• Macromolecular Research
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• v.14 no.6
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• pp.588-595
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• 2006

The morphology, structure and melting behaviour of cold-crystallized isotactic polystyrene (iPS) were studied by differential scanning calorimetry (DSC), wide angle X-ray diffraction (WAXD) and small angle X-ray scattering (SAXS). The polymer was found to crystallize according to the dual-lamellar stack model. The two populations of lamellae, along with a melting-recrystallization phenomenon, determined the appearance of multiple melting peaks in DSC traces. The annealing peak was attributed to the relaxation of a rigid amorphous phase, rather than to the melting of crystalline material.

• KSCE Journal of Civil and Environmental Engineering Research
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• v.26 no.1B
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• pp.107-111
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• 2006

The samples collected from two reactors are analyzed by X-ray diffraction and M$\ddot{o}$ssbauer spectroscopy in this study. It is concluded that the iron oxide crystal attached on anthracite media which possesses catalytic ability is identified to be Ferrihydrite, regardless of the value of pH from the analysis of the iron oxide. Iron oxide in Batch reactor is identified to be Microcrystalline goethite.

• Analytical Science and Technology
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• v.20 no.6
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• pp.502-507
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• 2007

X-ray diffraction method has been widely used for qualitative and quantitative analysis of a mixture of materials since every crystalline material gives a unique X-ray diffraction pattern independently of others, with the intensity of each pattern proportional to that material's concentration in a mixture. For determination of mixing ratios, extracting source spectra correctly is important and crucial. Based on the source spectra extracted, a regression model with non-negativity constraint is applied for determining mixing ratios. In some mixtures, however, X-ray diffraction spectrum has sharp and narrow peaks, which may result in partial negative source spectrum from independent component analysis. We propose several procedures of extracting non-negative source spectra and determining mixing ratios. The proposed method is validated with experimental data on powder mixtures.

• Journal of the Korean Wood Science and Technology
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• v.20 no.3
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• pp.55-60
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• 1992

Japanese red pine (Pinus densiflora S. et. Z.) decayed by brown-rot fungi Tyromyces palustris and Gloeophyllum trabeum were subjected to X-ray diffraction analysis and infrared spectral examinations. Pine woods decayed by T. palustris showed the increase of relative crystallinity in the initial stage of degradation. When the weight loss was above 30%, then the crystallinity went down slowly. In contrast, the wood samples degraded by G. trabeum showed the decrease of crystallinity from the beginning stage of decay. The changes of crystallinity in brown-rotted woods suggested that the degradation rate of crystalline cellulose was varied with the brown rot fungal species. X-ray diffraction analyses also indicated that crystalline cellulose was much more slowly broken down than the amorphous one. The most notable difference in the IR spectra of the brown-rotted wood samples was that the adsorption band centered at 1,730$cm^{-1}$ was significantly diminished in the decayed wood. indicating the degradation of hemicellulose by brown-rot fungi. However, no marked changes of intensities at 1,000, 1,060 and 1,040$cm^{-1}$ were observed in the brown rotted wood samples, suggesting that crystal line cellulose was resistant against the attack by brown rot fungi.

• Proceedings of the Optical Society of Korea Conference
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• 1996.09a
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• pp.90-90
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• 1996

• Proceedings of the Optical Society of Korea Conference
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• 1997.08a
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• pp.80-80
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• 1997

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.7 no.2
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• pp.197-206
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• 1997

A SiC epilayer on the 6H-SiC crystal substrate was grown by chemical vapor deposition (CVD). The crystal structure of the SiC epilayer was investigated by using the X-ray diffraction patterns and the Roman scattering spectroscopy. The SiC epilayer on the 6H-SiC substrate was grown to be homoepilayer by CVD. In order to distinguish a certain SiC polytype mixed in the SiC crystal grown by the modified Lely method, we have calculated the X-ray diffraction intensities and Brags angles of the typical SiC crystal powders. By comparing the measured X-ray diffraction pattern with the calculated ones, it was identified that the SiC crystal grown by the modified Lely method was the 6H-SiC crystal mixed some 15R-SiC.

• Journal of Magnetics
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• v.5 no.2
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• pp.27-34
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• 2000

The structure of a series of Cu/Ni is characterized by using a program, SUPREX, to model the x-ray diffraction patterns, multilayers. The samples had nominal layer thickness of 3/3, 7/7, 13.5/13.5, 20/20, 30/30, 50/50, 80/80, 100/100, and 200/200 Angstroms. The diffraction patterns were taken around the (111) peak for the two constituent materials. A kinematical model is used to characterize the diffraction patterns and the parameters for the model are described. An initial model is calculated using initial guesses for the parameters. The model is then fit to the data by reducing $x^2$using the Levenberg-Marquardt algorithm. The samples are shown to be high quality supperlattices.

• Korean Journal of Crystallography
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• v.7 no.1
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• pp.20-29
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• 1996

Sr0.6Ca0.4CuO2 single crystal has been synthesized by flux method and characterized by the single crystal X-ray diffraction. The compound has the orthorhombic system and the space group is Cmcm(63), lattice parameters are a=3.4645Å, b=16.1417Å, c=3.8727Å. In the (Sr1-xCax)CuO2 compound the limit of Ca from substitution for Sr was determined by the change of bond length. For this, X-ray diffraction, scanning electron microscopy (SEM), energy dispersive X-ray fluorescence (EDAX) and electron probe micro-analysis (EPMA) were used. From the change of Cu-O bond length as the Ca substitution, we concluded the limit of Ca incorporation Xca≒0.73.

• Korean Journal of Optics and Photonics
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• v.13 no.3
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• pp.189-196
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• 2002

The components and alignment parameters of a flat-field soft x-ray spectrometer used in the wavelength range below 50 $\AA$ are determined, and the characteristics of the spectrometer are analyzed. It consists of a toroidal mirror, a slit, a varied line-spacing concave grating, and a soft x-ray detector. The space-resolved spectral image of a source is formed on a single plane using the tordidal mirror and the 2400-grooves/mm varied line-spacing concave grating. The former is used to compensate for the astigmatism caused by the grazing incidence of soft x-ray light on the concave grating. The spectral and spatial resolutions of the spectrometer are calculated by applying the wave front aberration theory, and the diffraction efficiency is calculated by applying the scalar diffraction theory.