• Title/Summary/Keyword: X-선 회절도

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The Morphological Properties of Acorn Starch Granules and Starch Gels (도토리 전분 및 전분겔의 형태학적 특성 연구)

  • 김영아
    • Korean journal of food and cookery science
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    • v.8 no.1
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    • pp.9-14
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    • 1992
  • The morphological properties of acorn starch granules and starch gels were examined with scanning electron microscope and X-ray diffractometer. The shape of acorn starch granule was rounded triangular and some elliptical. The size distribution of starch granule was also analyzed. The mean value of minor axis, major axis and the ratio of those were 4.785 $\mu\textrm{m}$, 7.30 $\mu\textrm{m}$ and 0.68, respectively. The surface micro-structure of acorn starch gels were investigated by SEM. Acorn crude and refined starch gel were very different in surface micro-structure. X-ray diffraction pattern of acorn starch was C-type, and the pattern of acorn starch gels were extremely different because of disintegration of starch granules by gelatinization. The diffraction intensity of acorn refined starch gel was slightly higher than crude starch gel.

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The Multiferroic Properties Study of YMn2-xFexO5 (x=0.00, 0.01) by Neutron Diffraction (고 분해능 중성자 회절 실험에 의한 YMn2-xFexO5 (x = 0.00, 0.01)의 다강체 특성 연구)

  • Kim, Dong-Hyun;Kim, Chul-Sung
    • Journal of the Korean Magnetics Society
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    • v.17 no.5
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    • pp.183-187
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    • 2007
  • Compounds of multiferroic materials $YMn_{2-x}Fe_xO_5$ (x = 0.00, 0.01) were prepared using the sol-gel method. The crystallographic, magnetic and electric properties are studied using x-ray diffraction (XRD), neutron diffraction, vibrating sample magnetometer (VSM) and physical property measurement system (PPMS). The crystalline structure of $YMn_2O_5$ was found to be orthorhombic (Pbam) at room temperature. The lattice constants of $YMn_2O_5$ were determined to be $a_0=7.275\;{\AA},\;b_0=8.487\;{\AA},\;c_0=5.674\;{\AA}$. The lattice constants not changed with Fe concentrations. Our data demonstrate the correlation of magnetic and electric properties in $YMn_2O_5$ materials.

Possibility about Application and Interpretation of Surface Nondestructive X-ray Diffraction Method for Cultural Heritage Samples by Material (유형별 문화재 시료의 비파괴 표면 X-선 회절분석법 적용과 해석 가능성)

  • Moon, Dong Hyeok;Lee, Myeong Seong
    • Journal of the Mineralogical Society of Korea
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    • v.32 no.4
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    • pp.287-301
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    • 2019
  • Preservation of the original form is the principle for conservation, management and utilization of cultural heritages. Thus, non-destructive analysis of these samples are important field of the conservation science. In this study, examined the applicability of nondestructive surface X-ray diffraction analysis (ND-XRD) for cultural heritage by materials (rock specimen, jade stone, pigment painted specimen, earthen artifact, metal artifact). In result, all type of sample is recorded suitable X-ray diffraction patterns for identifying mineral composition in case of surface condition with adequate particle size and arrangement. And diffraction pattern is reflected surface information than matrix. Therefore, ND-XRD is thought to be applicable not only mineral identification but also interpretation of manufacturing technique and alteration trend about layered sample (in horizontally or vertically). Whereas some exceptional diffraction patterns were recorded due to overlapping information on specific crystal planes. It caused by skip the sample treatment (powdering and randomly orientation). It could be advantageously used for mineral identification, such as preferred orientation of clay minerals. In contrast, irregular diffraction pattern caused by single crystalline effect is required careful evaluation.

대구경 사파이어 단결정 기판의 결함 평가를 위한 X-선 토포그래피 장비 구축

  • Jeon, Hyeon-Gu;Jeong, In-Yeong;Lee, Yu-Min;Kim, Chang-Su;Park, Hyeon-Min;O, Byeong-Seong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.238-238
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    • 2013
  • 사파이어 단결정은 광학 투명도, 물리적 강도, 충격 저항, 마모 부식, 높은 압력 및 온도 내구성, 생체 호환성 등 다양한 특성을 가지고 있어 다양한 분야에서 사용되고 있으며, 특히 최근에는 백색 또는 청색 LED 소자 분야에서 기판으로 주로 활용되고 있다. 이러한 사파이어 단결정 기판은 공정에서 결정 성장 조건 및 기계적 연마 등의 다양한 요인으로 결정학적 결함이 발생한다. 이러한 결정학적 결함을 제어함으로서 좋은 품질의 단결정 기판을 생산할 수 있다. 이에 따라 각종 결함 제어를 위해서 X-선, EPD, 레이저 편광법 등 다양한 방법으로 결함들을 측정하고 있다. 그 중에서도 X-선 토포그래피는 시료를 비파괴적인 방법으로 단결정의 결함 밀도와 유형 등을 파악하는데 매우 유용한 측정법이며, Lang 토포그래피로 대표되는 X-선 회절 투과법은 기판과 같은 대구경의 시료를 우수한 분해능으로 내부 결함까지 관찰할 수 있는 장점을 지니고 있다. 본 연구에서는 대구경 사파이어 단결정 기판에 내재하는 결정 결함을 확인 및 분석하기 위해 X-선 Lang 토포그래피(X-ray Lang Topography) 장비를 구축하였다. 그리고 4, 6인치 c-면 사파이어 단결정 기판의 (110), (102) 회절면의 X-선 토포그래피 측정을 통해 전위(dislocation), 스크래치(scratch), 표면데미지(surface damage), 트윈(twin), 잔류 응력(strain) 등의 결함의 유형을 식별 및 분석하였으며, 각각의 결함들의 토포그래피 이미지 형성 메커니즘에 대해 분석하였다. 이를 통해 X-선 Lang 토포그래피(X-ray Lang Topography) 장비가 대구경 사파이어 단결정 기판의 결정 결함 평가에 폭넓은 활용이 가능할 것으로 예상된다.

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X-ray diffraction analysis on sapphire wafers with surface treatments in chemical-mechanical polishing process (사파이어 웨이퍼 연마공정에서의 표면처리효과에 대한 X-선 회절분석)

  • 김근주;고재천
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.11 no.5
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    • pp.218-223
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    • 2001
  • The chemical-mechanical polishing process was carried out for 2"-dia. sapphire wafer grown by horizontalBridgman method on the urethane lapping pad with the silica sol. The polished wafer shows the full-width at halfmaximum of 200~400 arcsec in double-crystal X-ray diffraction, indicating that the slicing, grinding and lapping processes before the polishing process affected the crystalline structural property of the wafer surface by the mechanical residual stress. For the inclusion of surface treatments after chemical-mechanical polishing such as the thermal annealing at the temperature of $1,200^{\circ}C$for 4 hrs. and chemical etching, the crystalline quality was sigdicantly enhanced with the reduced full-width at half maximum up to 8.3 arcsec.arcsec.

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Gaussian apodization and superresolution optical imaging system for soft X-ray region (Gaussian Apodization이 되어 있는 X-선 결상계의 초분해능)

  • 송영란;이민희;이상수
    • Korean Journal of Optics and Photonics
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    • v.7 no.2
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    • pp.89-95
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    • 1996
  • Superresolution optics, employing Gaussian apodization, is rigorously treated at the soft X-ray wave-length(λ=0.013 ${\mu}{\textrm}{m}$) region. In the diffraction integral, the line integral along the imaginary axis is found small, and it is ignored, so that the diffraction integral consists of the integration along the real axis. The resolution of the diffracted image is not effected by the pupil angular frequency bandwidth $2{\omega}_0$, which is one of the most important the characteristic features of Gaussian apodization ($e^{-o^2x^2}$ optics. The superresolution optics has resolution ($\frac{1}{2}{\times}FWHM)$=$\Delta$x=0.008 $\mu$m which is smaller than the Rayleigh criterion of 2λ=0.026 ${\mu}{\textrm}{m}$ for NA=0.25. The optical system has ${\omega}_0{\ge}\frac{1}{2}{\sigma}$, which gives the peak intensity of the diffracted image larger than $e^{-2}$ times intensity obtainable by the infinite sperture.

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Microstructure Observation of Pd-Ga System Dental Alloy for Metal-Ceramic Restorations (치과 도재용 Pd-Ga계 합금의 미세조직 관찰)

  • 김기주;이진형
    • Journal of Biomedical Engineering Research
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    • v.21 no.6
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    • pp.537-542
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    • 2000
  • Ga이 함유된 Pd-Ga계 합금은 우수한 기계적 성질, 심미성 및 생체적합성등으로 차세대 치과 도재용 합금으로 주목 받고 있다. 본 연구에서는 상용 77.3%Pd-6.0%Ga계 합금을 원심주조법으로 주조하고, 탈개스, 세라믹소성처리한 후 미세조직을 광학현미경, X-선 회절기, 투과전자현미경으로 관찰하였다. X-선 회절분석 및 투과전자현미경 관찰 결과, Pd고용체와 미세한 석출물에 의해 나타나는 줄무늬를 확인하였다. 공정점 86$0^{\circ}C$에서 5시간 유지시킨 상평형 열처리조건에서는 Pd고용체와 금속간화합물 Pd(sub)2Ga에 해당하는 보다 명확한 제한시야회절도형을 얻었다. 이러한 결과로 77.3%Pd-6.0%Ga계 합금은 Pd고용체와 미세한 구형의 금속간화합물 Pd(sub2)Ga으로 구성되었음을 알 수 있었다.

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