• Title/Summary/Keyword: X-ray 회절

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Characteristics of Metal Surface Heat Treatment by Diode Laser (다이오드 레이저를 이용한 금속 표면 열처리 특성)

  • Choi, Seong-Dae;Cheong, Seon-Hwan;Kim, Gi-Man;Yang, Seung-Cheol;Kim, Jam-Gyu
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.6 no.3
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    • pp.16-23
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    • 2007
  • An experimental investigation with diode laser system was carried out to study the effect of surface heat treatment on the die materials(SM45C, SKD11, SK3). The surface heat treatment characteristics of the laser beam are evaluated using hardness tests, optical microscopy, X-ray diffraction and energy dispersive X-ray spectroscopy(EDS). Results indicated that the beam size, focal length, feed rates are changed surface hardened characteristics. SM45C is higher hardness than other materials and composed to martensite grain at hardened zone, whereas other materials(SKD11, SK3)are low hardness than expected and composed to austenite and allayed martensite at hardened zone. The intensive X-ray diffraction patterns of (110)-(200)-(211) is detected hardened surface and the hardened surface distributed plenty of carbon density than metal zone.

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The Analysis of Lattice Distortion of $Ba(Zn_{1/3}Ta_{2/3})O_3$ by X-ray Diffraction (X-선 회절분석법에 의한 $Ba(Zn_{1/3}Ta_{2/3})O_3$의 격자 비틀림 측정)

  • Kim, Chong-Don;Kim, In-Tae;Je, Hae-June
    • Analytical Science and Technology
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    • v.5 no.1
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    • pp.111-114
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    • 1992
  • Ordering phenomena were observed for Zn and Ta cations of $Ba(Zn_{1/3}Ta_{2/3})O_3$ under particular heat treatments, followed by a considerable lattice distortion. This lattice distortion was measured by X-ray powder diffraction with a precision of higher than 1/10,000. From this investigation, a significant lattice distortion occurred within 30 min. of sintering at $1350^{\circ}C$, and it was increased with sintering time.

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Texture Analysis of Cu Interconnects Using X-ray Microdiffraction (X-ray Microdiffraction 을 이용한 구리 Interconnect의 Texture 분석)

  • 정진석
    • Korean Journal of Crystallography
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    • v.12 no.4
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    • pp.233-238
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    • 2001
  • X-ray microdiffraction which uses x-ray beam focused down to a micron size from synchrotron radiation sources allow precision measurements of local orientation and strain variations in polycrystalline materials. Using x-ray microdiffraction setup at Pohang Light Source, we investigated the tex-ture of Cu interconnects with various widths on Si wafer by collecting Laue images and focused to about 2×3㎛ ² in size. Our results show that 1㎛ wide Cu interconnect had grains in rather ran- dom orientation. On the other hand the 20㎛ wide interconnects showed a 〈111〉fiber texture near the center. The grains were 2∼5㎛ long at the 1㎛ wide interconnect and 6∼8㎛ in size at the 20㎛ wide interconnect.

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Dyeing of Cotton Fabrics with Loess Using Soybean Milk - The Compositions of Loess Deposited on the Cotton Fabrics - (콩즙을 이용한 면직물의 황토염색 -면직물에 부착된 황토의 성분분석을 중심으로-)

  • Kim, Soo-Jung;Ryu, Hyo-Seon
    • Journal of the Korean Society of Clothing and Textiles
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    • v.25 no.10
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    • pp.1770-1778
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    • 2001
  • 황토는 대표적인 천연 무기염재의 일종으로서 바람에 의해 운반되어 퇴적된 담황색 내지는 황회색을 띠는 실트질의 퇴적물을 일컫는다. 황토의 구성물질은 주로 석영, 장석, 산화철광물, 깁사이트 등의 여러 가지 점토광물을 포함하는데, 주로 적색을 띠는 것은 소량의 산화철 광물에 기인되는 경우가 많으며 황토를 구성하는 점토광물로는 버미큘라이트, 카오린 광물인 캐올리나이트와 할로이사이트, 일라이트 등이 있다. 본 연구에서는 면직물에 천연 무기염재인 황토를 사용한 염색시에 황토 단독염색과 콩즙 전처리 후 황토염색으로 나누어 염색을 실시하고, 원료 황토와 황토염색 후 면직물에 부착된 성분 간에 차이가 있는지를 확인하기 위해 X선 형광분석(X-ray fluorescence analysis, XRF)을 이용하여 염색 전.후 황토의 성분을 분석하였고, X선 회절분석(X-ray diffraction analysis, XRD)을 이용하여 황토 및 염색 전 후 면직물에 부착된 광물질의 주성분을 분석하였으며, energy dispersive spectrometer (EDS)가 장착된 주사전자현미경을 이용하여 면직물에 부착된 광물의 성분을 조사하였다. 그 결과, 황토로 면직물을 염색하는 경우 면직물에 부착되는 황토의 양과 K/S 값은 거 의 비례하여 증가하는 것으로 나타났다. 황토 염색 후 면직물에 부탁되는 주성분은 주로 SiO$_2$, A1$_2$O$_3$, Fe$_2$O$_3$등인 것으로 나타났으며, X선 회절분석과 EDS분석에 의해 캐올리나이트, 일라이트 등의 점토광물의 형태로 존재하는 것이 확인되었다.

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Dimensional Stability of Domestic Small-diameter Timbers Treated with Polyethylene Glycol (PEG(Polyethylene glycol)처리에 의한 국내산 주요 소경재의 치수 안정화에 관한 연구)

  • Kwon, Goo-Jung;Kim, Nam-Hun
    • Journal of the Korean Wood Science and Technology
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    • v.30 no.1
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    • pp.40-47
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    • 2002
  • This study was carried out to investigate the dimensional stability of three softwoods (Pinus densiflora S. et Z., Pinus koraiensis S. et Z., Larix kaempferi CARR.) and two hardwoods(Quercus mongolica F., Quercus variabilis BL.) treated with polyethylene glycol(PEG). Existence of PEG in wood was examined by an X-ray diffraction method. Shrinkage of the sample woods decreased with increasing concentration of PEG. The dimensional stability of five species had improved highly in thirty percent solutions of PEG with molecular weight 1000~4000, and the dimension of PEG-treated softwoods was more stable than that of PEG-treated hardwoods. Weight gain and bulking effect of the woods treated with PEG increased with increasing concentration of PEG. X-ray diffractograms of Pinus koraiensis wood treated with PEG showed two peaks derived from PEG crystal at 2𝜃 = 19° and 2𝜃 = 23°. However, the diffractograms of Quercus mongolica wood did not present any peaks caused by PEG crystal. From the result of X-ray diffraction, it was revealed that the content of PEG in Pinus koraiensis wood was higher than that in Quercus mongolica wood.

In situ Electric-Field-Dependent X-Ray Diffraction Experiments for Ferroelectric Ceramics (강유전 세라믹의 전기장 인가에 따른 in situ X-선 회절 실험)

  • Choi, Jin San;Kim, Tae Heon;Ahn, Chang Won
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.35 no.5
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    • pp.431-438
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    • 2022
  • In functional materials, in situ experimental techniques as a function of external stimulus (e.g., electric field, magnetic field, light, etc.) or changes in ambient environments (e.g., temperature, humidity, pressure, etc.) are highly essential for analyzing how the physical properties of target materials are activated/evolved by the given stimulation. In particular, in situ electric-field-dependent X-ray diffraction (XRD) measurements have been extensively utilized for understanding the underlying mechanisms of the emerging electromechanical responses to external electric field in various ferroelectric, piezoelectric, and electrostrictive materials. This tutorial article briefly introduces basic principles/key concepts of in situ electric-field-dependent XRD analysis using a lab-scale XRD machine. We anticipate that the in situ XRD method provides a practical tool to systematically identify/monitor a structural modification of various electromechanical materials driven by applying an external electric field.