechanically affected by residual stress and surface default. Also Surfaces roughness of sapphire wafers were measured 2.1 by AFM(Atom Force Microscope).

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