• 한국소성가공학회:학술대회논문집
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• 한국소성가공학회 2009년도 춘계학술대회 논문집
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• pp.432-434
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• 2009

Metal nano-wire arrays on Cu-coated seed layers were fabricated by aqueous solution method using sulfate bath at room temperature. The seed layers were coated on Anodic aluminum oxide (AAO) bottom substrates by electrochemical deposition technique, length and diameter of metal nano-wires were dominated by controlling the deposition parameters, such as deposition potential and time, electrolyte temperature. Anodic aluminum oxide (AAO) was used as a template to prepare highly ordered Ni, Fe, Co and Cu multilayer magnetic nano-wire arrays. This template was fabricated with two-step anodizing method, using dissimilar solutions for Al anodizing. The pore of anodic aluminum oxide templates were perfectly hexagonal arranged pore domains. The ordered Ni, Fe, Co and Cu systems nano-wire arrays were characterized by Field Emission Scanning Electron Microscopy (FE-SEM) and Vibrating Sample Magnetometer (VSM). The ordered Ni, Fe, Co and Cu systems nano-wires had different preferred orientation. In addition, these nano-wires showed different magnetization properties under the electrodepositing conditions.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.578-581
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• 1999

The Co-Cr-Ta films are one of the most suitable candidates for perpendicular magnetic recording media. The facing targets sputtering(FTS) system has a advantage of preparing films over a wide range of working gas pressure on plasma-free substrates. In this study, we investigated the effect underlayers on the growths layers of Co-Cr-Ta recording layers. The Co-Cr-Ta/Ti(CoCr) double layers were deposited with sputter gas pressure$(P_N, 0.3-1mTorr)$ by using FTS apparatus at temperature of$40^{\circ}C~-300^{\circ}C$, respectively. Crystallographic and magnetic characteristics were evaluated by x-ray diffractometry(XRD) and vibrating sample magnetometer(VSM), respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 추계학술대회 논문집
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• pp.419-422
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• 1999

We prepared CoCr thin film for perpendicular magnetic recording media by facing targets sputtering system(FTS system) which can deposit a high quality thin films in plasma-free state and wide range of working pressure. In this study, we investigated that the effect of sputtering condition , that Argon gas pressure and substrate temperature, on magnetic and crystallographic characteristic of CoCr thin film as well as the variation perpendicular coercivity in changing of film's thickness. Crystallographic and magnetic characteristic of prepared thin films were evaluated by x-ray fractometry(XRD), vibrating sample magnetometer(VSM) and kerr hysteresis loop measurement.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 추계학술대회 논문집
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• pp.492-495
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• 2000

In order to develop an ultra-thin CoCr perpendicular magnetic recording layer, we prepared CoCrTa/Ti double layer for perpendicular magnetic recording media by new facing targets sputtering system, Crystallgraphics and magnetic characteristics of CoCrTa on underlayer substrate temperature have been investigated. Crystallgraphic and magnetic characteristic of thin films were evaluated by X-ray diffractometry(XRD), vibrating sample magnetometer(VSM) and atomic force microscopy(AFM). The coercivity and anisotropy field was increased by increasing under layer substrate temperature, c-axis orientation of CoCrTa magnetic recording layer was improved 8$^{\circ}$ to 5.6$^{\circ}$when under layer substrate temperature was 250[$^{\circ}C$]. Also, through annealing effect for CoCrTa/Ti double layer, it was certain that crystallgraphics and magnetic characteristics was improved.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1997년도 추계학술대회 논문집
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• pp.309-312
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• 1997

The Ce-Cr(-Ta) film are one of the most suitable candidates for perpendicular magnetic media. the control of the preparation conditions, such as Ar gas pressure P$\_$Ar/ substrates temperature T$\_$s/, films thickness $\delta$, deposition speed R$\_$d/, is considered to be important to attain ultra high density recording far perpendicular magnetic recording media. In this study, the Co-Cr thin films and Co-Cr-Ta thin films were deposited on the glass side substrates by using Facing Targets Sputtering apparatus(FTS). Crystallographic characteristics and magnetic characteristics were evaluated by X-ray diffractometry(XRD), Vibrating Sample Magnetometer(VSM) respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.208-211
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• 2000

We prepared Co-Cr-Ta and Co-Cr-Ta/Ti thin film for perpendicular magnetic recording media by facing targets sputtering system (FTS system). Ti underlayer effects on crystallographic and magnetic characteristics of Co-Cr-Ta perpendicular magnetic recording media have been investigated. Crystallgraphic and magnetic characteristic of prepared thin films were evaluated by x-ray diffractometry(XRD), vibrating sample magnetometer(VSM) and kerr hysteresis loop measurement. The coercivity and anisotropy field increase by introduced Ti underlayer when substrate temperature is higher than 150$^{\circ}C$. The c-axis dispersion angle and grain size of Co-Cr-Ta/Ti thin film is decrease than Co-Cr-Ta when substrate temperature is higher than 100$^{\circ}C$. Consequently, the use of a Ti underlayer highly orientated can be improved crystallographic and magnetic characteristics of Co-Cr -Ta perpendicular media layer.

• 한국표면공학회지
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• 제31권5호
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• pp.261-265
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• 1998

We investigated compositional separation of Co-23%Cr magnetic alloy thin films with varying film thicknesses. Saturation magnetization and magnetic microstructures were investigated using vibrating sample magnetometer (VSM) and scanning probe microscope (SPM), respectively. Saturation magnetization was as 700 emu/cc for films below 50 nm-thick, and changed to 430 emu/cc for the ones above 2000 nm-thick. This may be due to increment of molar volume of Cr-enriched phase as film thickness increases. The surface grain size in AFM (atomic force microscope) measurement becomes larger as film thickness increases. The MFM (magnetic force microscope) reveals that magnetic microstructure is changed from the fine spherical domains to the maze type domains as film thickness increases. We conclude that employing thickness of Co-22%Cr films below 50 nm is favorable for high density recording in order to enhance perpendicular saturation magnetization and SNR (signal to noise ratio).

• Journal of Magnetics
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• 제18권1호
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• pp.9-13
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• 2013

Shielding effects in conductive and magnetic materials were investigated as a function of properties, thickness and diameter. In this work, evaluations on passive conductive and magnetic shield specimens were achieved through experimentation set-up using 50 Hz single and three phase induction field sources. Analysis on material microstructure properties and characteristics of shielding specimens were performed with the use of vibrating sample magnetometer (VSM) and field emission scanning electron microscopy (FESEM). An induction field at $136{\mu}T$ of single phase system and $50{\mu}T$ of three phase systems were observed to the shield specimens with the thickness ranged of 0.2 mm to 0.4 mm. It is observed that shield specimen efficiency becomes inversely proportionate to the increment of induction fields. The decrease was attributed to the surface structure texture which relates to the crystallization and non-crystallization geometrical effects.

• 한국자기학회지
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• 제18권5호
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• pp.195-199
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• 2008

$Fe_{93.5}Si_{6.5}$ 분말/에폭시 복합재 필름은 열경화과정을 이용하여 준비되었다. 자성분말/에폭시 복합재의 구조와 전자기적 특성 및 전자파 흡수특성을 분석하기 위하여 주사전자현미경(scanning electron microscpoe, SEM), 시료진동형 자력계(vibrating sample magnetometer, VSM), 네트워크 어날라이져(network analyzer) 등을 이용하였다. 분석결과, 포화자속밀도는 복합재 내의 $Fe_{93.5}Si_{6.5}$ 분말이 차지하는 양에 의존하며, 이는 초기투자율에 영향을 미친다. 결과적으로 1 GHz 이상의 주파수에서는 와전류 손실(eddy current loss)이 주요한 인자이며, 자성분말/에폭시 복합재의 공명주파수(resonance frequency)는 복합재 내의 $Fe_{93.5}Si_{6.5}$ 분말의 양이 증가함에 따라 감소한다. 반사손실(reflection loss)은 자성분말/에폭시 복합재의 투자율(permeability)과 유전율(permittivity)로부터 계산에 의해 구해진다. 50 wt% $Fe_{93.5}Si_{6.5}$ 분말의 양과 5 mm 두께를 가진 자성분말/에폭시 복합재는 3.66 GHz와 4.16 GHz 사이에서 -20 dB 이하의 값을 보인다. 따라서 Fe-Si/에폭시 박형 복합재는 마이크로파 흡수체로서 좋은 후보물질이 될 수 있을 것으로 판단된다.

• 대한화학회지
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• 제54권6호
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• pp.766-770
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• 2010

본 연구는 전이금속이 치환된 묽은 자성 반도체의 자기적 특성을 연구하였다. 울츠자이트(wurtzite) 구조를 가지는 화합물은 졸-겔(sol-gel)법을 이용하여 합성하였다. 열역학적 특성과 자기적 특성을 가진 $Zn_{1-x}Co_xO$은 단일상으로 나타났으며, 농도에 따라 다른 특성을 보여주었다. 묽은 자성 반도체의 특성을 조사하기 위해 X-ray diffraction (XRD), scanning electronic microscope (SEM) 및 vibrating sample magnetometer (VSM)을 사용하였다. 구조 분석을 통해 단일상이 확인된 시료에서는 모두 강자성 특성이 발견되었고, 전이금속 이온의 농도를 5%이상 치환이 되면 강자성이 감소하는 현상이 나타났다.