• 제목/요약/키워드: VLSI simulation

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Transient Simulation of CMOS Breakdown characteristics based on Hydro Dynamic Model (Hydro Dynamic Model을 이용한 CMOS의 파괴특성의 Transient Simulation해석)

  • Choi, Won-Cheol
    • Journal of the Korean Society of Industry Convergence
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    • v.5 no.1
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    • pp.39-43
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    • 2002
  • In present much CMOS devices used in VLSI circuit and Logic circuit. With increasing a number of device in VLSI, the confidence becomes more serious. This paper describe the mechanism of breakdown on CMOS, especially n-MOS, based on Hydro Dynamic model with device self-heating. Additionally, illustrate the CMOS latch-up characteristics on simplified device structure on this paper.

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Design and Implementation of Motion Estimation VLSI Processor using Block Matching Algorithm (완전탐색 블럭정합 알고리듬을 이용한 움직임 추정기의 VLSI 설계 및 구현)

  • 이용훈;권용무;박호근;류근장;김형곤;이문기
    • Journal of the Korean Institute of Telematics and Electronics B
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    • v.31B no.9
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    • pp.76-84
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    • 1994
  • This paper presents a new high-performance VLSI architecture and VLSI implementation for full-search block matching algorithm. The proposed VLSI architecture has the feature of two directional parallel and pipeline processing, thereby reducing the PE idle time at which the direction of block matching operation within the search area is changed. Therfore, the proposed architecture is faster than the existing architectures under the same clock frequency. Based on HSPICE circuit simulation, it is verified that the implemented procesing element is operated successfully within 13 ns for 75 MHz operation.

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The Propagation Delay Model of the Interconnects in the High-Speed VLSI circuit (고속 VLSI회로에서 전송선의 지연시간 모델)

  • 윤성태;어영선
    • Proceedings of the IEEK Conference
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    • 1999.11a
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    • pp.975-978
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    • 1999
  • The transmission line effects of IC interconnects have a substantial effect on a hish-speed VLSI circuit performance. The effective transmission lime parameters are changed with the increase of the operation frequency because of the skin of the skin effect, proximity effect, and silicon substrate. A new signal delay estimation methodology based on the RLC-distributed circuit model is presented [2]. The methodology is demonstrated by using SPICE simulation and a high-frequency experiment technique.

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A Modeling of CMOS Inverter for Maximum Power Dissipation Prediction (CMOS 인버터의 최대 전력소모 예측을 위한 모델링)

  • 정영권;김동욱
    • Proceedings of the IEEK Conference
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    • 1998.10a
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    • pp.1057-1060
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    • 1998
  • Power Dissipation and circuit speed become the most importance parameters in VLSI system maximum power dissipation for VLSI system design. We remodeled CMOS inverter according to the operating region, saturation region or linear regin, and calculate maximum power dissipation point of CMOS inverter. The result of proposed maximum power dissipation model compared with those from SPICE simulation which results that the proposed maximum power dissipation model has the error rate within 10% to SPICE simulation.

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Implementation of ATPG for IdDQ testing in CMOS VLSI (CMOS VLSI의 IDDQ 테스팅을 위한 ATPG 구현)

  • 김강철;류진수;한석붕
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.3
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    • pp.176-186
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    • 1996
  • As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.

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Functional Simulation of Logic Circuits by Prolog (Prolog를 이용한 논리회로의 기능적 시뮬레이션)

  • Kim, J.S.;Cho, S.B.;Park, H.J.;Lim, I.C.
    • Proceedings of the KIEE Conference
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    • 1987.07b
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    • pp.1467-1470
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    • 1987
  • This paper proposes a functional simulation algorithm which decrease the internal memory space and run time in simulation of VLSI. Flip-flop, register, ram, rom, ic and fun are described as functional elements in the simulator. Especially icf is made as new functional element by combining the gate and the functional element, therefore icf is used efficiently in simulation of VLSI. The proposed algorithm is implemented on PC-AT(MS-DOS) in by Prolog-1.

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Efficient Parallel Logic Simulation on SIMD Computers (SIMD 컴퓨터상에서 효율적인 병렬처리 논리 시뮬레이션)

  • Chung, Yun-Mo
    • The Transactions of the Korea Information Processing Society
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    • v.3 no.2
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    • pp.315-326
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    • 1996
  • As the complexity of VLSI circuits has increased, a lot of simulation time for verifying their correctness has been required. This paper presents efficient parallelel logic simulation protocols, data structures, algorithms to implement fast logic simulation on SIMD parallel processing computers. The performance results of the presented schemes on CM-2 are given and analyzed.

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VLSI Array Architecture for High Speed Fractal Image Compression (고속 프랙탈 영상압축을 위한 VLSI 어레이 구조)

  • 성길영;이수진;우종호
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.25 no.4B
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    • pp.708-714
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    • 2000
  • In this paper, an one-dimensional VLSI array for high speed processing of fractal image compression algorithm based the quad-tree partitioning method is proposed. First of all, the single assignment code algorithm is derived from the sequential Fisher's algorithm, and then the data dependence graph(DG) is obtained. The two-dimension array is designed by projecting this DG along the optimal direction and the one-dimensional VLSI array is designed by transforming the obtained two-dimensional array. The number of Input/Output pins in the designed one-dimensional array can be reduced and the architecture of process elements(PEs) can he simplified by sharing the input pins of range and domain blocks and internal arithmetic units of PEs. Also, the utilization of PEs can be increased by reusing PEs for operations to the each block-size. For fractal image compression of 512X512gray-scale image, the proposed array can be processed fastly about 67 times more than sequential algorithm. The operations of the proposed one-dimensional VLSI array are verified by the computer simulation.

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Reduction of Input Pins in VLSI Array for High Speed Fractal Image Compression (고속 프랙탈 영상압축을 위한 VLSI 어레이의 입력핀의 감소)

  • 성길영;전상현;이수진;우종호
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.26 no.12A
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    • pp.2059-2066
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    • 2001
  • In this paper, we proposed a method to reduce the number of input pins in one-dimensional VLSI array for fractal image compression. We use quad-tree partition scheme and can reduce the number of the input pins up to 50% by sharing the domain\`s and the range\`s data input pins in the proposed VLSI array architecture. Also, we can reduce the input pins and simplify the internal operation circuit of the processing elements by eliminating a few number of bits of the least significant bits of the input data. We simulated using the 256$\times$256 and 512$\times$512 Lena images to verify performance of the proposed method. As the result of simulation, we can decompress the original image with about 32dB(PSNR) in spite of elimination of the least significant 2-bit in the original input data, and additionally reduce the number of input pins up to 25% compared to VLSI array sharing input pins of range and domain.

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A Study on the Signal Distortion Analysis using Full-wave Method at VLSI Interconnection (VLSI 인터커넥션에 대한 풀-웨이브 방법을 이용한 신호 왜곡 해석에 관한 연구)

  • 최익준;원태영
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.41 no.4
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    • pp.101-112
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    • 2004
  • In this paper, we developed a numerical analysis model by using ADI-FDTD method to analyze three-dimensional interconnect structure. We discretized maxwell's curl equation by using ADI-FDTD. Using ADI-FDTD method, a sampler circuit designed from 3.3 V CMOS technology is simplified to 3-metal line structure. Using this simplified structure, the time delay and signal distortion of complex interconnects are investigated. As results of simulation, 5∼10 ps of delay time and 0.1∼0.2 V of signal distortion are measured. As demonstrated in this paper, the full-wave analysis using ADI-FDTD exhibits a promise for accurate modeling of electromagnetic phenomena in high-speed VLSI interconnect.